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41. 发明公开

EP0301084A1 APPARATUS AND METHOD FOR TESTING CONTACT INTERRUPTIONS OF CIRCUIT INTERCONNECTION DEVICES 失效
标题翻译：用于测试电路互连装置的接触中断的装置和方法
公开(公告)号：EP0301084A1
公开(公告)日：1989-02-01
申请号：EP88902312.0
申请日：1988-02-10
申请人： DIGITAL EQUIPMENT CORPORATION
发明人： WISSELL, Daniel
IPC分类号： G01R29 , G01R31
CPC分类号： G01R31/046 , G01R29/0273 , G01R31/026
摘要： Un appareil et un procédé identifient et mesurent des interruptions aléatoires de contacts dans un dispositif d'interconnexion de circuits. Un circuit comparateur (41), opérant à des fréquences élevées, identifie l'occurrence d'une interruption. Suite à l'interruption, le circuit comparateur amène un circuit compteur de haute fréquence (44-46) à compter des impulsions d'horloge. Le comptage du circuit compteur d'horloge est continuellement fourni à un circuit de mémoire à accès aléatoire (RAM 51-55), validé pour l'écriture à une adresse de la mémoire. A la fin de l'interruption, le circuit RAM (51-53) n'est plus validé pour l'écriture à l'adresse donnée, cette adresse étant modifiée (incrémentiellement) en préparation pour la prochaine interruption (38-39). Le circuit compteur est également remis à zéro en préparation pour la prochaine interruption. Le nombre d'unités comptées par une unité d'horloge ayant une fréquence connue indique la durée de l'interruption. On peut ainsi identifier, en utilisant une unité d'horloge opérant à 100 MHz, des interruptions d'une durée comprise entre 10 nanosecondes et 9,99 microsecondes. Compte tenu de la fréquence à laquelle le contrôle est effectué, il faut ajuster l'impédance d'entrée du circuit comparateur à l'impédance du dispositif d'interconnexion de circuits.
摘要翻译：一种装置和方法识别和测量电路互连装置中的触点的随机中断。以高频操作的比较器电路（41）识别中断的发生。在中断之后，比较器电路使高频计数器电路（44-46）对时钟脉冲进行计数。时钟计数器电路的计数被连续地提供给随机存取存储器电路（RAM 51-55），该随机存取存储器电路被验证用于写入存储器的地址。在中断结束时，RAM电路（51-53）不再用于写入给定地址，该地址被修改（递增）以准备下一个中断（38-39）。计数器电路也被复位以准备下一次中断。由具有已知频率的时钟单元计数的单元的数量指示中断的持续时间。因此可以使用工作在100MHz的时钟单元识别10纳秒和9.99微秒之间的中断。考虑到控制执行的频率，比较器电路的输入阻抗必须根据电路互连装置的阻抗进行调整。

43. 发明授权

EP2270983B1 Integrated smart power switch 有权
公开(公告)号：EP2270983B1
公开(公告)日：2018-07-25
申请号：EP10011543.5
申请日：2006-03-21
申请人： Raytheon Company
发明人： Jacobson, Boris S
IPC分类号： H03K17/082 , H03K17/18 , G01K7/42 , H01L23/00 , G01R31/04 , G01R31/26 , H01L23/34 , H03K17/08
CPC分类号： H03K17/0822 , G01K7/42 , G01R31/046 , G01R31/2621 , H01L23/34 , H01L2924/0002 , H03K17/18 , H03K2017/0806 , H01L2924/00
摘要： A device with a controller, controllable semiconductor device and sensor is described. The controller, In conjunction with the sensor, monitors the operation of the controllable semiconductor device and, in the existence of a certain condition, dynamically modifies at least one operating parameter of the controllable semiconductor device to ensure that the semiconductor operates in accordance with both a safe operating area condition and a predetermined reliability characteristic of the semiconductor device. The sensor acquires, and supplies to the controller, data relating to a second operating parameter of the semiconductor device. The controller uses data relating to a first, controllable, operating parameter of the semiconductor device to determine a first predicted value. It compares the data from the sensor with the first predicted value and uses the results of the comparison to modify the first operating parameter of the semiconductor whilst the semiconductor device is operating.

