专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

1. 发明授权

EP2989732B1 BANC DE TESTS CEM COMPRENANT UN ÉQUIPEMENT SOUS TESTS DESTINE A ÊTRE EMBARQUE DANS UN AÉRONEF 有权转让
公开(公告)号：EP2989732B1
公开(公告)日：2018-06-13
申请号：EP14726698.5
申请日：2014-04-25
申请人： Snecma
发明人： SALVATGE, Rémy , LAIR, Cyril
IPC分类号： H04B10/25 , H04B10/40 , H04B10/80
CPC分类号： G01R31/002 , G01R31/008 , H04B10/2503 , H04B10/40 , H04B10/802 , H04Q11/0005 , H04Q2011/0039 , H04Q2011/0041 , H04Q2011/0083

2. 发明授权

EP2939036B1 IN-TOOL ESD EVENTS MONITORING METHOD AND APPARATUS 有权
标题翻译：工具ESD事件监测方法和设备
公开(公告)号：EP2939036B1
公开(公告)日：2017-05-24
申请号：EP13821627.0
申请日：2013-12-27
申请人： Illinois Tool Works Inc.
发明人： NELSEN, Lyle D. , HEYMANN, Steven B. , HOGSETT, Mark E.
IPC分类号： G01R31/00 , G01R35/00
CPC分类号： G01R31/002 , G01R31/001 , G01R35/005
摘要： In one embodiment of the invention, an apparatus for electrostatic discharges (ESD) events monitoring incorporating a charged device model event simulator (CDMES) unit comprises: at least one antenna positioned in a process area; an ESD detector coupled to said at least one antenna; said ESD detector wirelessly coupled to said CDMES unit; and said ESD detector calibrated for different discharge energies generated by said CDMES unit.
摘要翻译：在本发明的一个实施例中，一种用于静电放电（ESD）事件监测的装置，其包含带电装置模型事件模拟器（CDMES）单元，该装置包括：位于处理区域中的至少一个天线; 耦合到所述至少一个天线的ESD检测器; 所述ESD检测器无线耦合到所述CDMES单元; 并且所述ESD检测器校准由所述CDMES单元产生的不同放电能量。

3. 发明授权

EP1972953B1 ESD test system calibration 有权转让
公开(公告)号：EP1972953B1
公开(公告)日：2017-05-03
申请号：EP08152960.4
申请日：2008-03-18
申请人： IMEC , Hanwa Electronics Ind. Co. Ltd.
发明人： Scholz, Mirko , Tremouilles, David Eric , Thijs, Steven , Linten, Dimitri
IPC分类号： G01R31/00 , G01R35/00
CPC分类号： G01R31/002 , G01R35/005

4. 发明授权

EP1701167B1 Verfahren und Vorrichtung zur Identifizierung von Funkstörpegeln asynchron zur Messung des Frequenzspektrums 有权
标题翻译：方法和装置Funkstörpegeln识别异步于频谱的测量
公开(公告)号：EP1701167B1
公开(公告)日：2016-10-19
申请号：EP06002656.4
申请日：2006-02-09
申请人： Rohde & Schwarz GmbH & Co. KG
发明人： Keller, Matthias
IPC分类号： G01R29/08 , G01R23/16 , G01R31/00
CPC分类号： G01R31/002 , G01R23/16 , G01R29/08 , G01R29/0871

5. 发明公开

EP2455771A4 MEASUREMENT DEVICE AND MEASUREMENT METHOD 有权
标题翻译：测量装置和测量方法
公开(公告)号：EP2455771A4
公开(公告)日：2014-08-06
申请号：EP10799766
申请日：2010-07-08
申请人： HITACHI LTD
发明人： IBE HIDEFUMI , TOBA TADANOBU , SHIMBO KEN-ICHI , TANIGUCHI HITOSHI
IPC分类号： G01R31/28 , G01R31/00 , G01R31/307 , G01R31/3181 , G11C11/412 , G11C29/04 , G11C29/56 , H03K19/003
CPC分类号： G01R31/31816 , G01R31/002 , G01R31/307 , G11C11/4125 , G11C29/04 , H03K19/0033

