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1. 发明公开

EP3340087A1 SELF-HEATING EFFECT APPARATUS AND TEST METHOD 审中-公开
公开(公告)号：EP3340087A1
公开(公告)日：2018-06-27
申请号：EP17207628.3
申请日：2017-12-15
申请人： Semiconductor Manufacturing International Corporation (Shanghai) , Semiconductor Manufacturing International Corporation (Beijing)
发明人： LIN, Xi , SHEN, Yihua , LI, Sensheng
IPC分类号： G06F17/50
CPC分类号： G01R31/2848 , G01R31/2849 , G06F17/5009 , G06F17/5045 , G06F2217/80
摘要： A self-heating effect apparatus includes a memory and a processor. The processor is coupled to the memory and configured to process a self-heating effect model for characterizing a heat flow network of devices. The devices include a device under test and one or more adjacent devices surrounding the device under test. The self-heating effect model includes a reference thermal resistance and a reference thermal capacity; a thermal temperature feedback model used to acquire a thermal level of the device under test; a thermal resistance modification model used to acquire a modified thermal resistance of the device under test according to the thermal level of the device under test and the reference thermal resistance; and a thermal capacity modification model used to acquire a modified thermal capacity of the device under test according to the thermal level of the device under test and the reference thermal capacity.

2. 发明公开

EP3299829A1 METHOD AND APPARATUS FOR ELECTRICAL COMPONENT LIFE ESTIMATION 有权
标题翻译：用于电子元件寿命估算的方法和设备
公开(公告)号：EP3299829A1
公开(公告)日：2018-03-28
申请号：EP17186354.1
申请日：2017-08-16
申请人： Rockwell Automation Technologies, Inc.
发明人： MORRIS, Garron K.
IPC分类号： G01R31/27 , G01R31/26
CPC分类号： G01R31/343 , G01R31/2619 , G01R31/27 , G01R31/2849
摘要： Systems and methods for estimating electrical component degradation caused by an operating parameter that stresses the component in a series of stress cycles, in which cycle count values are maintained which individually correspond to a range of values of the operating parameter, and a plurality of maximum cycle values are stored, which individually correspond to one of the ranges and represent the number of stress cycles in the corresponding range at which the component is expected to have a user defined failure probability value. For a given stress cycle, one of the count values is incremented that corresponds to the range that includes a measured or sensed value, and a cumulative degradation value for the electrical system component is computed as a sum of ratios of the individual count values to the corresponding maximum cycle values.
摘要翻译：用于估计由在一系列应力循环中强调该部件的操作参数引起的电气部件退化的系统和方法，其中循环计数值被保持为单独对应于操作参数值的范围，并且多个最大循环值被存储，其分别对应于其中一个范围并且表示在该部件预期具有用户定义的故障概率值的对应范围中的应力周期的数量。对于给定的应力循环，计数值中的一个递增，其对应于包括测量值或感测值的范围，并且电气系统部件的累积退化值被计算为各个计数值与相应的最大周期值。

3. 发明公开

EP2359155A1 DISPOSITIF DE TEST DE CIRCUIT INTEGRE ET PROCEDE DE MISE EN OEUVRE 有权
标题翻译：设备技术测试集成电路和方法实现
公开(公告)号：EP2359155A1
公开(公告)日：2011-08-24
申请号：EP09801478.0
申请日：2009-12-02
申请人： European Aeronautic Defence And Space Company EADS
发明人： MILLER, Florent , WEULERSSE, Cécile , BOUGEROL, Antonin , CARRIERE, Thierry , HEINS, Patrick , HAZO, Samuel
IPC分类号： G01R31/28
CPC分类号： G01R31/2881 , G01R31/002 , G01R31/2849
摘要： The invention relates to a device (1) for testing an integrated circuit (2), comprising: a platen (3) for receiving the integrated circuit (2) and subjecting it to the test, the platen (3) comprising circuits (4) for powering and operating the integrated circuit (2) and circuits (5) for measuring the operation of the integrated circuit (2) during the test; an irradiation device (6) for subjecting the circuit (2) to a proton bombardment (7), characterised in that said irradiation device comprises a mask (8) with a variable thickness provided between a bombardment access region (9) on the integrated circuit (2) and an implanted area (10) of the integrated circuit (2).

