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    • 45. 发明申请
    • WEIGHTED PROGRAMMING PATTERNS IN SOLID-STATE DATA STORAGE SYSTEMS
    • 固态数据存储系统中加权编程模式
    • WO2017053460A1
    • 2017-03-30
    • PCT/US2016/052928
    • 2016-09-21
    • WESTERN DIGITAL TECHNOLOGIES, INC.
    • KASHYAP, Abhilash RaviMAIN, Dale Charles
    • G11C16/10G11C16/34G11C16/04G06F3/06
    • G06F3/0619G06F3/0632G06F3/0679G11C7/1006G11C11/5628G11C11/5642G11C16/10G11C16/3427
    • Systems and methods are disclosed for programming data in non-volatile memory arrays. A data storage device includes a solid-state non-volatile memory including a plurality of memory cells and a controller configured to improve data retention or reduce read disturb of at least a portion of the solid-state non-volatile memory at least in part by receiving data to be written to the solid-state non-volatile memory. The controller is further configured to, when a data retention programming mode is set, encode the data using a programming pattern that favors a first programming state over a second programming state, the first programming state being associated with a lower voltage level than the second programming state, and write the encoded data to the solid-state non-volatile memory. When a read disturb programming mode is set, the first programming state is associated with a higher voltage level than the second programming state.
    • 公开了用于在非易失性存储器阵列中编程数据的系统和方法。 数据存储设备包括固态非易失性存储器,其包括多个存储器单元,以及控制器,其被配置为至少部分地通过以下方式改进至少一部分固态非易失性存储器的数据保持或减少读取干扰: 接收要写入固态非易失性存储器的数据。 控制器还被配置为当设置数据保留编程模式时,使用在第二编程状态下有利于第一编程状态的编程模式对数据进行编码,所述第一编程状态与比第二编程的低电压电平相关联 状态,并将编码数据写入固态非易失性存储器。 当设置读取干扰编程模式时,第一编程状态与比第二编程状态更高的电压电平相关联。
    • 46. 发明申请
    • NAND BOOSTING USING DYNAMIC RAMPING OF WORD LINE VOLTAGES
    • 使用文字线电压的动态斜率进行NAND升压
    • WO2016081064A1
    • 2016-05-26
    • PCT/US2015/052066
    • 2015-09-24
    • SANDISK TECHNOLOGIES INC.
    • RABKIN, PeterDONG, YingdaHIGASHITANI, Masaaki
    • G11C11/56G11C16/04G11C16/10G11C16/34
    • G11C16/3427G11C11/5628G11C16/0483G11C16/10G11C16/3418
    • Methods for improving channel boosting and reducing program disturb during programming of memory cells within a memory array are described. The memory array may comprise a NAND flash memory structure, such as a vertical NAND structure or a bit cost scalable (BiCS) NAND structure. In some cases, by applying continuous voltage ramping to unselected word lines during or throughout a programming operation, the boosting of channels associated with program inhibited memory cells may be improved. In one example, the slope and timing of a Vpass waveform applied to a group of unselected word lines (e.g., the neighboring word lines of the selected word line) during the programming operation may be set based on the location of the selected word line within the memory array and the locations of the group of unselected word lines within the memory array.
    • 描述了用于在存储器阵列内的存储器单元的编程期间改进信道增强和减少编程干扰的方法。 存储器阵列可以包括NAND快闪存储器结构,诸如垂直NAND结构或位成本可缩放(BiCS)NAND结构。 在一些情况下,通过在编程操作期间或整个编程操作期间对未选择的字线施加连续电压斜坡,可以提高与编程禁止的存储器单元相关联的通道的升压。 在一个示例中,可以基于所选择的字线的位置来设置在编程操作期间施加到一组未选择字线(例如,所选字线的相邻字线)的Vpass波形的斜率和定时 存储器阵列和存储器阵列内的未选择字线组的位置。
    • 50. 发明申请
    • INTERNAL DATA LOAD FOR NON-VOLATILE STORAGE
    • 用于非易失性存储的内部数据负载
    • WO2014137631A1
    • 2014-09-12
    • PCT/US2014/017846
    • 2014-02-21
    • SANDISK TECHNOLOGIES INC.
    • CHEN, WenzhouLEE, DanaZHENMING, ZhouGUIRONG, Liang
    • G11C11/56G11C16/04G11C16/34
    • G11C11/5628G11C11/5642G11C16/0483G11C16/10G11C16/26G11C16/28G11C16/3418G11C16/3427G11C16/3454G11C2211/5648
    • Techniques are disclosed herein for performing an Internal Data Load (IDL) to sense non-volatile storage elements. Read pass voltages that are applied to two neighbor word lines to a selected word line may be adjusted to result in a more accurate IDL. The read pass voltage for one neighbor may be increased by some delta voltage, whereas the read pass voltage for the other neighbor may be decreased by the same delta voltage. In one aspect, programming of an upper page of data into a word line that neighbors a target word line is halted to allow lower page data in the target memory cells to be read using an IDL and preserved in data latches while programming the upper page in the neighbor word completes. Preservation of the lower page data provides a cleaner lower page when later programming the upper page into the target memory cells.
    • 本文公开了用于执行内部数据加载(IDL)以感测非易失性存储元件的技术。 可以调整施加到选定字线的两个相邻字线的读通过电压,以产生更准确的IDL。 一个相邻的读取通过电压可以增加一些Δ电压,而另一个相邻的读取通过电压可以减小相同的delta电压。 在一个方面,停止将数据的上部页面编程为与目标字线相邻的字线,以允许使用IDL读取目标存储器单元中的较低页面数据,并将其保存在数据锁存器中,同时对 邻居词完成。 当稍后将上部页面编程到目标存储器单元中时,保留下部页面数据提供了更干净的下部页面。