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1. 发明授权

US07398678B2 Probe for a scanning microscope 失效
标题翻译：探针扫描显微镜
公开(公告)号：US07398678B2
公开(公告)日：2008-07-15
申请号：US11145869
申请日：2005-06-06
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01B5/28
CPC分类号： G01Q60/04 , G01Q60/08 , G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要翻译：扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到从而允许尖端用作检测信号的探针针端。形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

2. 发明申请

US20060150720A1 Probe for a scanning microscope 失效
标题翻译：探针扫描显微镜
公开(公告)号：US20060150720A1
公开(公告)日：2006-07-13
申请号：US11145869
申请日：2005-06-06
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01B5/28
CPC分类号： G01Q60/04 , G01Q60/08 , G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要翻译：扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到从而允许尖端用作检测信号的探针针端。形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

3. 发明授权

US07511270B2 Nanotube probe and a method for manufacturing the same 失效
标题翻译：纳米管探针及其制造方法
公开(公告)号：US07511270B2
公开(公告)日：2009-03-31
申请号：US10570525
申请日：2004-09-08
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
IPC分类号： G21K7/00
CPC分类号： G01Q70/12
摘要： The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.
摘要翻译：本发明实现了具有高耐久性的纳米管探针，其可以在短时间内制造，而较少的杂质附着在支撑纳米管的支架上。根据本发明的纳米管探针通过至少两个部分涂膜12a和12b将纳米管8紧固在悬臂的突出部分4上而构成。可以在这两个部分涂膜之间的中间区域中形成一个或多个附加的部分涂膜。每个部分涂膜通过在纳米管8与悬臂的突出部分4接触的位置上照射电子束10而形成。将部分涂膜分离成不重叠。通过最小化部分涂膜的尺寸以及通过使光束直径变窄，可以进一步缩短涂布时间。随着光束直径变窄，可以控制杂质沉积过多。

4. 发明申请

US20070018098A1 Nanotube probe and method for manufacturing the same 失效
标题翻译：纳米管探头及其制造方法
公开(公告)号：US20070018098A1
公开(公告)日：2007-01-25
申请号：US10570525
申请日：2004-09-08
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
IPC分类号： G21K7/00
CPC分类号： G01Q70/12
摘要： The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.
摘要翻译：本发明实现了具有高耐久性的纳米管探针，其可以在短时间内制造，而较少的杂质附着在支撑纳米管的支架上。根据本发明的纳米管探针通过至少两个部分涂膜12a和12b将纳米管8紧固在悬臂的突出部分4上而构成。可以在这两个部分涂膜之间的中间区域中形成一个或多个附加的部分涂膜。每个部分涂膜通过在纳米管8与悬臂的突出部分4接触的位置上照射电子束10而形成。将部分涂膜分离成不重叠。通过最小化部分涂膜的尺寸以及通过使光束直径变窄，可以进一步缩短涂布时间。随着光束直径变窄，可以控制杂质沉积过多。

5. 发明授权

US07066513B2 Operation method of nanotweezers 失效
公开(公告)号：US07066513B2
公开(公告)日：2006-06-27
申请号：US10364990
申请日：2003-02-12
申请人： Shigenobu Yamanaka , Akio Harada , Yoshikazu Nakayama
发明人： Shigenobu Yamanaka , Akio Harada , Yoshikazu Nakayama
IPC分类号： B25J7/00
CPC分类号： B82B3/00 , G01Q80/00 , Y10S977/849
摘要： The operation method of nanotweezers including the steps of: confirming the position of a nanoscale material by way of imaging the surface of a specimen by a scanning type probe microscope; moving the nanotweezers to the position over the nanoscale material; descending the nanotweezers which are in an opened state and then closing the nanotweezers so as to hold the nanoscale material; raising the nanotweezers that hold the nanoscale material and then moving the nanotweezers to an objective position; and descending the nanotweezers that hold the nanoscale material and then opening the nanotweezers, thus releasing the nanoscale material on the objective position which is on the surface of the specimen and is where a nanoscale construction is constructed.

