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    • 2. 发明专利
    • Spectrum measurement device, image evaluation device and image formation device
    • 光谱测量装置,图像评估装置和图像形成装置
    • JP2013186023A
    • 2013-09-19
    • JP2012052478
    • 2012-03-09
    • Ricoh Co Ltd株式会社リコー
    • KAMIJO TADAHIROSHINPO KOHEIKUBOTA YOICHISEO MANABU
    • G01J3/50G03G15/00G03G15/01
    • G01J3/42G01J3/0208G01J3/0229G01J3/024G01J3/0262G01J3/0297G01J3/18G01J3/24G01J3/2823G01J3/50G01J2003/503G03G15/00G03G15/5062
    • PROBLEM TO BE SOLVED: To provide a spectrum measurement device that allows a wavelength spectrum of reflection light from an object to be stably measured with high accuracy.SOLUTION: A spectrum measurement device 10 comprises: a light source unit 11 that irradiates a recording paper P with light; an aperture element 13 that is arranged on an optical path of reflection light from the recording paper P and provided with a plurality of apertures; a diffraction element 15 that is arranged on optical paths of a plurality of pieces of light which, out of the reflection light, have passed through a plurality of apertures; a mask element 17 that includes a plurality of passage parts allowing a plurality of +1-order diffraction images, out of a plurality of diffraction images of the plurality of pieces of light formed by the diffraction element 15, to individually pass through, and a light shield part shielding diffraction images in orders other than +1-order; and a linear sensor 16 that includes a plurality of spectrum sensors individually receiving the plurality of +1-order diffraction images passing through the plurality of passage parts.
    • 要解决的问题:提供一种允许以高精度稳定地测量来自物体的反射光的波长谱的光谱测量装置。解决方案:光谱测量装置10包括:光源单元11,其照射记录纸P 与光; 光圈元件13,其设置在来自记录纸P的反射光的光路上并且设置有多个孔; 配置在多个光的光路上的衍射元件15,其在反射光中已经通过多个孔; 掩模元件17,其包括多个通过衍射元件15形成的多个光的多个衍射图像中的多个+1阶衍射图像的通过部分,以分别通过, 屏蔽部分屏蔽除+ 1级以外的顺序的衍射图像; 以及线性传感器16,其包括分别接收通过多个通道部分的多个+ 1级衍射图像的多个频谱传感器。
    • 5. 发明专利
    • Spectrophotometer and method for determining slit condition for the same
    • 分光光度计及其测定方法
    • JP2012230074A
    • 2012-11-22
    • JP2011099894
    • 2011-04-27
    • Hitachi High-Technologies Corp株式会社日立ハイテクノロジーズ
    • KURIMOTO DAISUKEWAKUI TAKAYUKI
    • G01J3/04
    • G01J3/04G01J3/024G01J3/027G01J3/06G01J3/18
    • PROBLEM TO BE SOLVED: To select wavelength resolution capable of detecting a real spectral peak of a sample based on measurer's experience and knowledge when a sample whose spectral shape is unknown is to be measured.SOLUTION: Wavelength resolution setting operation can be automatically set in accordance with a measurement spectrum. Therefore, a plurality of slits with respectively different aperture widths are prepared and a wavelength of monochromatic light passing an individual slit is scanned within a predetermined wavelength range to measure a spectrum in each aperture width of the slit. Based on compared results of a plurality of spectra measured about the slits with respectively different aperture widths, a slit condition for regulating relation between the aperture width of at least one slit to be used for measurement of the sample and at least one wavelength range applying the aperture width of the slit is determined.
    • 要解决的问题:当要测量其光谱形状未知的样品时,基于测量者的经验和知识选择能够检测样品的实际光谱峰值的波长分辨率。

      解决方案:可以根据测量光谱自动设置波长分辨率设置操作。 因此,准备具有不同孔径宽度的多个狭缝,并且在预定波长范围内扫描通过单个狭缝的单色光的波长,以测量狭缝的每个孔径宽度中的光谱。 基于对具有分别不同的孔径宽度的狭缝测量的多个光谱的比较结果,用于调节用于测量样品的至少一个狭缝的孔径宽度与施加样品的至少一个波长范围之间的关系的狭缝条件 确定狭缝的孔径宽度。 版权所有(C)2013,JPO&INPIT