6. 发明公开

EP2753943A1 PROCÉDÉ DE CARACTÉRISATION DE LA SENSIBILITÉ D'UN COMPOSANT ÉLECTRONIQUE SOUMIS À DES CONDITIONS D'IRRADIATION 审中-公开
标题翻译：在于用于判定电子元件的灵敏度辐射条件
公开(公告)号：EP2753943A1
公开(公告)日：2014-07-16
申请号：EP12755864.1
申请日：2012-09-05
申请人： European Aeronautic Defence and Space Company EADS France
发明人： MILLER, Florent , WEULERSSE, Cécile
IPC分类号： G01R31/00 , G01R31/28 , G01R31/3181
CPC分类号： G01R31/2601 , G01R31/002 , G01R31/008 , G01R31/2881 , G01R31/30 , G01R31/31816
摘要： The aim of the invention is a method of selecting a piece of electronic equipment comprising at least an electronic component (101), said electronic equipment potentially being subjected to irradiation conditions listed in predetermined specifications, the method comprising a phase for the characterisation of a sensitivity parameter of the electronic component (101) to these irradiation conditions, this phase comprising: - an irradiation step (210) of irradiating the electronic component (101) with a source of ionizing radiation (100) having the known irradiation characteristics and geometry, - a step (220) of measuring a set of operating values of the electronic component (101) during this irradiation step, said method being characterised in that: - the irradiation step comprises measurements of the sensitivity of the electronic component (101) for a number of irradiation conditions lower than all of the conditions listed in the specifications, - the method further comprises a step (240) of extrapolating the measured results to the other irradiation conditions of the specifications.
摘要翻译：由电子部件的灵敏度参数表征在预定规格列出的照射条件选择一个片，其包含至少一个电子元件进行照射条件的电子设备的方法。的电子部件照射电离具有已知辐射特性和几何形状的辐射源。一组电子元件的操作值的电子元件的照射期间被测量。所述电子部件的灵敏度被测量了数比所有的在规格中所列的条件下照射条件。测得的结果外推到规格的其他照射条件。

7. 发明公开

EP2726887A1 DEVICE AND METHOD FOR EMI SOURCE LOCATION 失效
标题翻译：设备和检测方法的EMI源地
公开(公告)号：EP2726887A1
公开(公告)日：2014-05-07
申请号：EP11728853.0
申请日：2011-07-01
申请人： Telefonaktiebolaget LM Ericsson (PUBL)
发明人： SANDER, Sverker
IPC分类号： G01R29/08 , G01R31/28
CPC分类号： G01R31/002 , G01R31/2818
摘要： An electronics device (300, 400, 500), comprising one or more circuit boards (410, 510, 511, 512) and a plurality of power converters (310, 325, 415) on one or more of said circuit boards (410, 510, 511, 512), each power converter (310, 325, 415) comprising one or more transducers (315, 330) for measuring a voltage or a current in the power converter, the electronics device (300, 400, 500) additionally comprising a sub-system for locating sources of electromagnetic interference (320, 420, 520). The transducers (315, 330) of two or more of the power converters (310, 325, 415) are also connected to the sub-system for locating sources of electromagnetic interference (320, 420, 520) to supply it with measurement data. The subsystem for locating sources of electromagnetic interference (320, 420, 520) is arranged to use the measurement data from the transducers (315, 330) in order to locate sources of electromagnetic interference.

8. 发明公开

EP2571213A1 DIFFERENTIAL SIGNAL TRANSMISSION LINE, IC PACKAGE, AND METHOD FOR TESTING SAID DIFFERENTIAL SIGNAL TRANSMISSION LINE AND IC PACKAGE 审中-公开
标题翻译：线差信号的用于测试线差分信号和IC封装的传输的传输，IC封装及方法
公开(公告)号：EP2571213A1
公开(公告)日：2013-03-20
申请号：EP11780340.3
申请日：2011-04-13
申请人： Panasonic Corporation
发明人： MASUDA, Kohei , SHIBATA, Osamu , SUENAGA, Hiroshi , SAITO, Yoshiyuki
IPC分类号： H04L25/02 , H01L23/50 , H04B3/02
CPC分类号： H04B3/30 , G01R31/002 , H01L22/32 , H01L23/66 , H01L24/48 , H01L24/49 , H01L2223/6611 , H01L2223/6638 , H01L2224/48227 , H01L2224/48247 , H01L2224/49171 , H01L2924/00014 , H01L2924/14 , H01L2924/30107 , H01L2924/3011 , H01L2924/30111 , H04B3/46 , H04B3/50 , H04L25/0272 , H04L25/0276 , H04L25/0278 , H01L2924/00 , H01L2224/45099 , H01L2224/45015 , H01L2924/207
摘要： An IC package (50) includes an integrated circuit (10) for transmitting and receiving a pair of differential signals composed of a signal having positive polarity and a signal having negative polarity, a first signal terminal (41a) for transmitting the signal having positive polarity, a second signal terminal (41b) for transmitting the signal having negative polarity, and a third terminal (43) arranged between the first signal terminal and the second signal terminal. The first and second terminals are electrically connected to the integrated circuit, and the third terminal (43) is not electrically connected to the integrated circuit.
摘要翻译：的IC封装（50）包括用于传送和接收一对信号组成的差分信号的具有正极性和信号具有负的极性，用于发射具有正极性的信号的第一信号端子（41A）的集成电路（10），用于发射具有极性负信号的第二信号端子（41B），并且所述第一信号端子和第二信号端子之间设置的第三端子（43）。第一和第二端子电连接到所述集成电路，并且所述第三端子（43）不电连接到所述集成电路。

