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    • 2. 发明专利
    • Semiconductor laser
    • 半导体激光器
    • JPS59165484A
    • 1984-09-18
    • JP3986783
    • 1983-03-10
    • Nec Corp
    • ONABE KENTAROU
    • H01S5/00H01S5/32H01S5/323
    • H01S5/3235H01S5/3211H01S5/3215H01S5/3218H01S5/32391
    • PURPOSE:To enable a low temperature growth and to facilitate the control of a composition by respectively composing a substrate, the first clad layer, an active layer, and the second clad layer of InP, In1-XGaXP, In1-ZGaZAs and In1-X'GaX'P, and varying the composition ratio (x) of the first clad layer to substantially match the grating constants. CONSTITUTION:An n type or p type active layer 8 is formed of a 3-element mixed crystal In0.38Ga0.62As represented at a point B. The point B is equal in its band gap energy to the composition of a point A, but grating constant alphao is different, and alphao=5.80Angstrom . The point B does not belong to a mixed unstable region even at low temperature such as 500 deg.C. A 3-element mixed In0.84Ga0.16P represented at a point C having the same grating constant as the point B is used as a P type clad layer 9 grown next to the layer 8. A layer continuously varied in composition between InP and In0.84Ga0.16P (the point C) is used as the n type clad layer 7 adjacent to an InP substrate 1, and the gratings are substantially matched between the boundary to the substrate 1 and the boundary to the layer 8. The formation of such composition varying layer can be readily performed by a vapor phase growth method.
    • 目的:为了实现低温生长并且通过分别构成基底来促进组合物的控制,第一包层,有源层和InP,In1-XGaXP,In1-ZGaZAs和In1-X的第二包层 GaX'P,并且改变第一包层的组成比(x)以基本上匹配光栅常数。 构成:n点或p型有源层8由点B表示的3元素混晶In0.38Ga0.62A形成。点B的带隙能量与点A的组成相等,但是 光栅常数αo不同,αo= 5.80Ang。 即使在500℃的低温下,B点也不属于混合不稳定区域。 在具有与点B相同的光栅常数的点C处表示的3元素混合In0.84Ga0.16P用作在层8附近生长的P型覆盖层9.在InP和In0之间的组成上连续变化的层 0.84Ga0.16P(点C)用作与InP衬底1相邻的n型覆盖层7,并且光栅在与衬底1的边界和与层8的边界之间基本匹配。形成这样的 组成变化层可以容易地通过气相生长法进行。
    • 7. 发明专利
    • Semiconductor light-emitting device and manufacturing method of the same
    • 半导体发光器件及其制造方法
    • JP2012151291A
    • 2012-08-09
    • JP2011009047
    • 2011-01-19
    • Toshiba Corp株式会社東芝
    • TAKAGI SHIGEYUKIYABUHARA HIDEHIKO
    • H01S5/343H01S5/227
    • H01S5/34313B82Y20/00H01S5/2022H01S5/22H01S5/2206H01S5/222H01S5/2275H01S5/3213H01S5/3218H01S5/3402
    • PROBLEM TO BE SOLVED: To provide a high output semiconductor light-emitting device which emits light in a far-infrared region of a wavelength of more than 10 μm, and a manufacturing method of the same.SOLUTION: A semiconductor light-emitting device according to the embodiment is a semiconductor light-emitting device emitting emission light by energy relaxation of electrons in an intersubband of a plurality of quantum wells, and comprises: an active layer provided in a striped shape extending in a direction parallel with a radiation direction of the emission light, including the plurality of quantum wells and emitting the emission light of a wavelength of 10 μm and over; and a pair of clad layers provided along a long side of the stripe-shaped active layer and at least above and below the active layer, respectively, and each having a refraction index lower than that of the active layer. At least a part of the clad layers contains a material having a lattice constant different from that of the active layer, and represents light absorption in the wavelength of the emission light relatively lower than that of another part containing a material which is lattice matched with the active layer.
    • 解决的问题:提供一种在大于10μm的波长的远红外区域发光的高输出半导体发光装置及其制造方法。 解决方案:根据实施例的半导体发光器件是通过在多个量子阱的子带内的电子的能量弛豫来发射发射光的半导体发光器件,并且包括:有源层,设置在带状 形状在与发射光的辐射方向平行的方向上延伸,包括多个量子阱并发射波长为10μm以上的发射光; 以及沿着条形有源层的长边分别设置在活性层的至少上方和下方并且各自具有比有源层的折射率低的折射率的一对包层。 包覆层的至少一部分包含与有源层的晶格常数不同的晶格常数的材料,并且表示发射光的波长中的光吸收比包含与 活动层 版权所有(C)2012,JPO&INPIT
    • 10. 发明专利
    • Semiconductor device
    • 半导体器件
    • JP2006245373A
    • 2006-09-14
    • JP2005060186
    • 2005-03-04
    • Fujitsu LtdUniv Of Tokyo国立大学法人 東京大学富士通株式会社
    • UETAKE MASATOEBE KOJIKAWAGUCHI KENICHI
    • H01S5/343B82Y20/00
    • H01S5/341B82Y10/00B82Y20/00H01S5/3218H01S5/3404H01S5/3412H01S5/34373
    • PROBLEM TO BE SOLVED: To improve the crystallinity of a quantum dot layer, comprising a quantum dot, in a semiconductor device equipped with quantum dots.
      SOLUTION: The semiconductor device is provided with the quantum dot layer 8, having a barrier layer 3 consisting of a semiconductor crystal having a first lattice constant, a plurality of quantum dots 4 consisting of the semiconductor crystal, having a second lattice constant, and side barrier layers 5 formed so as to be contacted with respective side surfaces of the plurality of quantum dots and formed of the semiconductor crystal having a third lattice constant. In this case, the barrier layer, the quantum dots and the side barrier layers are constituted so that the difference between the value of the first lattice constant and the value of the second lattice constant becomes opposite in sign of the difference between the value of the first lattice constant and the value of the third lattice constant.
      COPYRIGHT: (C)2006,JPO&NCIPI
    • 要解决的问题:在配备有量子点的半导体器件中,提高包括量子点的量子点层的结晶度。 解决方案:半导体器件设置有量子点层8,其具有由具有第一晶格常数的半导体晶体构成的阻挡层3,由半导体晶体构成的多个量子点4,具有第二晶格常数 ,以及形成为与多个量子点的各个侧表面接触并由具有第三晶格常数的半导体晶体形成的侧势垒层5。 在这种情况下,阻挡层,量子点和侧面阻挡层被构成为使得第一晶格常数的值与第二晶格常数的值之间的差值变得相反, 第一晶格常数和第三晶格常数的值。 版权所有(C)2006,JPO&NCIPI