44. 发明公开

EP2491409A4 CAPACITIVE OPENS TESTING IN LOW SIGNAL ENVIRONMENTS 有权
标题翻译： TESTEN KAPAZITIVERÖFFNUNGEN在UMGEBUNGEN MIT SCHWACHEN SIGNALEN
公开(公告)号：EP2491409A4
公开(公告)日：2017-06-14
申请号：EP10843363
申请日：2010-12-21
申请人： TERADYNE INC
发明人： SUTO ANTHONY J
IPC分类号： G01R31/312 , G01R31/04
CPC分类号： G01R31/312 , G01R31/046

45. 发明公开

EP3171678A1 CIRCUIT BOARDS AND CIRCUIT BOARD ASSEMBLIES 审中-公开
标题翻译：电路板和电路板组件
公开(公告)号：EP3171678A1
公开(公告)日：2017-05-24
申请号：EP16198932.2
申请日：2016-11-15
申请人： Hamilton Sundstrand Corporation
发明人： LIN, Tran
IPC分类号： H05K1/02 , H05K3/34
CPC分类号： H05K1/0268 , G01R31/026 , G01R31/046 , H01L23/15 , H01L23/3675 , H01L23/49827 , H01L23/50 , H05K1/0206 , H05K1/0215 , H05K1/111 , H05K1/181 , H05K3/225 , H05K3/3421 , H05K2201/094 , H05K2201/10628 , H05K2201/10689 , H05K2203/16 , H05K2203/162 , Y02P70/613
摘要： A printed circuit board includes a body and a belly pad seated within with the body. The belly pad (108) is electrically separated into a first pad (110) and a second pad (112). The first pad and the second pad are arranged to be electrically connected to one another by an interconnect (106) electrically connecting the belly pad to a conductive plane (126) of an electrical component, thereby allowing continuity testing across an interface between the first pad and the interconnect.
摘要翻译：印刷电路板包括主体和坐在主体内的腹垫。腹垫（108）电分离成第一垫（110）和第二垫（112）。第一衬垫和第二衬垫布置成通过将腹部衬垫电连接到电部件的导电平面（126）的互连件（106）彼此电连接，从而允许穿过第一衬垫之间的界面的连续性测试和互连。

46. 发明公开

EP3059810A1 AN ELECTRONIC DEVICE INCLUDING CONNECTORS 有权
标题翻译： ELEKTRONISCHE VORRICHTUNG MIT VERBINDERN
公开(公告)号：EP3059810A1
公开(公告)日：2016-08-24
申请号：EP16156060.2
申请日：2016-02-17
申请人： Samsung Electronics Co., Ltd.
发明人： AN, Jungchul , KANG, Dohee , SIM, Hyun-Woo
IPC分类号： H01R13/641 , H01R12/71
CPC分类号： G01R31/043 , G01R19/15 , G01R31/04 , G01R31/046 , H01R12/716 , H01R13/641
摘要： An electronic device is provided. The device includes a first connector configured to couple with a second connector and including a plurality of contacts separated from each other, and a processor configured to detect an incomplete connection between the first connector and the second connector when an electric current does not flow through at least one of the contacts.
摘要翻译：提供电子设备。该装置包括第一连接器，其被配置为与第二连接器耦合并且包括彼此分离的多个触点;以及处理器，其配置成当电流不流过第一连接器和第二连接器时检测第一连接器与第二连接器之间的不完全连接至少有一个联系人。

47. 发明公开

EP2860538A1 Locating loose connections in an electrical circuit 审中-公开
标题翻译：奥芬丁von losen Verbindungen在einer elektrischen Schaltung
公开(公告)号：EP2860538A1
公开(公告)日：2015-04-15
申请号：EP14187356.2
申请日：2014-10-01
申请人： General Electric Company
发明人： Casteel, Jordan Brantley , Leonard, John Andrew , Pearson, William Robert , Rowny, Joseph Clark
IPC分类号： G01R31/327 , G01R31/40 , G01R31/42 , G01R31/02 , G01R19/165 , G01R31/04
CPC分类号： G01R31/04 , G01R31/026 , G01R31/046 , G01R31/3275 , G01R31/3277 , G01R31/343 , G01R31/40 , G01R31/42
摘要： An electrical system (100) includes an electrical circuit (110) having a plurality of current paths (P1,P2,P3) and a plurality of switches (SW1,SW2,SW3) for directing current to the plurality of current paths (P1,P2,P3). A sensor (CS1,CS2,CS3) senses a current or voltage in the electrical circuit. A processor connected to the sensor (CS1,CS2,CS3) receives sensor data corresponding to the current or voltage in the circuit. The processor is configured to determine a location of a loose connection in the electrical circuit (110) based on the current or voltage data and a switching sequence of the plurality of switches. (SW1,SW2,SW3).
摘要翻译：电气系统（100）包括具有多个电流路径（P1，P2，P3）和多个开关（SW1，SW2，SW3）的电路（110），用于将电流引导到多个电流路径（P1， P2，P3）。传感器（CS1，CS2，CS3）感测电路中的电流或电压。连接到传感器（CS1，CS2，CS3）的处理器接收与电路中的电流或电压对应的传感器数据。处理器被配置为基于电流或电压数据以及多个开关的切换顺序来确定电路（110）中松动连接的位置。（SW1，SW2，SW3）。

