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1. 发明授权

US08490211B1 Methods for referencing related magnetic head microscopy scans to reduce processing requirements for high resolution imaging 失效
标题翻译：参考相关磁头显微镜扫描的方法，以减少高分辨率成像的加工要求
公开(公告)号：US08490211B1
公开(公告)日：2013-07-16
申请号：US13537010
申请日：2012-06-28
申请人： Sean P. Leary
发明人： Sean P. Leary
IPC分类号： G01Q60/56
CPC分类号： G01Q60/56 , G01Q30/06 , G11B5/3166
摘要： Methods for referencing related magnetic head microscopy scans to reduce processing requirements for high resolution imaging are provided. One such method includes performing a low resolution pole tip recession scan of a pole tip area of a magnetic head, performing a high resolution writer pole recession scan of a writer pole area of the magnetic head, preparing a portion of the low resolution scan for alignment, performing a rough leveling of the high resolution scan, aligning the portion of the low resolution scan and the high resolution scan using pattern recognition and a database of features, subtracting the high resolution scan from the aligned portion of the low resolution scan, and leveling the high resolution scan based on a result of the subtraction.
摘要翻译：提供了参考相关磁头显微镜扫描以减少高分辨率成像的处理要求的方法。一种这样的方法包括执行磁头的磁极尖端区域的低分辨率极尖衰退扫描，执行磁头的写入器极区域的高分辨率写入器极衰退扫描，准备低分辨率扫描的一部分用于对准，执行高分辨率扫描的粗略调平，使用图案识别对准低分辨率扫描的一部分和高分辨率扫描，以及特征数据库，从低分辨率扫描的对准部分减去高分辨率扫描，以及调平基于减法的结果的高分辨率扫描。

2. 发明授权

US07495215B2 Probe for a scanning magnetic force microscope, method for producing the same, and method for forming ferromagnetic alloy film on carbon nanotubes 有权
标题翻译：扫描磁力显微镜的探针及其制造方法以及在碳纳米管上形成铁磁性合金膜的方法
公开(公告)号：US07495215B2
公开(公告)日：2009-02-24
申请号：US11322180
申请日：2005-12-28
申请人： Hiroyuki Akinaga , Yasuyuki Semba , Hiroshi Yokoyama , Masatoshi Yasutake , Hiromi Kuramochi
发明人： Hiroyuki Akinaga , Yasuyuki Semba , Hiroshi Yokoyama , Masatoshi Yasutake , Hiromi Kuramochi
IPC分类号： G01N23/00
CPC分类号： G01Q60/56 , G01Q70/12 , Y10S977/84 , Y10S977/842 , Y10T428/30
摘要： The present invention provides a probe for a scanning magnetic force microscope having a resolution sufficient to allow observation of a magnetic storage medium with 1200 kFCI or higher recording densities, a method for producing the probe, and a method for forming a ferromagnetic alloy film on a carbon nanotube. In the context of the present invention, the probe for a scanning magnetic force microscope comprises a carbon nanotube whose surface is at least in part coated with a ferromagnetic alloy film consisting of any one of a Co—Fe alloy and a Co—Ni alloy, wherein the arithmetic mean roughness (Ra 10 μm) of the surface of the ferromagnetic alloy film is controlled to 1.15 nm or less. A method for producing such probes for a scanning magnetic force microscope and a method for forming such a ferromagnetic alloy film on a carbon nanotube, so as to achieve such mean surface roughness by controlling the growth rate of the ferromagnetic alloy film within the range of 1.0 to 2.5 nm/min, is also disclosed.
摘要翻译：本发明提供了一种扫描磁力显微镜的探针，其具有足以允许观察具有1200kFCI或更高记录密度的磁存储介质的分辨率的扫描磁力显微镜，该探针的制造方法以及用于形成铁磁性合金膜的方法碳纳米管。在本发明的上下文中，用于扫描磁力显微镜的探针包括其表面至少部分地涂覆有由Co-Fe合金和Co-Ni合金中的任一种构成的铁磁性合金膜的碳纳米管，其中铁磁性合金膜的表面的算术平均粗糙度（Ra 10 mum）被控制在1.15nm以下。一种用于扫描磁力显微镜的这种探针的制造方法以及在碳纳米管上形成这种铁磁性合金膜的方法，以便通过将铁磁性合金膜的生长速度控制在1.0的范围内来实现这种平均表面粗糙度至2.5nm / min。

