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    • 1. 发明授权
    • Method for manufacturing carbon nanocoils
    • 制造碳纳米线的方法
    • US06558645B2
    • 2003-05-06
    • US09901991
    • 2001-07-10
    • Yoshikazu NakayamaMei ZhangAkio Harada
    • Yoshikazu NakayamaMei ZhangAkio Harada
    • D01F912
    • B01J23/835B01J23/825B82Y30/00D01F9/1275Y10S977/843
    • A method for manufacturing carbon nanocoils which are grown by winding carbon atoms in a helical configuration and which have an external diameter of 1000 nm or less, the method comprising the steps of: placing an indium-tin-iron type catalyst inside a reactor, heating an area around the catalyst to a temperature equal to or greater than temperature at which hydrocarbon used as a raw material is broken down by an action of the catalyst, causing hydrocarbon gas to flow through the reactor so that the gas contacts the catalyst, and allowing carbon nanocoils to grow on a surface of the catalyst while the hydrocarbon is broken down in the vicinity of the catalyst. The indium-tin-iron type catalyst may be obtained by: a mixed catalyst of indium oxide and tin oxide, and a thin film of iron which is formed on a surface of this mixed catalyst.
    • 一种制造碳纳米薄膜的方法,其通过将螺旋形状的碳原子缠绕并且具有1000nm或更小的外径而生长,所述方法包括以下步骤:将铟 - 锡 - 铁型催化剂置于反应器内,加热 催化剂周围的区域达到等于或大于用作原料的烃的温度的温度,通过催化剂的作用被分解,导致烃气体流过反应器,使得气体与催化剂接触,并允许 碳纳米薄膜在催化剂表面生长,同时烃在催化剂附近分解。 铟 - 锡 - 铁型催化剂可以通过以下方法获得:氧化铟和氧化锡的混合催化剂和形成在该混合催化剂的表面上的铁的薄膜。
    • 4. 发明授权
    • Coated nanotube surface signal probe
    • 涂层纳米管表面信号探针
    • US07064341B2
    • 2006-06-20
    • US10793531
    • 2004-03-04
    • Yoshikazu NakayamaAkio HaradaSeiji Akita
    • Yoshikazu NakayamaAkio HaradaSeiji Akita
    • G21G5/00
    • G01Q60/16G01Q60/38G01Q60/54G01Q70/12Y10S977/869Y10S977/873Y10S977/876
    • The coated nanotube surface signal probe constructed from a nanotube, a holder which holds the nanotube, a coating film fastening a base end portion of the nanotube to a surface of the holder by way of adhering the base end portion on the surface of holder in a range of a base end portion length with an electric contact state and covering a specified region including the base end portion with the coating film maintaining the electric contact state between the nanotube and the holder, a tip end portion of the nanotube being caused to protrude from the holder; and the tip end portion is used as a probe needle so as to scan surface signals. The coated nanotube surface signal probe can be used as a probe in AFM (Atomic Force Microscope), STM (Scanning Tunneling Microscope) other SPM (Scanning Probe Microscope).
    • 由纳米管构成的涂覆的纳米管表面信号探针,保持纳米管的保持器,通过将基座端部粘附在保持器的表面上的涂膜将纳米管的基端部固定在保持器的表面上 具有电接触状态的基端部长度的范围,并且覆盖包括基端部的规定区域,所述涂膜保持纳米管和保持器之间的电接触状态,使纳米管的前端部从 持有人 并且使用尖端部作为探针,以扫描表面信号。 涂覆的纳米管表面信号探针可用作AFM(原子力显微镜),STM(扫描隧道显微镜)其他SPM(扫描探针显微镜)中的探针。
    • 7. 发明授权
    • Nanotube probe and a method for manufacturing the same
    • 纳米管探针及其制造方法
    • US07511270B2
    • 2009-03-31
    • US10570525
    • 2004-09-08
    • Yoshikazu NakayamaTakashi OkawaShigenobu YamanakaAkio Harada
    • Yoshikazu NakayamaTakashi OkawaShigenobu YamanakaAkio Harada
    • G21K7/00
    • G01Q70/12
    • The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.
    • 本发明实现了具有高耐久性的纳米管探针,其可以在短时间内制造,而较少的杂质附着在支撑纳米管的支架上。 根据本发明的纳米管探针通过至少两个部分涂膜12a和12b将纳米管8紧固在悬臂的突出部分4上而构成。 可以在这两个部分涂膜之间的中间区域中形成一个或多个附加的部分涂膜。 每个部分涂膜通过在纳米管8与悬臂的突出部分4接触的位置上照射电子束10而形成。 将部分涂膜分离成不重叠。 通过最小化部分涂膜的尺寸以及通过使光束直径变窄,可以进一步缩短涂布时间。 随着光束直径变窄,可以控制杂质沉积过多。
    • 9. 发明申请
    • Nanotube probe and method for manufacturing the same
    • 纳米管探头及其制造方法
    • US20070018098A1
    • 2007-01-25
    • US10570525
    • 2004-09-08
    • Yoshikazu NakayamaTakashi OkawaShigenobu YamanakaAkio Harada
    • Yoshikazu NakayamaTakashi OkawaShigenobu YamanakaAkio Harada
    • G21K7/00
    • G01Q70/12
    • The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.
    • 本发明实现了具有高耐久性的纳米管探针,其可以在短时间内制造,而较少的杂质附着在支撑纳米管的支架上。 根据本发明的纳米管探针通过至少两个部分涂膜12a和12b将纳米管8紧固在悬臂的突出部分4上而构成。 可以在这两个部分涂膜之间的中间区域中形成一个或多个附加的部分涂膜。 每个部分涂膜通过在纳米管8与悬臂的突出部分4接触的位置上照射电子束10而形成。 将部分涂膜分离成不重叠。 通过最小化部分涂膜的尺寸以及通过使光束直径变窄,可以进一步缩短涂布时间。 随着光束直径变窄,可以控制杂质沉积过多。