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    • 7. 发明公开
    • 비트라인 커플링 노이즈를 감소시키는 반도체 메모리 장치
    • 半导体存储器件减少位线耦合噪声
    • KR1020110087052A
    • 2011-08-02
    • KR1020100006498
    • 2010-01-25
    • 삼성전자주식회사
    • 김상윤고태영
    • G11C7/12G11C7/18G11C7/06G11C5/06G11C7/02G11C11/4097G11C11/4094
    • G11C5/06G11C5/063G11C7/02G11C11/4097G11C7/12G11C7/06G11C7/18G11C11/4094
    • PURPOSE: A semiconductor memory device for reducing the coupling noise between bit lines is provided to secure the voltage margin of a memory cell and the sensing margin of a sense amplifier by compensating for the resistance component of first and second sub array bit lines. CONSTITUTION: In a semiconductor memory device for reducing the coupling noise between bit lines, first and second memory cell arrays include at least one word line and at least three bit lines(BL0,BL1,BL2) and memory cells. The at least three bit lines are crossed with the word line. The memory cells are arranged at the crossing of the word line and the bit line. A sense amp senses and amplifies the data of the memory cells. A sense amp area(7) is arranged between the first cell array and the second memory cell array. The sense amp area connects the bit lines with the data lines.
    • 目的:提供一种用于减小位线之间的耦合噪声的半导体存储器件,用于通过补偿第一和第二子阵列位线的电阻分量来确保存储单元的电压余量和读出放大器的感测余量。 构成:在用于减少位线之间的耦合噪声的半导体存储器件中,第一和第二存储单元阵列包括至少一个字线和至少三个位线(BL0,BL1,BL2)和存储器单元。 至少三条位线与字线交叉。 存储单元布置在字线和位线的交叉处。 感测放大器感测并放大存储器单元的数据。 感测放大器区域(7)布置在第一单元阵列和第二存储单元阵列之间。 感测放大器区域将数据线连接到位线。