6. 发明授权

US06705154B2 Cantilever for vertical scanning microscope and probe for vertical scan microscope 失效
标题翻译：垂直扫描显微镜悬臂，垂直扫描显微镜探针
公开(公告)号：US06705154B2
公开(公告)日：2004-03-16
申请号：US10182363
申请日：2002-07-26
申请人： Yoshikazu Nakayama , Seiji Akita , Akio Harada , Takashi Okawa , Yuichi Takano , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Seiji Akita , Akio Harada , Takashi Okawa , Yuichi Takano , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01N2100
CPC分类号： G01Q70/10 , G01Q70/12
摘要： A cantilever for a vertical scanning type microscope that obtains substance information of a surface of a specimen by a tip end of a nanotube probe needle fastened to the cantilever, in which the cantilever has a fixing region to which a base end portion of a nanotube serving as a probe needle is fastened, and a height direction of the fixing region is set to be substantially perpendicular to a mean surface of the specimen when the cantilever is disposed in a measuring state with respect to the mean surface of the specimen; and the base end portion of the nanotube is bonded in the height direction of the fixing region.
摘要翻译：一种用于垂直扫描型显微镜的悬臂，其通过固定到悬臂的纳米管探针的尖端获得试样表面的物质信息，其中悬臂具有固定区域，其中纳米管的基端部分当所述探针针被固定时，并且当所述悬臂相对于所述试样的平均表面设置在测量状态时，所述固定区域的高度方向被设定为基本上垂直于所述试样的平均表面; 并且纳米管的基端部在固定区域的高度方向上接合。

7. 发明申请

US20080153693A1 CATALYSTS FOR MANUFACTURING CARBON SUBSTANCES 失效
标题翻译：催化剂用于制造碳物质
公开(公告)号：US20080153693A1
公开(公告)日：2008-06-26
申请号：US10328105
申请日：2002-12-23
申请人： Xu Li , Youchang Wang , Takashi Okawa , Akio Harada , Yoshikazu Nakayama
发明人： Xu Li , Youchang Wang , Takashi Okawa , Akio Harada , Yoshikazu Nakayama
IPC分类号： B01J23/70
CPC分类号： B82Y40/00 , B01J23/825 , B01J23/835 , B01J37/0219 , B01J37/082 , B82Y30/00 , C01B32/162 , C01B32/18 , C01B2202/36
摘要： A catalyst for manufacturing carbon substances, such as carbon nanotube that has a diameter of 1000 nm or less, the catalyst containing at least iron, cobalt or nickel of a first element group and tin or indium of a second element group. The catalyst can be formed by at least tin and indium in addition to cobalt or nickel. The former catalyst provides a 2-component type catalyst and a multi-component type catalyst that is composed on the basis of the 2-component type catalyst, and the later catalyst provides a 3-component type catalyst and a multi-component type catalyst that is composed on the basis of the 3-component type catalyst.
摘要翻译：用于制造直径为1000nm以下的碳纳米管等碳材料的催化剂，所述催化剂至少含有第一元素基团的铁，钴或镍，以及第二元素基团的锡或铟。除了钴或镍之外，催化剂可以至少由锡和铟形成。前一种催化剂提供基于2-组分型催化剂组成的2-组分型催化剂和多组分型催化剂，后催化剂提供一种3-组分型催化剂和多组分型催化剂，是基于3组分型催化剂组成的。

