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    • 1. 发明授权
    • Phase matched clock divider
    • 相位匹配时钟分频器
    • US07046052B1
    • 2006-05-16
    • US10837210
    • 2004-04-30
    • Andrew K. PerceyRaymond C. Pang
    • Andrew K. PerceyRaymond C. Pang
    • H03K21/00H03K23/00H03K25/00
    • H03K23/50
    • A phase matched clock divider includes a first feed-through flip-flop that receives a first input clock signal, and in response, provides a first output clock signal having the same frequency. The first feed-through flip-flop is enabled and disabled in response to a first reset signal. A plurality of series-connected flip-flops each receives the first input clock signal, and in response, provides a divided output clock signal. Each of the series-connected flip-flops is enabled and disabled in response to a second reset signal. The first and second release signals asynchronously disable the associated flip-flops in response to a third reset signal. The first release signal synchronously enables the first feed-through flip-flop in response to the third reset signal and a release clock signal. The second release signal enables the series-connected flip-flops in response to the third reset signal and a release control signal.
    • 相位匹配时钟分频器包括接收第一输入时钟信号的第一馈通触发器,并且作为响应,提供具有相同频率的第一输出时钟信号。 响应于第一复位信号,第一馈通触发器被使能和禁止。 多个串联触发器各自接收第一输入时钟信号,作为响应,提供分频的输出时钟信号。 每个串联的触发器响应于第二复位信号被使能和禁止。 响应于第三复位信号,第一和第二释放信号异步地禁用相关联的触发器。 响应于第三复位信号和释放时钟信号,第一释放信号同步使第一馈通触发器使能。 第二释放信号使得串联连接的触发器响应于第三复位信号和释放控制信号。
    • 2. 发明授权
    • Interleaved memory cell with single-event-upset tolerance
    • 具有单事件不正常容限的交错记忆单元
    • US07515452B1
    • 2009-04-07
    • US11649447
    • 2007-01-03
    • Jan L. de JongSusan Xuan NguyenRaymond C. Pang
    • Jan L. de JongSusan Xuan NguyenRaymond C. Pang
    • G11C11/00
    • G11C8/04H03K19/00392H03K19/1776H03K19/17764H03K19/1778
    • A memory array has a first memory cell with a plurality of transistors connected so as to restore a data value to a node of the memory cell to an initial value following an event upsetting the initial value. A first portion of the plurality of transistors is in a first cell portion and a second portion of the plurality of transistors is in a second cell portion. A second memory cell has a third cell portion and a fourth cell portion. The third cell portion is between the first cell portion and the second cell portion and adjacent to each of the first cell portion and the second cell portion. In a particular embodiment, the memory cell is a single-event-upset (“SEU”) tolerant memory cell and the first and second cell portions are each a half cell of a sixteen transistor memory cell.
    • 存储器阵列具有连接有多个晶体管的第一存储器单元,以便在事件颠倒初始值之后将数据值恢复到存储器单元的节点到初始值。 多个晶体管的第一部分在第一单元部分中,并且多个晶体管的第二部分在第二单元部分中。 第二存储单元具有第三单元部分和第四单元部分。 第三单元部分在第一单元部分和第二单元部分之间并且与第一单元部分和第二单元部分中的每一个相邻。 在特定实施例中,存储器单元是单事件不正常(“SEU”)容限存储器单元,并且第一和第二单元部分各自是十六晶体管存储单元的半单元。
    • 4. 发明授权
    • Digital clock manager capacitive trim unit
    • 数字时钟管理器电容调整单元
    • US07157951B1
    • 2007-01-02
    • US10837186
    • 2004-04-30
    • Shawn K. MorrisonRaymond C. Pang
    • Shawn K. MorrisonRaymond C. Pang
    • H03H11/26
    • H03K5/15013G06F1/10
    • A delay line for a digital clock manager includes a tap delay structure and a trim delay structure. The trim delay structure includes a first buffer coupled to receive a clock signal from the tap delay structure, and in response, provide a delayed clock signal to a set of clock lines. The trim delay structure also includes a capacitive trim unit having a plurality of capacitive trim elements tapped off the set of clock lines. The capacitive trim elements are selectively enabled or disabled, thereby introducing additional delay to the delayed clock signal on the set of clock lines. Each capacitive trim element can include a transmission gate structure, which is turned on to introduce significant junction capacitance to the set of clock lines. The trim delay structure can also include a second buffer adapted to buffer the delayed clock signal on the set of clock lines.
