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    • 4. 发明公开
    • 반도체 장치
    • 半导体器件
    • KR1020140147045A
    • 2014-12-29
    • KR1020140073567
    • 2014-06-17
    • 가부시키가이샤 한도오따이 에네루기 켄큐쇼
    • 아오키다케시구로카와요시유키고즈마무네히로나카가와다카시
    • G11C5/14G11C7/00
    • H03K19/0013H03K19/018585
    • The present invention relates to data retention of a register in a programmable logic element. A volatile storage circuit and a nonvolatile storage circuit are provided in a register of a programmable logic element whose function can be changed in response to a plurality of context signals. The nonvolatile storage circuit includes nonvolatile storage portions for storing data in the register. The number of nonvolatile storage portions corresponds to the number of context signals. With such a structure, the function can be changed each time context signals are switched and data in the register that are changed when the function is changed can be backed up to the nonvolatile storage portion in each function. In addition, the function can be changed each time context signals are switched and the data in the register that are backed up when the function is changed can be recovered to the volatile storage circuit.
    • 本发明涉及可编程逻辑元件中寄存器的数据保持。 易失性存储电路和非易失性存储电路设置在可编程逻辑元件的寄存器中,该可编程逻辑元件的功能可以响应于多个上下文信号而改变。 非易失性存储电路包括用于将数据存储在寄存器中的非易失性存储部分。 非易失性存储部分的数量对应于上下文信号的数量。 通过这样的结构,可以在每次上下文信号切换时改变功能,并且在功能改变时改变的寄存器中的数据可以备份到每个功能中的非易失性存储部分。 此外,每当上下文信号被切换并且功能改变时备份的寄存器中的数据可以被恢复到易失性存储电路时,可以改变该功能。
    • 5. 发明公开
    • 임피던스 조절회로 및 이를 포함하는 반도체 장치
    • 用于控制阻抗的电路和包括其的半导体器件
    • KR1020130050821A
    • 2013-05-16
    • KR1020110116074
    • 2011-11-08
    • 에스케이하이닉스 주식회사
    • 고형준
    • G11C7/10G11C7/22
    • H03K19/0005H03K19/018557H03K19/018585
    • PURPOSE: An impedance control circuit and a semiconductor device including the same are provided to improve the accuracy of impedance matching in a termination operation by reducing the impedance mismatch of a pull-up termination unit and a pull-down termination unit. CONSTITUTION: A pull-up code generating unit(310) generates a pull-up impedance control code by using the voltage of a first node. A pull-up impedance unit(330) pulls up the first node with an impedance value determined by a pull-up impedance control code. First to M-th dummy impedance units(350A-350C) are activated or inactivated in response to first to M-th selection signals and pull up a second node. A pull-down code generating unit(360) generates a pull-down impedance control code by using the voltage of the second node. First to M-th pull-down impedance units are activated or inactivated in response to the first to M-th selection signals and pull down the second node. [Reference numerals] (300) Impedance control circuit control unit; (312) Pull-up counter unit; (340) First selection unit; (362) Pull-down counter unit; (380) Second selection unit
    • 目的:提供一种阻抗控制电路和包括该阻抗控制电路的半导体器件,以通过减小上拉端接单元和下拉终端单元的阻抗失配来提高端接操作中的阻抗匹配精度。 构成:上拉代码生成单元(310)通过使用第一节点的电压来产生上拉阻抗控制代码。 上拉阻抗单元(330)以由上拉阻抗控制代码确定的阻抗值拉起第一节点。 第一至第M个虚拟阻抗单元(350A-350C)响应于第一至第M选择信号被激活或失活并且上拉第二节点。 下拉码产生单元(360)通过使用第二节点的电压来产生下拉阻抗控制码。 第一至第M下拉阻抗单元响应于第一至第M选择信号被激活或失活,并下拉第二节点。 (附图标记)(300)阻抗控制电路控制单元; (312)上拉计数器单元; (340)首选单位; (362)下拉计数器单元; (380)第二选择单元
    • 6. 发明公开
    • 반도체 장치
    • 半导体器件
    • KR1020130033698A
    • 2013-04-04
    • KR1020110097531
    • 2011-09-27
    • 에스케이하이닉스 주식회사
    • 김미혜
    • G11C7/10G11C5/14
    • H03K19/018521H03K19/018585
    • PURPOSE: A semiconductor device is provided to control the driving of a pre-emphasis according to the change of a PVT(Process, Voltage, and Temperature) by performing a pre-emphasis operation using a pre-emphasis code. CONSTITUTION: A code generating unit(240) generates a pre-emphasis code controlled by corresponding to the change of an impedance code. A main driving unit(210) drives a data output pad by receiving output data and controls driving power in response to the impedance code. A sub driving unit(220) drives the data output pad by receiving the output pad and controls driving power in response to the pre-emphasis code. [Reference numerals] (210) Main driving unit; (220) Sub driving unit; (230) Driving control signal generating unit; (240) Code generating unit;
    • 目的:提供半导体器件,通过使用预加重代码执行预加重操作,根据PVT(过程,电压和温度)的变化来控制预加重的驱动。 构成:代码生成单元(240)生成与阻抗代码的变化对应地控制的预加重代码。 主驱动单元(210)通过接收输出数据来驱动数据输出垫,并根据阻抗代码来控制驱动功率。 子驱动单元(220)通过接收输出焊盘来驱动数据输出焊盘,并响应于预加重代码来控制驱动功率。 (附图标记)(210)主驱动单元; (220)子驱动单元; (230)驱动控制信号发生单元; (240)代码生成单元;
    • 10. 发明公开
    • 반도체 집적회로의 드라이버 저항값 조정장치
    • 半导体集成电路驱动器的电阻值校准装置
    • KR1020080113970A
    • 2008-12-31
    • KR1020070063068
    • 2007-06-26
    • 에스케이하이닉스 주식회사
    • 박재범심영보
    • G11C8/04G11C5/14
    • H03K21/00H03K19/018507H03K19/018557H03K19/018585
    • An apparatus for calibrating resistance value of a driver of a semiconductor IC is provided to expand a tunable range of driver resistance value of a semiconductor IC. An apparatus for calibrating resistance value of a driver of a semiconductor IC(Integrated Circuit) comprises a controller(200), a counting device(300), and a comparing device(100). The controller controls a driver resistance value by a code signal, and generates a plurality of counting mode signals. The counting device counts the code signal of a counting unit varied in response to a plurality of counting mode signals according to a count increase/decease signal. The comparing device generates a count increase/decease signal by comparing a voltage converting the code signal with a reference voltage.
    • 提供了用于校准半导体IC的驱动器的电阻值的装置,以扩大半导体IC的驱动电阻值的可调范围。 用于校准半导体IC(集成电路)的驱动器的电阻值的装置包括控制器(200),计数装置(300)和比较装置(100)。 控制器通过代码信号控制驱动器电阻值,并产生多个计数模式信号。 计数装置对计数单元的代码信号进行计数,根据计数增加/去除信号,响应于多个计数模式信号而变化。 比较装置通过将转换代码信号的电压与参考电压进行比较来产生计数增加/减少信号。