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    • 3. 发明申请
    • BORON IMPLANTING USING A CO-GAS
    • 使用CO气体硼的植入
    • WO2017176255A1
    • 2017-10-12
    • PCT/US2016/025996
    • 2016-04-05
    • VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    • KOO, Bon-WoongBHOSLE, Vikram M.FRONTIERO, John A.
    • H01L21/265H01L21/205
    • H01L21/2236H01J37/32412H01J37/3244
    • An apparatus and methods of improving the ion beam quality of a halogen-based source gas are disclosed. Unexpectedly, the introduction of a noble gas, such as argon or neon, to an ion source chamber may increase the percentage of desirable ion species, while decreasing the amount of contaminants and halogen-containing ions. This is especially beneficial in non-mass analyzed implanters, where all ions are implanted into the workpiece. In one embodiment, a first source gas, comprising a processing species and a halogen is introduced into a ion source chamber, a second source gas comprising a hydride, and a third source gas comprising a noble gas are also introduced. The combination of these three source gases produces an ion beam having a higher percentage of pure processing species ions than would occur if the third source gas were not used.
    • 公开了一种改善卤素源气体的离子束质量的设备和方法。 出乎意料的是,将惰性气体(例如氩气或氖气)引入离子源室可增加所需离子种类的百分比,同时减少污染物和含卤离子的量。 这在非质量分析的注入机中是非常有用的,所有离子都注入到工件中。 在一个实施方案中,将包含处理物质和卤素的第一源气体引入离子源室中,引入包含氢化物的第二源气体和包含惰性气体的第三源气体。 这三种源气体的组合产生的离子束具有比不使用第三种源气体时发生的纯处理物种离子的百分比更高的离子束。
    • 8. 发明申请
    • METHOD AND SYSTEM FOR PLASMA-ASSISTED ION BEAM PROCESSING
    • 用于等离子体离子束处理的方法和系统
    • WO2014130510A1
    • 2014-08-28
    • PCT/US2014/017053
    • 2014-02-19
    • VARIAN SEMICONDUCTOR EQUIPMENT ASSOCIATES, INC.
    • RADOVANOV, Svetlana, B.GODET, LudovicKOO, Bon-Woong
    • H01J37/32C23C16/452
    • H05H3/00C23C16/045C23C16/452C23C16/507H01J37/32146H01J37/32357H01J37/32412H01J37/32706
    • A system for processing a substrate may include a first chamber operative to define a first plasma and a second chamber adjacent the first chamber, where the second chamber is electrically isolated from the first chamber, and configured to define a second plasma. The system may also include an extraction assembly disposed between the first chamber and second chamber to provide at least plasma isolation between the first plasma and the second plasma, a substrate assembly configured to support the substrate in the second chamber; and a biasing system configured to supply a plurality of first voltage pulses to direct first ions from the first plasma through the second chamber towards the substrate during one time period, and to supply a plurality of second voltage pulses to generate the second plasma and to attract second ions from the second plasma during another time period.
    • 用于处理衬底的系统可以包括可操作地限定第一等离子体的第一室和邻近第一室的第二室,其中第二室与第一室电隔离,并且被配置为限定第二等离子体。 系统还可以包括设置在第一室和第二室之间的提取组件,以在第一等离子体和第二等离子体之间提供至少等离子体隔离;衬底组件,被配置为将衬底支撑在第二室中; 以及偏置系统,被配置为提供多个第一电压脉冲以在一个时间段期间将来自所述第一等离子体的第一离子通过所述第二室朝向所述衬底引导,并且提供多个第二电压脉冲以产生所述第二等离子体并且吸引 在另一时间段期间来自第二等离子体的第二离子。