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    • 1. 发明申请
    • RELAX GAS DISCHARGE LASER LITHOGRAPHY LIGHT SOURCE
    • 放电气体放电激光光刻光源
    • WO2005046011A3
    • 2005-12-22
    • PCT/US2004035671
    • 2004-10-27
    • CYMER INCSANDSTROM RICHARD LPARTLO WILLIAM NBROWN DANIEL J WYAGER THOMAS AERSHOV ALEXANDER IRAFAC ROBERT JRYLOV GERMAN E
    • SANDSTROM RICHARD LPARTLO WILLIAM NBROWN DANIEL J WYAGER THOMAS AERSHOV ALEXANDER IRAFAC ROBERT JRYLOV GERMAN E
    • B23K26/06B23K26/40G01J1/42G01J9/02G02B26/00G02B26/08G03F7/20H01S20060101H01S3/00H01S3/1055H01S3/22H01S3/225
    • G01J1/429B23K26/0622B23K2201/40G01J9/02G02B26/002G02B26/0875G03F7/70041G03F7/70575H01S3/005H01S3/0057H01S3/1055H01S3/225
    • An apparatus and method are disclosed for operating a narrow band short pulse duration gas discharge laser output light pulse beam producing system, producing a beam comprising laser output light pulses at a selected pulse repetition rate, which may comprise: a dispersive center wavelength selection optic selecting at least one center wavelength for each pulse determined at least in part by the angle of incidence of the laser light pulse beam containing the respective pulse on the dispersive wavelength selection optic; a tuning mechanism operative to select at least one angle of incidence of a first spatially defined portion of the laser light pulse beam containing the respective pulse upon the dispersive center wavelength selection optic; and, the tuning mechanism comprising a variably refractive optical element defining a plurality of refractive angular displacements of the first spatially defined portion of the laser light pulse beam passing through the variably refractive optical element at one of a plurality of positions of incidence of the laser light pulse beam on the variably refractive optical element. The variably refractive optical element may comprise: a first generally flat face defining a surface of incidence for the laser light pulse beam; and, a second multifaceted or curved face defining a plurality of generally flat surfaces of exit or a continuously varying surface of exit for the laser light beam. Other aspects of pulse parameter metrology and pulse modulation control, including in response to signals from the utilization tool are disclosed, e.g., relating to proper dose control with differing center wavelength spectra.
    • 公开了一种用于操作窄带短脉冲持续时间气体放电激光输出光脉冲束产生系统的装置和方法,产生包括选定脉冲重复频率的激光输出光脉冲的光束,其可以包括:色散中心波长选择光学选择 用于每个脉冲的至少一个中心波长至少部分地由分散波长选择光学器件上包含相应脉冲的激光束的入射角确定; 调谐机构,用于在分散中心波长选择光学器件上选择包含相应脉冲的激光束脉冲光束的第一空间限定部分的至少一个入射角; 并且所述调谐机构包括可变折射光学元件,所述可变折射光学元件限定所述激光束的所述第一空间限定部分的多个折射角位移通过所述可变折射光学元件在所述激光的入射的多个位置中的一个位置 脉冲光束在可变折射光学元件上。 可变折射光学元件可以包括:限定用于激光束脉冲束的入射面的第一大致平坦的面; 以及限定用于激光束的出口的多个大致平坦的表面或出口的连续变化的表面的第二多面或弯曲面。 脉冲参数测量和脉冲调制控制的其他方面包括响应于来自利用工具的信号,例如涉及具有不同中心波长光谱的适当剂量控制。
    • 8. 发明申请
    • HIGH RESOLUTION ETALON-GRATING MONOCHROMATOR SPECTROMETER
    • 高分辨率ETALON-GRATING MONOCHROMATOR SPECTROMETER
    • WO02061388A2
    • 2002-08-08
    • PCT/US0202453
    • 2002-01-28
    • CYMER INCSANDSTROM RICHARD LERSHOV ALEXANDER IFOMENKOV IGOR VBROWN DANIEL J WSMITH SCOTT T
    • SANDSTROM RICHARD LERSHOV ALEXANDER IFOMENKOV IGOR VBROWN DANIEL J WSMITH SCOTT T
    • G01J3/26G01J1/42G01J3/12G01J3/22G01J9/02G21K1/06H01S3/134H01S3/137G01N
    • G01J3/12G01J1/4257G01J3/22G01J3/26G01J9/02
    • A high resolution etalon-grating spectrometer or monochromator. A preferred embodiment presents as extremely narrow slit function in the ultraviolet range and is very useful for measuring bandwidth of narrow band excimer lasers used for integrated circuit lithography. Light from the laser is focused into a diffuser (D) and the diffused light exiting the diffuser illuminates an etalon (ET). A portion of its light exiting the etalon is collected and directed into a slit positioned at a fringe pattern of the etalon. Light passing through the slit is collimated (L3) and the collimated light illuminates a grating (GR1) positioned in an approximately Littrow configuration which disperses the light according to wavelength. A portion of the dispersed light representing the wavelength corresponding to the selected etalon fringe is passed through a second slit (2) and monitored by a light detector (PMT). When the etalon and the grating are tuned to the same precise wavelength a slit function is defined which is extremely narrow as about 0.034pm "FWHM" and about 0.091pm "95 percent integral". The etalon and the grating are placed in a leak-tight containment (50) filled with a gas, such a nitrogen or helium.
    • 高分辨率标准光栅光谱仪或单色仪。 优选的实施例在紫外范围内呈现极窄的狭缝功能,并且对于测量用于集成电路光刻的窄带准分子激光器的带宽是非常有用的。 来自激光器的光聚焦成漫射器(D),离散扩散器的散射光照射标准具(ET)。 将其从标准具出射的光的一部分收集并引导到位于标准具的边缘图案处的狭缝中。 通过狭缝的光被准直(L3),并且准直光照射位于大约Littrow配置中的光栅(GR1),其根据波长分散光。 表示对应于所选标准具条纹的波长的分散光的一部分通过第二狭缝(2)并由光检测器(PMT)监测。 当标准具和光栅调谐到相同的精确波长时,定义了狭缝功能,其极窄,约0.034pm“FWHM”和约0.091μm“95%积分”。 标准具和光栅放置在充满气体(例如氮气或氦气)的密封密封(50)中。