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1. 发明授权

US07398678B2 Probe for a scanning microscope 失效
标题翻译：探针扫描显微镜
公开(公告)号：US07398678B2
公开(公告)日：2008-07-15
申请号：US11145869
申请日：2005-06-06
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01B5/28
CPC分类号： G01Q60/04 , G01Q60/08 , G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要翻译：扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到从而允许尖端用作检测信号的探针针端。形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

2. 发明申请

US20060150720A1 Probe for a scanning microscope 失效
标题翻译：探针扫描显微镜
公开(公告)号：US20060150720A1
公开(公告)日：2006-07-13
申请号：US11145869
申请日：2005-06-06
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada , Masatoshi Yasutake , Yoshiharu Shirakawabe
IPC分类号： G01B5/28
CPC分类号： G01Q60/04 , G01Q60/08 , G01Q60/16 , G01Q60/38 , G01Q60/54 , G01Q60/56 , G01Q70/12
摘要： A scanning microscope probe in which a palladium covering film is formed on the surface of the protruding portion of a cantilever, and the base end portion of a nanotube is disposed in contact with the palladium covering film with the tip end portion of the nanotube protruding to the outside, thus allowing the tip end to be used as a probe needle end for detecting signals. A coating film is formed to cover all or part of the surface of this base end portion, and the nanotube is thus firmly fastened to the cantilever. Since the base end portion adheres tightly to the palladium covering film, both of them are electrically continuous. This palladium covering film allows, as an electrode film, the application of a voltage to the nanotube or the passage of an electric current through the nanotube, showing also good adhesion to the nanotube and cantilever.
摘要翻译：扫描显微镜探针，其中在悬臂的突出部分的表面上形成钯覆盖膜，并且纳米管的基端部设置成与钯覆盖膜接触，其中纳米管的末端部突出到从而允许尖端用作检测信号的探针针端。形成涂膜以覆盖该基端部的全部或部分表面，并且因此将纳米管牢固地固定在悬臂上。由于基端部紧密地附着在钯覆盖膜上，所以两者都是电连续的。这种钯覆膜可以作为电极膜，对纳米管施加电压或使电流通过纳米管，对纳米管和悬臂也表现出良好的粘附性。

3. 发明授权

US07511270B2 Nanotube probe and a method for manufacturing the same 失效
标题翻译：纳米管探针及其制造方法
公开(公告)号：US07511270B2
公开(公告)日：2009-03-31
申请号：US10570525
申请日：2004-09-08
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
IPC分类号： G21K7/00
CPC分类号： G01Q70/12
摘要： The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.
摘要翻译：本发明实现了具有高耐久性的纳米管探针，其可以在短时间内制造，而较少的杂质附着在支撑纳米管的支架上。根据本发明的纳米管探针通过至少两个部分涂膜12a和12b将纳米管8紧固在悬臂的突出部分4上而构成。可以在这两个部分涂膜之间的中间区域中形成一个或多个附加的部分涂膜。每个部分涂膜通过在纳米管8与悬臂的突出部分4接触的位置上照射电子束10而形成。将部分涂膜分离成不重叠。通过最小化部分涂膜的尺寸以及通过使光束直径变窄，可以进一步缩短涂布时间。随着光束直径变窄，可以控制杂质沉积过多。

