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    • 1. 发明授权
    • Frequency shift detection circuit with selectable granularity
    • 具有可选粒度的频移检测电路
    • US6011412A
    • 2000-01-04
    • US70925
    • 1998-05-01
    • Jonathan William ByrnChad B. McBrideBrian Andrew Schuelke
    • Jonathan William ByrnChad B. McBrideBrian Andrew Schuelke
    • H03D13/00
    • H03D13/004
    • A frequency shift detection circuit for detecting a frequency shift between a first signal and a second signal includes two or more delay circuits coupled to one another in series and two or more comparison logic circuits. The first delay circuit in the series receives one of the first and second signals and produces a delayed replica. Each of the other delay circuits receives the delayed replica produced by the previous delay circuit in the series and produces a further delayed replica. Thus, the signal produced by each delay circuit is delayed from the original signal by a different amount. Each comparison logic circuit receives one of the delayed replicas and receives the other one of the first and second signals, i.e., the one that is not received by the delay circuits. In response, the comparison logic circuit produces a frequency shift detection signal when it detects a phase difference between that other one of said first and second signals and the delayed replica. By selecting or tapping one of the outputs of the comparison logic circuits, a user can select the detection granularity.
    • 用于检测第一信号和第二信号之间的频移的频移检测电路包括串联耦合的两个或更多个延迟电路和两个或更多个比较逻辑电路。 该系列中的第一个延迟电路接收第一和第二信号中的一个并产生延迟的副本。 每个其他延迟电路接收由串联中的先前延迟电路产生的延迟复制品,并产生另一延迟复制品。 因此,由每个延迟电路产生的信号从原始信号延迟不同的量。 每个比较逻辑电路接收一个延迟的副本并且接收第一和第二信号中的另一个,即未被延迟电路接收的信号。 作为响应,当比较逻辑电路检测到所述第一和第二信号中的另一个与延迟的副本之间的相位差时,产生频移检测信号。 通过选择或敲击比较逻辑电路的输出之一,用户可以选择检测粒度。
    • 6. 发明授权
    • Placement of configurable input/output buffer structures during design of integrated circuits
    • 在集成电路设计期间配置输入/输出缓冲结构
    • US06823502B2
    • 2004-11-23
    • US10334568
    • 2002-12-31
    • Matthew Scott WingrenGeorge Wayne NationGary Scott DelpJonathan William Byrn
    • Matthew Scott WingrenGeorge Wayne NationGary Scott DelpJonathan William Byrn
    • G06F1750
    • G06F17/5045G06F2217/64
    • A tool for designing an integrated circuit and semiconductor product that generates correct RTL for I/O buffer structures in consideration of the requirements of diffused configurable I/O blocks and/or I/O hardmacs of the product. Given either a slice description of a partially manufactured semiconductor product, a designer can generate the I/O resources of an application set. Then given an application set having a transistor fabric, and the diffused configurable I/O blocks and/or the I/O hardmacs, and a plurality of accompanying shells, the I/O generation tool herein automatically reads a database having the slice description and generates the I/O buffer structures from the transistor fabric. The I/O generation tool further conditions and integrates input from either or both customer having her/his own logic and requesting a specific semiconductor product or from IP cores with their preestablished logic. The I/O generation tool creates correct RTL from the transistor fabric for correct placement, timing, testing, and function of I/O buffer amplifiers for the semiconductor product, either incrementally or globally. Once I/O buffer structures are created, they are qualified by a plurality of shells including a verification shell, a static timing analysis shell, a manufacturing test shell, and a RTL analysis shell.
    • 考虑到产品的扩散可配置I / O块和/或I / O硬件的要求,用于设计集成电路和半导体产品的工具,为I / O缓冲结构生成正确的RTL。 给定部分制造的半导体产品的切片描述,设计者可以生成应用集的I / O资源。 然后给出具有晶体管结构以及扩散的可配置I / O块和/或I / O硬件以及多个伴随壳的应用组,这里的I / O生成工具自动读取具有切片描述的数据库和 从晶体管结构生成I / O缓冲结构。 I / O生成工具进一步调整并集成了具有自己的逻辑的客户的两个或两个客户的输入,并且请求特定的半导体产品或者从它们的预先建立的逻辑获得IP核。 I / O生成工具可以从晶体管结构创建正确的RTL,以正确布局,定时,测试和半导体产品的I / O缓冲放大器的功能,无论是增量还是全局。 一旦创建了I / O缓冲区结构,它们就被多个shell限定,包括验证shell,静态时序分析shell,制造测试shell和RTL分析shell。