3. 发明授权

US07398678B2 Probe for a scanning microscope 失效
标题翻译：探针扫描显微镜
公开(公告)号：US07398678B2
公开(公告)日：2008-07-15
申请号：US11145869
申请日：2005-06-06
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01B5/28
CPC分类号： G01Q60/04 , G01Q60/08 , G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要翻译：扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到从而允许尖端用作检测信号的探针针端。形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

4. 发明申请

US20080166560A1 PROBE FOR A SCANNING MAGNETIC FORCE MICROSCOPE, METHOD FOR PRODUCING THE SAME, AND METHOD FOR FORMING FERROMAGNETIC ALLOY FILM ON CARBON NANOTUBES 有权
标题翻译：用于扫描磁力显微镜的探针，其制造方法，以及在碳纳米管上形成铁磁性合金膜的方法
公开(公告)号：US20080166560A1
公开(公告)日：2008-07-10
申请号：US11322180
申请日：2005-12-28
申请人： Hiroyuki Akinaga , Yasuyuki Semba , Hiroshi Yokoyama , Masatoshi Yasutake , Hiromi Kuramochi
发明人： Hiroyuki Akinaga , Yasuyuki Semba , Hiroshi Yokoyama , Masatoshi Yasutake , Hiromi Kuramochi
IPC分类号： B32B9/00
CPC分类号： G01Q60/56 , G01Q70/12 , Y10S977/84 , Y10S977/842 , Y10T428/30
摘要： The present invention provides a probe for a scanning magnetic force microscope having a resolution sufficient to allow observation of a magnetic storage medium with 1200 kFCI or higher recording densities, a method for producing the probe, and a method for forming a ferromagnetic alloy film on a carbon nanotube. In the context of the present invention, the probe for a scanning magnetic force microscope comprises a carbon nanotube whose surface is at least in part coated with a ferromagnetic alloy film consisting of any one of a Co—Fe alloy and a Co—Ni alloy, wherein the arithmetic mean roughness (Ra 10 μm) of the surface of the ferromagnetic alloy film is controlled to 1.15 nm or less. A method for producing such probes for a scanning magnetic force microscope and a method for forming such a ferromagnetic alloy film on a carbon nanotube, so as to achieve such mean surface roughness by controlling the growth rate of the ferromagnetic alloy film within the range of 1.0 to 2.5 nm/min, is also disclosed.
摘要翻译：本发明提供了一种扫描磁力显微镜的探针，其具有足以允许观察具有1200kFCI或更高记录密度的磁存储介质的分辨率的扫描磁力显微镜，该探针的制造方法以及用于形成铁磁性合金膜的方法碳纳米管。在本发明的上下文中，用于扫描磁力显微镜的探针包括其表面至少部分地涂覆有由Co-Fe合金和Co-Ni合金中的任一种构成的铁磁合金膜的碳纳米管，其中铁磁性合金膜的表面的算术平均粗糙度（Ra 10 mum）被控制在1.15nm以下。一种用于扫描磁力显微镜的这种探针的制造方法以及在碳纳米管上形成这种铁磁性合金膜的方法，以便通过将铁磁性合金膜的生长速度控制在1.0的范围内来实现这种平均表面粗糙度至2.5nm / min。

5. 发明申请

US20060150720A1 Probe for a scanning microscope 失效
标题翻译：探针扫描显微镜
公开(公告)号：US20060150720A1
公开(公告)日：2006-07-13
申请号：US11145869
申请日：2005-06-06
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01B5/28
CPC分类号： G01Q60/04 , G01Q60/08 , G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要翻译：扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到从而允许尖端用作检测信号的探针针端。形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