4. 发明申请

US20070018098A1 Nanotube probe and method for manufacturing the same 失效
标题翻译：纳米管探头及其制造方法
公开(公告)号：US20070018098A1
公开(公告)日：2007-01-25
申请号：US10570525
申请日：2004-09-08
申请人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
发明人： Yoshikazu Nakayama , Takashi Okawa , Shigenobu Yamanaka , Akio Harada
IPC分类号： G21K7/00
CPC分类号： G01Q70/12
摘要： The present invention realizes a nanotube probe with high durability that can be manufactured in short time with less impurities adhered to the holder sustaining the nanotube. The nanotube probe according to this invention is constructed by fastening a nanotube 8 on the protruded portion 4 of a cantilever by way of at least two partial coating films 12a and 12b. One or more additional partial coating films may be formed in the intermediate area between these two partial coating films. Each partial coating film is formed by irradiating electron beam 10 on the position where the nanotube 8 is in contact with the protruded portion 4 of the cantilever. The partial coating films are separated not to overlap each other. By minimizing the size of partial coating film as well as by narrowing down the beam diameter, coating time may be further shortened. With the beam diameter narrowed down, excessive deposit of impurities can be put under control.
摘要翻译：本发明实现了具有高耐久性的纳米管探针，其可以在短时间内制造，而较少的杂质附着在支撑纳米管的支架上。根据本发明的纳米管探针通过至少两个部分涂膜12a和12b将纳米管8紧固在悬臂的突出部分4上而构成。可以在这两个部分涂膜之间的中间区域中形成一个或多个附加的部分涂膜。每个部分涂膜通过在纳米管8与悬臂的突出部分4接触的位置上照射电子束10而形成。将部分涂膜分离成不重叠。通过最小化部分涂膜的尺寸以及通过使光束直径变窄，可以进一步缩短涂布时间。随着光束直径变窄，可以控制杂质沉积过多。

5. 发明申请

US20050270721A1 Tweezers with grounding wire 审中-公开
标题翻译：镊子带接地线
公开(公告)号：US20050270721A1
公开(公告)日：2005-12-08
申请号：US11204716
申请日：2005-08-16
申请人： Takashi Okawa , Shigenobu Yamanaka , Hideki Utaki , Akio Harada
发明人： Takashi Okawa , Shigenobu Yamanaka , Hideki Utaki , Akio Harada
IPC分类号： A61B17/30 , B25B9/02 , H02H1/00
CPC分类号： A61B17/30 , B25B9/02
摘要： There are proposed tweezers with grounding wire for grabbing a minute object containing an infinitesimal substance, which can discharge static electricity in the human body when it is used to grab a minute object, and which thus prevents the action of static electricity on the minute object and/or infinitesimal substance therein. The tweezers with grounding wire is constructed by connecting the grounding wire 2 for discharging the static electricity when a human operates the tweezers 1 The tweezers with grounding wire is particularly useful for handling a minute object 8 containing infinitesimal substance 7 of which shape is unrecognizable with naked eyes or an optical microscope. Since static electricity in the human body or in the object handled is discharged through the grounding wire 2 from the tweezers 1, the minute object 8 and the infinitesimal substance 7 to be handled are not subject to the action of static electricity, and thus are kept free from destruction or damage of static electricity.
摘要翻译：有人提出用接地线镊子抓住含有微量物质的微小物体，当用来抓住微小物体时，能够释放人体内的静电，从而防止静电对微小物体的作用， /或其中的微小物质。具有接地线的镊子通过连接接地线2而构成，当人类操作镊子时，用于排放静电的地线2.具有接地线的镊子特别可用于处理包含无定形物质的微小物体8，其中形状不可识别眼睛或光学显微镜。由于人体或被处理物体中的静电通过接地线2从镊子1排出，所以待处理的微小物体8和无限小物质7不受静电的作用，因此被保持免受静电破坏或损坏。

6. 发明授权

US07066513B2 Operation method of nanotweezers 失效
公开(公告)号：US07066513B2
公开(公告)日：2006-06-27
申请号：US10364990
申请日：2003-02-12
申请人： Shigenobu Yamanaka , Akio Harada , Yoshikazu Nakayama
发明人： Shigenobu Yamanaka , Akio Harada , Yoshikazu Nakayama
IPC分类号： B25J7/00
CPC分类号： B82B3/00 , G01Q80/00 , Y10S977/849
摘要： The operation method of nanotweezers including the steps of: confirming the position of a nanoscale material by way of imaging the surface of a specimen by a scanning type probe microscope; moving the nanotweezers to the position over the nanoscale material; descending the nanotweezers which are in an opened state and then closing the nanotweezers so as to hold the nanoscale material; raising the nanotweezers that hold the nanoscale material and then moving the nanotweezers to an objective position; and descending the nanotweezers that hold the nanoscale material and then opening the nanotweezers, thus releasing the nanoscale material on the objective position which is on the surface of the specimen and is where a nanoscale construction is constructed.

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