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    • 8. 发明申请
    • CONTACT RESISTANCE MEASUREMENT FOR RESISTANCE LINEARITY IN NANOSTRUCTURE THIN FILMS
    • 接触电阻测量在纳米薄膜中的电阻线性
    • WO2011025782A1
    • 2011-03-03
    • PCT/US2010/046493
    • 2010-08-24
    • CAMBRIOS TECHNOLOGIES CORPORATIONSPAID, MichaelPSCHENITZKA, Florian
    • SPAID, MichaelPSCHENITZKA, Florian
    • G06F3/045
    • G06F3/045
    • The present disclosure is directed to a transparent conductor for use in touch panel devices having a plurality of nanostructures therein that provides reliable output based on user touch or pen input. To determine if a touch panel is reliable, there is disclosed a method of measuring voltages across the transparent conductor when it is touched. These measured voltages are converted into contact resistances, which are statistically analyzed. A median contact resistance is determined based on the converted contact resistances. The remaining set of converted contact resistances are analyzed to determine if they are within acceptable limits. Acceptable limits may include most of the contact resistances falling within a range, none of the contact resistances exceeding an upper limit, and a difference in contact resistances converted for different users or pens does not exceed a maximum variability.
    • 本公开涉及一种用于其中具有多个纳米结构的触摸面板装置的透明导体,其基于用户触摸或笔输入提供可靠的输出。 为了确定触摸面板是否可靠,公开了一种当触摸时测量透明导体上的电压的方法。 这些测量的电压被转换为接触电阻,进行统计分析。 基于转换的接触电阻确定中值接触电阻。 分析剩余的一组转换的接触电阻以确定它们是否在可接受的限度内。 可接受的限制可以包括大部分接触电阻落在一个范围内,接触电阻不超过上限,并且不同用户或笔转换的接触电阻差不超过最大变化。