8. 发明授权

US07405178B2 Catalysts for manufacturing carbon substances 失效
标题翻译：用于制造碳物质的催化剂
公开(公告)号：US07405178B2
公开(公告)日：2008-07-29
申请号：US10328105
申请日：2002-12-23
申请人： Xu Li , Youchang Wang , Takashi Okawa , Akio Harada , Yoshikazu Nakayama
发明人： Xu Li , Youchang Wang , Takashi Okawa , Akio Harada , Yoshikazu Nakayama
IPC分类号： B01J23/58
CPC分类号： B82Y40/00 , B01J23/825 , B01J23/835 , B01J37/0219 , B01J37/082 , B82Y30/00 , C01B32/162 , C01B32/18 , C01B2202/36
摘要： A catalyst for manufacturing carbon substances, such as carbon nanotube that has a diameter of 1000 nm or less, the catalyst containing at least iron, cobalt or nickel of a first element group and tin or indium of a second element group. The catalyst can be formed by at least tin and indium in addition to cobalt or nickel. The former catalyst provides a 2-component type catalyst and a multi-component type catalyst that is composed on the basis of the 2-component type catalyst, and the later catalyst provides a 3-component type catalyst and a multi-component type catalyst that is composed on the basis of the 3-component type catalyst.
摘要翻译：用于制造直径为1000nm以下的碳纳米管等碳材料的催化剂，所述催化剂至少含有第一元素基团的铁，钴或镍，以及第二元素基团的锡或铟。除了钴或镍之外，催化剂可以至少由锡和铟形成。前一种催化剂提供基于2-组分型催化剂组成的2-组分型催化剂和多组分型催化剂，后催化剂提供一种3-组分型催化剂和多组分型催化剂，是基于3组分型催化剂组成的。

9. 发明授权

US06787769B2 Conductive probe for scanning microscope and machining method using the same 失效
标题翻译：用于扫描显微镜的导电探针及使用其的加工方法
公开(公告)号：US06787769B2
公开(公告)日：2004-09-07
申请号：US10182331
申请日：2002-07-26
申请人： Yoshikazu Nakayama , Seiji Akita , Akio Harada , Takashi Okawa , Yuichi Takano , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Seiji Akita , Akio Harada , Takashi Okawa , Yuichi Takano , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01N2300
CPC分类号： G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q70/12
摘要： A conductive probe for a scanning type microscope that captures the substance information of the surface of a specimen by the tip end of a conductive nanotube probe needle fastened to a cantilever, in which the conductive probe is constructed from a conductive film formed on the surface of the cantilever, a conductive nonatube with its base end portion being fixed in contact which the surface of a predetermined of the cantilever, and a conductive deposit which fastens the conductive nanotube by covering from the base end portion of the nonatube to a part of the conductive film. The conductive nonatube and the conductive film are electrically connected to each other by the conductive deposit.
摘要翻译：一种用于扫描型显微镜的导电探针，其通过固定到悬臂的导电纳米管探针的尖端捕获试样表面的物质信息，其中导电探针由形成在表面上的导电膜构成悬臂，其基端部固定为导电的非导管，其中预定的悬臂的表面是接触的，以及导电沉积物，其通过从非管形管的基端部分覆盖到导电的一部分来紧固导电纳米管电影。导电非导体和导电膜通过导电沉积物彼此电连接。

10. 发明授权

US06759653B2 Probe for scanning microscope produced by focused ion beam machining 失效
标题翻译：通过聚焦离子束加工扫描显微镜的探头
公开(公告)号：US06759653B2
公开(公告)日：2004-07-06
申请号：US10182330
申请日：2002-07-26
申请人： Yoshikazu Nakayama , Seiji Akita , Akio Harada , Takashi Okawa , Yuichi Takano , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Seiji Akita , Akio Harada , Takashi Okawa , Yuichi Takano , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G21K700
CPC分类号： G01Q60/38 , G01Q70/12
摘要： A scanning type microscope that captures substance information of the surface of a specimen by the tip end of a nanotube probe needle fastened to a cantilever, in which an organic gas is decomposed by a focused ion beam in a focused ion beam apparatus, and the nanotube is bonded to the cantilever with a deposit of the decomposed component thus produced. With this probe, the quality of the nanotube probe needle can be improved by removing an unnecessary deposit adhering to the nanotube tip end portion using a ion beam, by cutting an unnecessary part of the nanotube in order to control length of the probe needle and by injecting ions into the tip end portion of the nanotube.
摘要翻译：一种扫描型显微镜，其通过紧固在悬臂上的纳米管探针的前端捕获试样表面的物质信息，其中有机气体在聚焦离子束装置中被聚焦离子束分解，并且纳米管与由此产生的分解成分的沉积物粘合到悬臂上。利用该探针，可以通过使用离子束除去附着在纳米管末端部分的不必要的沉积物，通过切割不需要的纳米管部分来控制探针的长度，并且通过将离子注入纳米管的前端部。

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