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    • 3. 发明申请
    • APPARATUS AND METHOD TO TEST NON-VOLATILE MEMORY
    • 测试非易失性存储器的装置和方法
    • WO2008124094A1
    • 2008-10-16
    • PCT/US2008/004446
    • 2008-04-04
    • ATMEL CORPORATIONSURICO, StefanoSIVERO, StefanoBARTOLI, SimonePASSERINI, Marco
    • SURICO, StefanoSIVERO, StefanoBARTOLI, SimonePASSERINI, Marco
    • G06F11/00
    • G11C16/10
    • Some embodiments disclosed comprise apparatus and methods relating to a nonvolatile memory comprising an input output buffer; a latch circuit coupled to the input/output buffers; a memory array having nonvolatile memory cells coupled to an input/output buffer; a command user interface coupled to the input/output buffer and the latch circuit; a microcontroller coupled to the command user interface; a read-only memory storing instructions to be executed by the microcontroller; and a switch-instruction circuitry coupled to the latch circuit, the read-only memory and the digital control circuitry to selectively provide instructions to the microcontroller from the read-only memory and to selectively provide substitute instructions under control of the command user interface, the substitute instructions received at the input/output buffer from an external source. Other embodiments and methods are disclosed.
    • 公开的一些实施例包括涉及包括输入输出缓冲器的非易失性存储器的装置和方法; 耦合到输入/输出缓冲器的锁存电路; 具有耦合到输入/输出缓冲器的非易失性存储单元的存储器阵列; 耦合到输入/输出缓冲器和锁存电路的命令用户界面; 耦合到命令用户界面的微控制器; 存储由微控制器执行的指令的只读存储器; 以及耦合到所述锁存电路,所述只读存储器和所述数字控制电路的开关指令电路,用于从所述只读存储器选择性地向所述微控制器提供指令,并且在所述命令用户界面的控制下选择性地提供替代指令, 从外部源代替在输入/输出缓冲器处接收的指令。 公开了其他实施例和方法。
    • 4. 发明申请
    • METHOD AND SYSTEM FOR MANAGING ADDRESS BITS DURING BUFFERED PROGRAM OPERATIONS IN A MEMORY DEVICE
    • 在存储器件中缓存程序运行期间管理地址位的方法和系统
    • WO2006044190A2
    • 2006-04-27
    • PCT/US2005/035658
    • 2005-10-04
    • ATMEL CORPORATIONBARTOLI, SimoneSURICO, StefanoMANFRE, DavideFERRARIO, Donato
    • BARTOLI, SimoneSURICO, StefanoMANFRE, DavideFERRARIO, Donato
    • G06F12/10
    • G06F12/04G11C16/10G11C2216/14
    • A method and system for managing a buffered program operation for plurality of words is described. In one aspect, the method and system include providing an internal buffer including a plurality of locations and at least one bit location for the plurality of locations. Each of the words is stored in a location of the plurality of locations. The words are associated with internal address bits for the locations. At least one of the internal address bits is at least one group address bit that corresponds to all of the words. A remaining portion of the internal address bits is associated at least one of the words. The at least one bit location stores the at least one group address bit for the words. Thus, in one aspect, the method and system include storing each of the words one of the buffer locations. The method and system also include associating the at least one group address bit with the buffer location for each of the words.
