会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 5. 发明申请
    • DEFECT-TOLERANT AND FAULT-TOLERANT CIRCUIT INTERCONNECTIONS
    • 容错和容错电路互连
    • WO2005026957A3
    • 2005-06-23
    • PCT/US2004029333
    • 2004-09-08
    • HEWLETT PACKARD DEVELOPMENT COKUEKES PHILIP JWILLIAMS R STANLEYSEROUSSI GADIEL
    • KUEKES PHILIP JWILLIAMS R STANLEYSEROUSSI GADIEL
    • G06F11/10G11C8/10G11C8/20G11C13/00
    • G06F11/1016B82Y10/00G11C8/10G11C13/0014G11C2213/77G11C2213/81
    • Methods for increasing defect tolerance and fault tolerance in systems containing interconnected components, in which a signal level is classified as belonging to one of a plurality of different, distinguishable classes based on one or more thresholds separating the signal-level classes, and defect-and-fault tolerant systems embodying the methods. An electronic-device embodiment including an array of nanowire crossbars, the nanoscale memory elements within the nanowire crossbars addressed through conventional microelectronic address lines, and a method embodiment for providing fault-tolerant interconnection interfaces with electrically distinguishable signal levels are described. In the described embodiment, in order to interconnect microelectronic address lines with the nanowire crossbars within the electronic memory, an address encoding technique is employed to generate a number of redundant, parity-check address lines to supplement a minimally required set of address signal lines needed to access the nanoscale memory elements.
    • 用于增加包含互连组件的系统中的缺陷容限和容错的方法,其中信号电平基于分离信号电平类别的一个或多个阈值被分类为属于多个不同的可区分类别中的一个,以及缺陷 体现这些方法的容错系统。 包括纳米线交叉杆阵列的电子设备实施例中,纳米线交叉杆内的纳米级的存储元件通过传统的微电子地址线寻址,以及用于提供容错互连接口与电可区别的信号电平的方法实施例进行说明。 在所述实施例中,为了在电子存储器内的互连与所述纳米线交叉杆微电子地址线,一个地址编码技术被利用来产生若干多余的,奇偶校验地址线来补充最低限度所需的一组的地址信号线需要 访问纳米级存储元件。
    • 8. 发明申请
    • DEFECT-AND-FAILURE-TOLERANT DEMULTIPLEXER USING SERIES REPLICATION AND ERROR-CONTROL ENCODING
    • 使用系列复制和错误控制编码的缺陷和失败的解复用器
    • WO2008008419A3
    • 2008-09-25
    • PCT/US2007015861
    • 2007-07-11
    • HEWLETT PACKARD DEVELOPMENT COROBINETT WARRENKUEKES PHILIP JWILLIAMS STANLEY R
    • ROBINETT WARRENKUEKES PHILIP JWILLIAMS STANLEY R
    • G06F11/10H03K19/177
    • H03K19/007G06F11/1076H03K19/00315
    • One embodiment of the present invention is a method for constructing defect-and-failure-tolerant demultiplexers (figures 14 an 16). This method is applicable to nanoscale, microscal, or larger-scale demultiplexer circuits,. Demultiplexer circuits can be viewed as a set of AND gates (figures 9A-B), each including a reversibly switchable interconnection between a number of address lines (910-912 and 920-922), or address-line-derived signal lines, and an output signal line (914 and 924). Each reversibly switchable interconnection includes one ot more reversibly switchable elements (906-908 and 916-918). In certain demultiplexer embodiments, NMOS (102) and/or PMOS transistors (206) are employed as reversibly switchable elements. In the method that representd one embodiment of the present invention, two or more serially connected transistors (410, 412, and 411, 413; 1502) are employed in each reversibly switchable interconnection, so that short defects in up to one less then the number of serially interconnected transistors does not lead to failure of the reversibly switchable interconnection. In addition, error-control-encoding techniques are used to introduce additional address-line-derived signal lines (1602, 1604) and additional switchable interconnections (1610) so that the demultiplexer may function even when a number of individual, switchable interconnections are open-defective.