4. 发明公开

EP1936663A3 System for testing the durability of objects under thermally hard circumstances 审中-公开
标题翻译：系统严重的热条件下测试对象的耐用性
公开(公告)号：EP1936663A3
公开(公告)日：2009-07-22
申请号：EP07024775.4
申请日：2007-12-20
申请人： Espec Corp.
发明人： Nakanishi, Masataka , Kurara, Hironobu , Nishikawa, Taihei
IPC分类号： H01L21/00 , H01L21/66 , G01R31/26 , G01R31/28
CPC分类号： H01L21/67098 , G01R31/2817 , G01R31/2849 , G01R31/2875 , G01R31/2877
摘要： A system for testing objects such as electronic devices and mechanical components to see how they can withstand thermally hard circumstances created by a thermal agent supplied from a supplying section communicating with a testing section by and through an inlet flow path and an outlet flow path, wherein heat exchange is effected between the incoming agent and the outgoing agent, so that the remaining heat content, worm or cold, is taken and utilized for later uses.

5. 发明公开

EP2003458A2 Electromagnetic effects test chamber 有权
标题翻译：试验室的电磁效应测试
公开(公告)号：EP2003458A2
公开(公告)日：2008-12-17
申请号：EP08075530.9
申请日：2008-06-03
申请人： The Boeing Company
发明人： Brady, Vaughn L. , Waugh, Gregory M. , Lomax, Michael E.
IPC分类号： G01R29/08 , G01R31/28
CPC分类号： G01R31/2849 , B64F5/60 , G01R29/0842 , G01R31/001 , G01R31/008 , G01R31/1227
摘要： An apparatus and method for testing electromagnetic effects. In one advantageous embodiment, the apparatus has a chamber, a door connected to the chamber, a gas supply system attached to the chamber, a plurality of electrical connectors attached to the chamber, a removable platform, and a specimen holding. The chamber has an opening into an interior space located in the chamber. The door closes to seal the opening and prevents a flammable gaseous mixture in the interior space from leaking out of the interior space of the chamber. The gas supply system is configured for connection to the gas supply system to allow introduction of the flammable gaseous mixture into the interior space. The removable platform is moveable into and out of the interior space of the chamber through the opening. The specimen holding system located on the removable platform and is configured to hold a specimen and is electrically connected to the plurality of electrical connectors when the removable platform is placed into the chamber, wherein an electrical current travels through the specimen when the electrical current is supplied by an electrical current source that is connected to the plurality of electrical connectors.

6. 发明公开

EP1936663A2 System for testing the durability of objects under thermally hard circumstances 审中-公开
标题翻译：系统zurPrüfungder Dauerhaftigkeit vonGegenständenunter hartenWärmebedingungen
公开(公告)号：EP1936663A2
公开(公告)日：2008-06-25
申请号：EP07024775.4
申请日：2007-12-20
申请人： Espec Corp.
发明人： Nakanishi, Masataka , Kurara, Hironobu , Nishikawa, Taihei
IPC分类号： H01L21/00 , H01L21/66 , G01R31/26
CPC分类号： H01L21/67098 , G01R31/2817 , G01R31/2849 , G01R31/2875 , G01R31/2877
摘要： A system for testing objects such as electronic devices and mechanical components to see how they can withstand thermally hard circumstances created by a thermal agent supplied from a supplying section communicating with a testing section by and through an inlet flow path and an outlet flow path, wherein heat exchange is effected between the incoming agent and the outgoing agent, so that the remaining heat content, worm or cold, is taken and utilized for later uses.
摘要翻译：一种用于测试诸如电子设备和机械部件的物体的系统，以便看到它们如何能够承受由通过入口流动路径和出口流动路径与测试部分连通的供应部分供应的热剂产生的热硬化环境，其中在进料和出料之间进行热交换，使得剩余的热含量，蠕虫或冷，被采用并用于以后的用途。