48. 发明公开

EP2817642A1 METHOD AND APPARATUS TO DETECT A BROKEN WIRE CONDITION IN AN INTEGRATED CIRCUIT 有权转让
标题翻译：方法和装置断线于一体的综合短路检测
公开(公告)号：EP2817642A1
公开(公告)日：2014-12-31
申请号：EP13707796.2
申请日：2013-02-27
申请人： Allegro Microsystems, LLC
发明人： PIRCHIO, Franco, Noel, Martin , VOISINE, Cory , ROMERO, Hernan, D. , MONREAL, Gerardo
IPC分类号： G01R19/165 , G01R31/02 , G01R31/04 , G01R31/28 , H03K19/003
CPC分类号： G01R31/026 , G01R31/046
摘要： An integrated circuit includes circuitry to sense the occurrence of a break in a ground connection and/or supply connection and to indicate same to an exterior environment. In at least one implementation, the break may be indicated by providing a signal on an output terminal of the device that is not associated with a normal output of the device.

49. 发明公开

EP2220680A1 SEMICONDUCTOR DEVICE AND WAFER WITH A TEST STRUCTURE AND METHOD FOR ASSESSING ADHESION OF UNDER-BUMP METALLIZATION 审中-公开
标题翻译：半导体器件和晶圆随着对凸点下金属测试粘附性的测试结构和方法
公开(公告)号：EP2220680A1
公开(公告)日：2010-08-25
申请号：EP08856728.4
申请日：2008-12-01
申请人： NXP B.V.
发明人： ROUSSEVILLE, Lucie , BARDY, Serge , LE DUC, Philippe , DESMORTREUX, David
IPC分类号： H01L23/544 , G01R31/04
CPC分类号： G01R31/046 , G01R31/2884 , H01L22/34 , H01L2924/0002 , H01L2924/00
摘要： Semiconductor device with a patterned pad metal layer and a patterned under- bump metallization layer being mutually electrically connected in a common contact area 22. The semiconductor device includes a first test structure 11 for determining a contact resistance between the patterned metallization layer and the patterned pad metal layer in the common contact areas 22. The first test structure includes a pad metal layer portion 24 and a metallization layer portion 18 being in electrical communication with the pad metal layer portion 24 through the common contact area 22. The first test structure 11 further includes connection areas 14, 16 that are electrically connected with each other substantially via the common contact area 22. Upon application of a current between the connection areas 14, 16 a voltage drop occurs that is representative for a voltage drop over the common contact area 22.

50. 发明公开

EP1946085A1 CAMERA BASED PIN GRID ARRAY (PGA) INSPECTION SYSTEM WITH PIN BASE MASK AND LOW ANGLE LIGHTING 审中-公开
标题翻译： PGA（插针网格阵列）的检查系统上的孔BASE MASK和宽LIGHTING摄像机座
公开(公告)号：EP1946085A1
公开(公告)日：2008-07-23
申请号：EP06816634.7
申请日：2006-10-11
申请人： Delta Design, Inc.
发明人： DING, Kexiang, Ken
IPC分类号： G01N21/956 , H01L21/66
CPC分类号： G01N21/95684 , G01N2021/8822 , G01R31/046 , G01R31/2896
摘要： An inspection system (1), for inspecting pin grid arrays (15) on integrated circuit devices (10) includes a pin base mask (30) configured to receive a device having a pin grid array (15) . A dark-field, low-angle lighting system (40) emits light onto the pin grid array (15) . The pin base mask (30) and low-angle lighting system (40) provide for a clear and definitive image of the pin grid array (15) . A camera (50) captures the image of the pin grid array (15). A processor (90) , coupled to the camera (50) , analyzes the images captured by the camera (50) . Based on the captured image, the processor (90) determines whether any pins on the pin grid array (15) are bent (13, 14) or missing, or whether there are extra pins present.

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