    • 描述用于管理用于多个单词的缓冲程序操作的方法和系统。 一方面,该方法和系统包括提供包括多个位置的多个位置和至少一个位置的内部缓冲器。 每个词都存储在多个位置的位置。 这些单词与位置的内部地址位相关联。 至少一个内部地址位是与所有字对应的至少一个组地址位。 内部地址位的剩余部分与至少一个字相关联。 所述至少一个位位置存储所述字的至少一个组地址位。 因此,在一个方面,该方法和系统包括存储缓冲器位置之一中的每一个字。 该方法和系统还包括将至少一个组地址位与每个字的缓冲器位置相关联。
    • 5. 发明申请
    • A NEW IMPLEMENTATION OF COLUMN REDUNDANCY FOR A FLASH MEMORY WITH A HIGH WRITE PARALLELISM
    • 具有高写并发性的闪存存储器的冗余冗余的新实现
    • WO2008076553A2
    • 2008-06-26
    • PCT/US2007/084460
    • 2007-11-12
    • ATMEL CORPORATIONBARTOLI, SimoneSURICO, StefanoSACCO, AndreaMOSTOLA, Maria
    • BARTOLI, SimoneSURICO, StefanoSACCO, AndreaMOSTOLA, Maria
    • G11C16/06
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array (300) has r columns of redundant memory cells (306), r redundant senses (312), and a redundant column decoder (308). Redundant address registers (332) store addresses of defective regular memory cells. Redundant latches (338) are provided in n groups of r latches. Redundancy comparison logic (330) compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal (333) to disable the regular senses (310) for one of the n groups of m columns, an ENABLE_LATCH signal (334) to one of the n groups of m columns to disable corresponding regular senses, and one of r REDO signals (336) to a respective one of the r redundant latches (338) in one of the n groups that is disabled. The selected one of the redundant latches (338) activates one of the r redundant senses (312) to access a redundant column.
    • 冗余存储器阵列(300)具有r列的冗余存储器单元(306),r冗余感测(312)和冗余列解码器(308)。 冗余地址寄存器(332)存储有缺陷的常规存储单元的地址。 冗余锁存器(338)设置在n组r个锁存器中。 冗余比较逻辑(330)将缺陷规则存储器单元的地址与外部输入地址进行比较。 如果比较是真实的,则提供的是:禁用n列m列中的一个的常规感测(310)的DISABLE_LOAD信号(333),到m列的n组之一的ENABLE_LATCH信号(334) 禁用相应的常规感测,并且将r个REDO信号中的一个(336)禁止到被禁用的n个组中的一个中的r个冗余锁存器(338)中的相应一个。 所选择的冗余锁存器(338)中的一个激活r个冗余感测(312)中的一个以访问冗余列。
    • 8. 发明申请
    • NAN FLASH MEMORY WITH HIERARCHICAL BITLINE AND WORDLINE ARCHITECTURE
    • 具有分层位线和WORDLINE架构的NAN FLASH存储器
    • WO2008115570A1
    • 2008-09-25
    • PCT/US2008/003716
    • 2008-03-20
    • ATMEL CORPORATIONFRULIO, MassimilianoBEDARIDA, LorenzoBARTOLI, SimoneTASSAN CASER, Fabio
    • FRULIO, MassimilianoBEDARIDA, LorenzoBARTOLI, SimoneTASSAN CASER, Fabio
    • G11C16/04G11C16/08
    • G11C16/08G11C5/025G11C5/063
    • Some embodiments of the apparatus relate to NAND-like memory arrays employing high- density NOR-like memory devices. A flash memory integrated circuit includes a plurality of flash memory arrays. A global wordline driver is associated with each array, each global wordline driver coupled to a plurality of select lines. A plurality of sense amplifiers are individually coupled to a plurality of bitlines. A plurality of sub-arrays in each array each include a plurality of NAND flash memory cells coupled to local wordlines and local bitlines. A local wordline driver is associated with each sub-array and coupled to the plurality of select lines and configured to drive ones of the local wordlines in its sub-array associated with selected ones of the plurality of NAND flash memory cells in its sub-array. A local bitline driver is coupled between selected ones of the local bitlines in each sub-array and selected ones of the plurality of bitlines.
    • 该装置的一些实施例涉及采用高密度NOR样存储器件的类NAND存储器阵列。 闪存集成电路包括多个闪存阵列。 全局字线驱动器与每个阵列相关联,每个全局字线驱动器耦合到多个选择线。 多个读出放大器分别耦合到多个位线。 每个阵列中的多个子阵列各自包括耦合到本地字线和本地位线的多个NAND快闪存储器单元。 本地字线驱动器与每个子阵列相关联并且耦合到多个选择线并且被配置为驱动与其子阵列中的多个NAND快闪存储器单元中的选定的一个相关联的其子阵列中的本地字线中的一个 。 局部位线驱动器耦合在每个子阵列中的本地位线的选定的位线和多个位线中的选定的位线之间。