7. 发明公开

EP1894074A2 METHODS AND APPARATUS FOR OPTIMIZING ENVIRONMENTAL HUMIDITY 审中-公开
标题翻译：方法和设备优化环境湿度
公开(公告)号：EP1894074A2
公开(公告)日：2008-03-05
申请号：EP06773012.7
申请日：2006-06-13
申请人： Sigma Systems Corporation
发明人： BASTON, Colin
IPC分类号： G05D22/02
CPC分类号： F24F3/14 , F24F11/0008 , G01R31/2849 , G01R31/2881 , G05D22/02
摘要： A humidity control apparatus and methods for use with, e.g., an environmental test chamber. In one embodiment, the apparatus comprises a system having a test chamber, a water tank, motive source for a gaseous humidity carrier, and temperature controllers for the tank and chamber. The carrier gas (e.g., air) is diffused through the water tank, thereby saturating the gas to a prescribed humidity level. This saturated gas is then passed into the chamber, and the environment within the chamber (i.e., humidity and temperature) controlled by the controller(s) so as to maintain the desired humidity level. The apparatus disclosed has the primary advantage of reducing or even substantially eliminating condensation within the test chamber when humidity levels are increased.

8. 发明公开

EP1583007A2 Method for evaluating semiconductor device error and system for supporting the same 审中-公开
标题翻译：评估半导体器件错误的方法和用于支持该方法的系统
公开(公告)号：EP1583007A2
公开(公告)日：2005-10-05
申请号：EP05000924.0
申请日：2005-01-18
申请人： Renesas Technology Corp.
发明人： Ibe, Hidefumi Hitachi, Ltd. , Yahagi, Yasuo Hitachi, Ltd. , Kameyama, Hideaki Hitachi, Ltd.
IPC分类号： G06F17/50 , G11C29/00
CPC分类号： G01R31/31816 , G01R31/002 , G01R31/2849 , G01R31/2881 , G01R31/30
摘要： When resistivity against errors caused by cosmic ray neutrons in a semiconductor device is evaluated, the storage (120) in the evaluation apparatus stores multiple spectrum data of white neutrons having different spectrum shapes, and multiple SEE counts obtained by the white neutron method using this multiple spectrum data. A computing section (100) performs processing, with respect to each spectrum data, to read out the spectrum data from the storage, divide the data into multiple energy groups, calculates and stores a total flux of each energy group. Furthermore, the computing section reads out from the storage, the SEE counts with respect to each of the multiple spectrum data and the total flux of each energy group, substitutes the SEE counts and the total flux into a simultaneous equation, where a product of matrix elements indicating the total flux of each of the energy groups as to each of the multiple spectrum data and vectors indicating the SEE cross section of each of the energy groups represents the SEE count as to each of the multiple spectrum data, and calculates the SEE cross section for each of the energy groups. Subsequently, the computing section performs a calculation so that parameters are calculated, which determine a formula of the approximate function of the SEE cross section as a function of energy, so that computed values of error counts obtained by integration of multiple spectra and the approximate function sufficiently match the actual measured values thereof. With the processing as described above, there has been achieved an error evaluation in the semiconductor device using white neutrons independent from an accelerator.
摘要翻译：当评估半导体器件中由宇宙射线中子引起的误差的电阻率时，评估设备中的存储器（120）存储具有不同光谱形状的白色中子的多个光谱数据，并且使用该倍数通过白色中子法获得多个SEE计数频谱数据。计算部（100）针对每个谱数据执行处理以从存储器读出谱数据，将数据划分为多个能量组，计算并存储每个能量组的总通量。此外，计算部分从存储器中读出关于多个光谱数据中的每一个和每个能量组的总通量的SEE计数，将SEE计数和总通量代入联立方程，其中矩阵指示关于多个谱数据中的每一个的每个能量组的总通量的元素以及指示每个能量组的SEE截面的向量表示针对多个谱数据中的每一个的SEE计数，并且计算SEE交叉部分为每个能源组。随后，计算部分执行计算，从而计算参数，其确定作为能量的函数的SEE截面的近似函数的公式，使得通过多个谱的积分获得的误差计数的计算值和近似函数充分匹配其实际测量值。通过如上所述的处理，已经在使用独立于加速器的白色中子的半导体器件中实现了误差评估。