    • 本发明的一个实施例是用于构造缺陷和容错解复用器的方法(图14和16)。 该方法适用于纳米级,微型或大规模解复用器电路。 解复用器电路可以被看作是一组与门(图9A-B),每一个包括多个地址线(910-912和920-922)之间的可逆切换互连或地址线导出的信号线,以及 输出信号线(914和924)。 每个可逆切换互连包括一个或多个可逆切换元件(906-908和916-918)。 在某些解复用器实施例中,NMOS(102)和/或PMOS晶体管(206)被用作可逆切换元件。 在代表本发明的一个实施例的方法中,在每个可逆切换的互连中使用两个或更多个串联的晶体管(410,412和411,413; 1502),使得短到少于1个 串联互连的晶体管不会导致可逆切换互连的故障。 另外,误差控制编码技术被用于引入额外的地址线导出的信号线(1602,1604)和附加的可切换互连(1610),使得即使当多个单独的可切换互连打开时,解复用器也可以起作用 缺陷型。
    • 9. 发明申请
    • CONTROLLED INPUT MOLECULAR CROSSBAR LATCH
    • 控制输入​​分子横杆锁
    • WO2005006342A3
    • 2005-05-06
    • PCT/US2004002644
    • 2004-01-27
    • HEWLETT PACKARD DEVELOPMENT COKUEKES PHILIP J
    • KUEKES PHILIP J
    • G11C13/02H01L51/20
    • G11C13/0014B82Y10/00G11C13/02G11C2213/77G11C2213/81Y10S977/94
    • A molecular crossbar latch is provided, comprising two control wires and a signal wire that crosses the two control wires to form a junction with each control wire. The latch further includes a control mechanism for controllably electrically connecting and disconnecting signal input to the latch, thus allowing the input to change its logic value after the signal is latched while the signal wire retains its latched value. Each junction forms a switch, the junction having a functional dimension in nanometers. The crossbar latch permits latching a logic value on the signal wire. Further, methods are provided for latching logic values in a logic array, for inventing a logic value , and for restoring a voltage value of a signal in a nano-scale wire.
    • 提供了一种分子横杆闩锁,其包括两根控制线和一根信号线,信号线穿过两根控制线以形成与每根控制线的连接点。 锁存器还包括控制机构,用于可控地电连接和断开输入到锁存器的信号,从而允许输入端在信号被锁存之后改变其逻辑值,同时信号线保持其锁存值。 每个结形成一个开关,该结具有纳米功能尺寸。 交叉开关锁存器允许锁定信号线上的逻辑值。 此外,提供了用于将逻辑值锁存在逻辑阵列中,用于发明逻辑值以及用于恢复纳米级导线中的信号的电压值的方法。
    • 10. 发明申请
    • FPGA ARCHITECTURE AT CONVENTIONAL AND SUBMICRON SCALES
    • 常规和亚微米尺寸的FPGA架构
    • WO2007089914A2
    • 2007-08-09
    • PCT/US2007002805
    • 2007-01-30
    • HEWLETT PACKARD DEVELOPMENT COSNIDER GREGORY SKUEKES PHILIP J
    • SNIDER GREGORY SKUEKES PHILIP J
    • H03K19/177G11C13/02
    • H03K19/17748B82Y10/00B82Y30/00G11C8/10G11C13/0007G11C13/0014G11C2213/15G11C2213/34G11C2213/51G11C2213/77G11C2213/81H03K19/17728H03K19/1778
    • Reconfigurable logic devices (500) and methods of programming the devices are disclosed. The logic device includes a look-up table (600, 600') (LUT) and at least one storage element (570) configured for sampling LUT output signals (520). The LUT (600, 600') comprises a plurality of input signals (510), an array of programmable impedance devices (110) operably coupled to the input signals (510), and the LUT output signals (520). Each programmable impedance devices (110) in the array includes a first electrode (120) operably coupled to one of the input signals (520), a second electrode (130) disposed to form a junction (150) wherein the second electrode (130) at least partially overlaps the first electrode (120), and a programmable material (140) disposed between the first electrode (120) and the second electrode (130). The programmable material (140) operably couples the first electrode (120) and second electrode (130) such that each programmable impedance device (110) exhibits a non-volatile programmable impedance. The array may be configured as a one-dimensional array (700, 700') or two-dimensional array (610, 610').
    • 公开了可重新配置的逻辑设备(500)和对设备进行编程的方法。 逻辑器件包括被配置为对LUT输出信号(520)进行采样的查找表(600,600')(LUT)和至少一个存储元件(570)。 LUT(600,600')包括多个输入信号(510),可操作地耦合到输入信号(510)的可编程阻抗设备(110)阵列以及LUT输出信号(520)。 阵列中的每个可编程阻抗器件(110)包括可操作地耦合到输入信号(520)中的一个的第一电极(120),布置为形成结(150)的第二电极(130),其中第二电极 至少部分地与第一电极(120)重叠,以及设置在第一电极(120)和第二电极(130)之间的可编程材料(140)。 可编程材料(140)可操作地耦合第一电极(120)和第二电极(130),使得每个可编程阻抗设备(110)呈现非易失性可编程阻抗。 该阵列可以被配置为一维阵列(700,700')或二维阵列(610,610')。