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    • 2. 发明申请
    • YUKAI VSL-BASED VT-COMPENSATION FOR NAND MEMORY
    • YUKAI基于VSL的NAND存储器的VT补偿
    • WO2016014731A1
    • 2016-01-28
    • PCT/US2015/041636
    • 2015-07-22
    • APLUS FLASH TECHNOLOGY, INC.
    • LEE, Peter, Wung
    • G11C8/14G11C11/40G11C16/04
    • G11C11/5635G11C7/14G11C7/18G11C11/56G11C11/5642G11C16/0483G11C16/08G11C16/14G11C16/24G11C16/26G11C16/3445G11C16/3459G11C29/50G11C2029/5002
    • A YUKAI NAND array comprising multiple strings associated with hierarchical global/local bit lines (GBL/LBL) and each string being associated with one LBL and having adjacent LBL as a dedicated local source line (LSL) without a common source line to connect all strings. Each of the LBLs is interleavingly associated with either an Odd or Even string selected via one pair of dummy cells inserted in each string and is used as one on-chip PCACHE register with full BL-shielding without wasting extra silicon area to allow batch- based multiple concurrent MLC All-BL, All-Vtn-Program and Alternative-WL program, Odd/Even read and verify operations with options of providing individual and common VSL-based Vt-compensation and VLBL compensations to mitigate high WL-WL and BL-BL coupling effects. Bias conditions in each string are provided to correctly sense highly-negative erase-verify voltage, multiple negative program-verify voltages and without VDS punch-through, breakdown and body-effect in both boundary and non-boundary WLs cells.
    • 包含与分级全局/局部位线(GBL / LBL)相关联的多个串的YUKAI NAND阵列,每个串与一个LBL相关联,并且具有相邻的LBL作为专用本地源线(LSL),而没有公共源线连接所有字符串 。 每个LBL与通过插入每个串中的一对虚拟单元选择的奇数或偶数字符串进行交织关联,并且被用作具有完全BL屏蔽的一个片上PCACHE寄存器,而不浪费额外的硅面积以允许基于批次 多个并发的MLC全BL,全Vtn程序和替代WL程序,奇/偶读取和验证操作,具有提供单独和常见的基于VSL的Vt补偿和VLBL补偿的选项,以减轻高WL-WL和BL- BL耦合效应。 提供每个串中的偏置条件以正确检测边界和非边界WL单元中的高负值擦除验证电压,多个负编程验证电压以及VDS穿透,击穿和体效应。
    • 7. 发明申请
    • COMPENSATION SCHEME FOR NON-VOLATILE MEMORY
    • 非易失性存储器的补偿方案
    • WO2014130586A1
    • 2014-08-28
    • PCT/US2014/017217
    • 2014-02-19
    • SANDISK 3D LLC
    • CHEN, YingchangKALRA, PankajGORLA, Chandrasekhar
    • G11C13/00
    • G11C7/12G11C7/00G11C11/56G11C11/5678G11C13/00G11C13/0004G11C13/0023G11C13/0038G11C13/0069G11C2013/0076
    • Methods for performing parallel voltage and current compensation during reading and/or writing of memory cells in a memory array are described. In some embodiments, the compensation may include adjusting a bit line voltage and/or bit line reference current applied to a memory cell based on a memory array zone, a bit line layer, and a memory cell direction associated with the memory cell. The compensation may include adjusting the bit line voltage and/or bit line reference current on a per memory cell basis depending on memory cell specific characteristics. In some embodiments, a read/write circuit for reading and/or writing a memory cell may select a bit line voltage from a plurality of bit line voltage options to be applied to the memory cell based on whether the memory cell has been characterized as a strong, weak, or typical memory cell.
    • 描述了在存储器阵列中的存储器单元的读取和/或写入期间执行并行电压和电流补偿的方法。 在一些实施例中,补偿可以包括基于与存储器单元相关联的存储器阵列区域,位线层和存储器单元方向来调整施加到存储器单元的位线电压和/或位线参考电流。 补偿可以包括根据存储器单元特定特性来调整每个存储器单元上的位线电压和/或位线参考电流。 在一些实施例中,用于读取和/或写入存储器单元的读/写电路可以根据存储器单元是否被表征为存储单元来选择要施加到存储器单元的多个位线电压选项中的位线电压 强,弱或典型的记忆体。