9. 发明公开

EP2447724A1 METHOD FOR IMPLEMENTING ELECTROMAGNETIC ANTI-INTERFERENCE FILTER IMPEDANCE MATCH AND MEASURING SYSTEM THEREOF 有权
标题翻译：程序阻抗匹配的电磁干扰滤波器抗和测量系统及其实现
公开(公告)号：EP2447724A1
公开(公告)日：2012-05-02
申请号：EP10791583.7
申请日：2010-06-25
申请人： ZTE Corporation
发明人： ZHOU, Ming
IPC分类号： G01R27/08 , G01R31/00
CPC分类号： G01R31/002 , G01R27/02 , H01J37/32183 , H03H11/28 , H03H11/30
摘要： A measuring system for implementing impedance matching of an electromagnetic immunity filter comprises an impedance measuring chip, an impedance reading device, and a power supply module and a load circuit in a circuit to be applied by the electromagnetic immunity filter; wherein, the impedance measuring chip, connected between the power supply module and the load circuit, is configured to output an excitation voltage to the load circuit, receive a current returned by the load circuit, calculate an impedance of the load circuit based on the excitation voltage and the current returned by the load circuit, and output the impedance to the impedance reading device; and the impedance reading device is configured to read the impedance calculated by the impedance measuring chip. Accordingly, the present invention further provides a method for implementing impedance matching of an electromagnetic immunity filter. Using the present invention, a test process is greatly simplified, pertinence of test results is strong, an impedance of a single board may be measured directly so as to provide the impedance of a network element system composed of different single boards.
摘要翻译：一种用于在电路实现电磁抗扰滤波器阻抗测量芯片的包括，到阻抗读取装置，和一个电源模块和负载电路的阻抗匹配的测量系统，以通过电磁抗扰滤波器而施用; worin，阻抗测量芯片，连接在电源模块和负载电路之间，被配置为输出至激励电压施加到所述负载电路，接收由所述负载电路返回的电流，计算基于所述激励的负载电路的阻抗电压和由负载电路返回的电流，并输出阻抗与阻抗读取装置; 和阻抗读取装置，用于读取由所述阻抗测量芯片计算的阻抗。因此，本发明还提供用于实现电磁抗扰滤波器的阻抗匹配的方法。使用本发明，测试过程大大简化，测试结果的针对性强，于单个板的阻抗可以直接测量，以便提供不同的单板组成的网络元件的系统的阻抗。

10. 发明公开

EP2359155A1 DISPOSITIF DE TEST DE CIRCUIT INTEGRE ET PROCEDE DE MISE EN OEUVRE 有权
标题翻译：设备技术测试集成电路和方法实现
公开(公告)号：EP2359155A1
公开(公告)日：2011-08-24
申请号：EP09801478.0
申请日：2009-12-02
申请人： European Aeronautic Defence And Space Company EADS
发明人： MILLER, Florent , WEULERSSE, Cécile , BOUGEROL, Antonin , CARRIERE, Thierry , HEINS, Patrick , HAZO, Samuel
IPC分类号： G01R31/28
CPC分类号： G01R31/2881 , G01R31/002 , G01R31/2849
摘要： The invention relates to a device (1) for testing an integrated circuit (2), comprising: a platen (3) for receiving the integrated circuit (2) and subjecting it to the test, the platen (3) comprising circuits (4) for powering and operating the integrated circuit (2) and circuits (5) for measuring the operation of the integrated circuit (2) during the test; an irradiation device (6) for subjecting the circuit (2) to a proton bombardment (7), characterised in that said irradiation device comprises a mask (8) with a variable thickness provided between a bombardment access region (9) on the integrated circuit (2) and an implanted area (10) of the integrated circuit (2).

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式