6. 发明申请

US20050211915A1 Probe for an atomic force microscope and method for making such a probe 审中-公开
标题翻译：探测原子力显微镜及其制作方法
公开(公告)号：US20050211915A1
公开(公告)日：2005-09-29
申请号：US10499174
申请日：2002-12-18
申请人： Arnout Van den Bos , Leon Abelmann , Jacobus Lodder
发明人： Arnout Van den Bos , Leon Abelmann , Jacobus Lodder
IPC分类号： G01Q60/50 , G01Q60/54 , G01Q60/56 , G01R33/038 , G01T1/04
CPC分类号： G01Q60/50 , G01Q60/54 , G01Q60/56 , G01R33/0385
摘要： The invention relates to a probe for a magnetic force microscope, comprising a movable cantilever placed in the plane of a wafer and a tip placed substantially at right angles to the cantilever, wherein the cantilever is able to move and its oscillation direction is in the wafer plane, and the tip lies virtually in or parallel to this wafer plane.
摘要翻译：本发明涉及一种用于磁力显微镜的探针，其包括放置在晶片平面中的可移动悬臂和与悬臂基本成直角放置的尖端，其中悬臂能够移动并且其振荡方向在晶片平面，并且尖端实际上位于或平行于该晶片平面。

7. 发明授权

US09482692B2 Magnetic field value measuring device and method for measuring magnetic field value 有权
标题翻译：磁场测量装置及测量磁场值的方法
公开(公告)号：US09482692B2
公开(公告)日：2016-11-01
申请号：US14777667
申请日：2014-03-28
申请人： AKITA UNIVERSITY , OSAKA UNIVERSITY
发明人： Hitoshi Saito , Satoru Yoshimura , Yukinori Kinoshita , Hikaru Nomura , Ryoichi Nakatani
IPC分类号： G01Q60/52 , G01Q60/56 , G01Q60/50 , G01Q60/54
CPC分类号： G01Q60/52 , G01Q60/50 , G01Q60/54 , G01Q60/56
摘要： A magnetic field measuring device including: a vibrational probe unit having a probe that includes one or more material(s) whose intensity of magnetization is proportionate to an external magnetic field, a mechanical vibration source for the probe; a vibration detector detecting a vibration frequency and amplitude of the probe; an alternating-current magnetic field generator applying to the probe an alternating-current magnetic field; a direct-current external magnetic field generator applying a direct-current external magnetic field to the probe; a frequency modulation detector detecting frequency modulation occurring to the mechanical vibration of the probe; a direct-current external magnetic field controller adjusting the intensity of the direct-current external magnetic field applied to the probe; and a direct-current magnetic field determination unit determining a value of the direct-current magnetic field originating from a specimen.
摘要翻译：一种磁场测量装置，包括：振动探针单元，其具有探针，所述探针包括其强度与外部磁场成比例的一种或多种材料，所述探针的机械振动源; 检测探头的振动频率和振幅的振动检测器; 交流磁场发生器，向探头施加交流磁场; 将直流外部磁场施加到探针的直流外部磁场发生器; 检测对所述探针的机械振动发生的频率调制的频率调制检测器; 直流外部磁场控制器调节施加到探头的直流外部磁场的强度; 以及直流磁场确定单元，确定源自试样的直流磁场的值。

8. 发明授权

US08359661B2 Magnetic device inspection apparatus and magnetic device inspection method 失效
标题翻译：磁性装置检查装置和磁性装置检查方法
公开(公告)号：US08359661B2
公开(公告)日：2013-01-22
申请号：US12649468
申请日：2009-12-30
申请人： Takehiro Tachizaki , Masahiro Watanabe , Hideaki Sasazawa , Minoru Yoshida , Tsuneo Nakagomi , Teruaki Tokutomi
发明人： Takehiro Tachizaki , Masahiro Watanabe , Hideaki Sasazawa , Minoru Yoshida , Tsuneo Nakagomi , Teruaki Tokutomi
IPC分类号： G01Q60/52
CPC分类号： G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： Applying an alternating current to a magnetic head as a sample generates an alternate-current magnetic field from the sample. A cantilever includes a probe that is made of a magnetic material or is coated with a magnetic material. The cantilever is displaced when it approaches the sample. Detecting the displacement of the cantilever detects distribution of the magnetic field from the sample. It is possible to fast measure distribution of the magnetic field generated from the sample when a frequency of the alternating current applied to the sample differs from a resonance frequency of the cantilever.
摘要翻译：以交替电流作为样品施加磁头会产生来自样品的交流磁场。悬臂包括由磁性材料制成或涂覆有磁性材料的探针。悬臂在接近样品时被移位。检测悬臂的位移检测样品的磁场分布。当施加到样品的交流电流的频率与悬臂的共振频率不同时，可以快速测量从样品产生的磁场的分布。