    • 数字时钟管理器的延迟线包括抽头延迟结构和修整延迟结构。 修剪延迟结构包括第一缓冲器,其被耦合以从抽头延迟结构接收时钟信号,并且作为响应,向一组时钟线提供延迟的时钟信号。 修剪延迟结构还包括电容修剪单元,其具有从该组时钟线分离的多个电容修剪元件。 电容调整元件被选择性地使能或禁止,从而对该组时钟线上的延迟的时钟信号引入额外的延迟。 每个电容调整元件可以包括传输门结构,其被导通以将显着的结电容引入该组时钟线。 修剪延迟结构还可以包括适于缓冲该组时钟线上延迟的时钟信号的第二缓冲器。
    • 6. 发明授权
    • Block RAM with reset to user selected value
    • 将RAM重置为用户选择的值
    • US06282127B1
    • 2001-08-28
    • US09625672
    • 2000-07-24
    • Raymond C. PangSteven P. YoungTrevor J. Bauer
    • Raymond C. PangSteven P. YoungTrevor J. Bauer
    • G11C700
    • G11C7/1051G11C7/1057
    • A RAM block includes a circuit for causing the RAM to provide a reset value on the output or a previously captured output value from the RAM when a Reset signal is active. The Reset signal does not change the RAM contents but causes all outputs of the block RAM to be either a reset value or a capture value, as selected by the user. This is useful when the RAM block is configured as a state machine. Thus, in an FPGA or other programmable device, an application can start the state machine in a known state with all address bits equal to 0 and can reset the state machine to this startup state. When the reset signal is active, the state machine can feed back the reset value or capture value to the address inputs of the RAM block that receive state feedback data, regardless of the data actually in those locations.
    • RAM块包括用于当复位信号有效时使RAM在输出上提供复位值或从RAM提供先前捕获的输出值的电路。 复位信号不会更改RAM内容,但会导致块RAM的所有输出为用户选择的复位值或捕捉值。 当RAM块被配置为状态机时,这是有用的。 因此,在FPGA或其他可编程器件中,应用程序可以在所有地址位等于0的已知状态下启动状态机,并可将状态机复位到该启动状态。 当复位信号有效时,状态机可以将接收状态反馈数据的复位值或捕获值反馈给RAM块的地址输入,无论这些位置中的数据如何。
    • 7. 发明授权
    • eFuse resistance sensing scheme with improved accuracy
    • eFuse电阻传感方案具有提高的精度
    • US07501879B1
    • 2009-03-10
    • US11717836
    • 2007-03-13
    • Kwansuhk OhRaymond C. PangHsung Jai ImSunhom Paak
    • Kwansuhk OhRaymond C. PangHsung Jai ImSunhom Paak
    • G11C17/18H01H85/00
    • G11C17/16G11C17/18
    • An eFuse sensing circuit replaces the inverters used to provide the “read” output state of a conventional eFuse circuit. The sensing circuit includes a comparator with one input coupled to the eFuse circuitry, and a second input coupled to a reference voltage generator circuit. The reference voltage generator circuit includes an internal resistor. Transistors of the sense circuit are provided to mimic the transistors of the eFuse circuit, so that variations of transistors due to process, voltage and temperature will be substantially the same. The resistor of the sense circuit is then effectively compared with the resistance of the eFuse by the comparator irrespective of temperature and process variations.
    • eFuse感测电路取代了用于提供常规eFuse电路的“读取”输出状态的逆变器。 感测电路包括具有耦合到eFuse电路的一个输入和耦合到参考电压发生器电路的第二输入的比较器。 参考电压发生器电路包括内部电阻器。 提供感测电路的晶体管以模拟eFuse电路的晶体管,使得由于工艺,电压和温度而导致的晶体管的变化将基本相同。 然后将感测电路的电阻与比较器的eFuse的电阻进行有效的比较,而与温度和工艺变化无关。