9. 发明公开

EP1247112A1 SCHALTUNGSANORDNUNG ZUR SIMULATION DER EINGANGS- ODER AUSGANGSLAST EINER ANALOGSCHALTUNG 有权
标题翻译：电路进行仿真模拟电路的输入或输出负载
公开(公告)号：EP1247112A1
公开(公告)日：2002-10-09
申请号：EP01907421.0
申请日：2001-01-09
申请人： Infineon Technologies AG
发明人： SCHERR, Wolfgang
IPC分类号： G01R31/28
CPC分类号： G01R31/2844 , G01R31/2849
摘要： According to the invention, in order to simulate the input or output load of an analogue circuit (A), the output of the analogue circuit (A) is connected to the input of a driver stage (I). A measuring element (V) is placed between the input of the driver stage (I) and the reference potential, in order to record the output voltage of the analogue circuit (A). A digital simulator (DS) controls a controllable transfer impedance, arranged between the output of the driver stage and the reference potential, in order to simulate various output loads. An alternative to this is to connect the output of the driver stage (I) with the input of the analogue circuit (A). The input of the driver stage (I) has a shunt connection of a controllable current or voltage source (Q1), a first resistance (R1) and a first capacitance (C1). The digital simulator (DS) controls the controllable current or voltage source (Q1), in order to simulate various output loads. Should the output of the analogue circuit (A) be connected to the output of the driver stage (I), then the driver stage (I) is switched off.

10. 发明公开

EP1019740A4 METHOD AND APPARATUS FOR TESTING ENCAPSULATED CIRCUITS 失效
标题翻译： GERÄTUND VERFAHREN ZURPRÜFUNGVON GEKAPSELTEN SCHALTUNGEN
公开(公告)号：EP1019740A4
公开(公告)日：2000-07-19
申请号：EP97954274
申请日：1997-12-22
申请人： MC DONNELL DOUGLAS CORP
发明人： BERRY JOHN C JR , FOGG LARRY L
IPC分类号： G01R31/28 , G01R31/26 , G01M3/04
CPC分类号： G01R31/2849
摘要： A method and apparatus for evaluating the suitability of an encapsulated electrical circuit for use in a particular service environment provides for immersing the encapsulated circuit in a slightly conductive evaluating fluid whose chemical composition approximates the environment into which the circuit will be placed in service. The thus-immersed circuit is then subjected to a reduced-pressure testing environment to draw air and other retained gases out of internal voids within the encapsulated circuit. The pressure of the testing environment is slowly increased to cause the encapsulated circuit to ingest a quantity of the evaluating fluid. An input signal is then applied to the circuit and the circuit's response to the input signal is monitored over a predetermined time period.
摘要翻译：用于评估用于特定服务环境中的封装电路的适用性的方法和装置提供将封装电路浸入轻微导电的评估流体中，其化学组成近似于电路将投入使用的环境。然后将如此浸入的电路进行减压测试环境，以将空气和其它保留的气体从封装的电路内的内部空隙中抽出。测试环境的压力缓慢增加，使得封装的电路摄取一定量的评估流体。然后将输入信号施加到电路，并且在预定时间段内监视电路对输入信号的响应。

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