9. 发明申请

US20100229265A1 PROBE SYSTEM COMPRISING AN ELECTRIC-FIELD-ALIGNED PROBE TIP AND METHOD FOR FABRICATING THE SAME 审中-公开
标题翻译：包含电场对准探头提示的探测系统及其制造方法
公开(公告)号：US20100229265A1
公开(公告)日：2010-09-09
申请号：US12767954
申请日：2010-04-27
申请人： Sungho Jin , Li-Han Chen , I-Chen Chen
发明人： Sungho Jin , Li-Han Chen , I-Chen Chen
IPC分类号： G01Q70/16
CPC分类号： G01Q60/38 , G01Q60/56 , G01Q70/12 , G11B9/1409 , H01J9/025
摘要： A mechanically stable and oriented scanning probe tip comprising a carbon nanotube having a base with a gradually decreasing diameter, with a sharp tip at the probe tip. Such a tip or an array of tips is produced by depositing a catalyst metal film on a substrate, depositing a carbon dot on the catalyst metal film, etching away the catalyst metal film not masked by the carbon dot, removing the carbon dot from the catalyst metal film to expose the catalyst metal film and growing a carbon nanotube probe tip on the catalyst metal film. The carbon probe tips can be straight, angled, or sharply bent and have various technical applications.
摘要翻译：一种机械稳定和取向的扫描探针尖端，其包括具有逐渐减小的直径的基底的碳纳米管，在探针尖端具有尖锐的尖端。通过在基板上沉积催化剂金属膜，在催化剂金属膜上沉积碳点，蚀刻未被碳点掩蔽的催化剂金属膜，从催化剂中除去碳点，从而制造这种尖端或尖端阵列金属膜暴露催化剂金属膜并在催化剂金属膜上生长碳纳米管探针尖端。碳探针尖端可以是直的，有角度的或急剧弯曲的，并具有各种技术应用。

10. 发明申请

US20100207622A1 MAGNETIC FIELD SENSOR DEVICE FOR DIRECT MAGNETIC FIELD IMAGING AND METHOD OF FABRICATION THEREOF 有权
标题翻译：用于直接磁场成像的磁场传感器装置及其制造方法
公开(公告)号：US20100207622A1
公开(公告)日：2010-08-19
申请号：US12667642
申请日：2008-06-26
申请人： Amit Finkler , Jens Martin , Yuri Myasoedov , Yehonathan Segev , Amir Yacoby , Eli Zeldov
发明人： Amit Finkler , Jens Martin , Yuri Myasoedov , Yehonathan Segev , Amir Yacoby , Eli Zeldov
IPC分类号： G01R33/035 , H01B19/00
CPC分类号： G01R33/0354 , G01Q60/56 , G01R33/0385
摘要： The present invention discloses a novel magnetic sensor device performing direct magnetic field imaging, comprising a probe having a conical tip portion which is configured as a sensor having two superconductors separated by a thin non-superconducting layer (such as a Josephson junction based sensor), where the non-superconducting layer is located at the apex portion of said conical tip, thereby defining electron tunneling region(s) at said apex portion. The technique of the present invention enables the sensor device to be very small and to be brought very close to the sample surface.
摘要翻译：本发明公开了一种执行直接磁场成像的新型磁传感器装置，其包括具有锥形尖端部分的探针，其被配置为具有由薄非超导层（诸如约瑟夫逊结基传感器）分离的两个超导体的传感器，其中所述非超导层位于所述锥形尖端的顶点处，从而在所述顶点处限定电子隧穿区域。本发明的技术使得传感器装置非常小并且使其非常接近样品表面。

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