基本信息:
- 专利标题： Probe for a scanning microscope
- 专利标题（中）：探针扫描显微镜
- 申请号：US11145869 申请日：2005-06-06
- 公开(公告)号：US20060150720A1 公开(公告)日：2006-07-13
- 发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
- 申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
- 专利权人： Yoshikazu Nakayama,Daiken Chemical Co., Ltd.,SII NanoTechnology Inc.
- 当前专利权人： Yoshikazu Nakayama,Daiken Chemical Co., Ltd.,SII NanoTechnology Inc.
- 优先权： JP2004-171794 20040609
- 主分类号： G01B5/28
- IPC分类号： G01B5/28
摘要：
A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要（中）：
扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到 从而允许尖端用作检测信号的探针针端。 形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。 由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。 这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。
公开/授权文献:
- US07398678B2 Probe for a scanning microscope 公开/授权日：2008-07-15
IPC结构图谱:
| G | 物理 |
| --G01 | 测量；测试 |
| ----G01B | 长度、厚度或类似线性尺寸的计量；角度的计量；面积的计量；不规则的表面或轮廓的计量 |
| ------G01B5/00 | 以采用机械方法为特征的计量设备 |
| --------G01B5/28 | .用于计量表面的粗糙度或不规则性 |