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    • 6. 发明授权
    • Thermal control apparatus for inductively coupled RF plasma reactor having an overhead solenoidal antenna
    • 具有架空螺线管天线的电感耦合射频等离子体反应器的热控制装置
    • US06514376B1
    • 2003-02-04
    • US09520623
    • 2000-03-07
    • Kenneth CollinsMichael RiceEric AskarinamDouglas BuchbergerCraig Roderick
    • Kenneth CollinsMichael RiceEric AskarinamDouglas BuchbergerCraig Roderick
    • C23C1600
    • C23C16/517H01F2029/143H01J37/32082H01J37/321H01J37/32146H01J37/32165H01J37/32458H01J37/32467H01J37/32522H01J37/32688H01J37/32706H01J37/32871H01J2237/3343H01J2237/3345H01J2237/3346H01L21/31116H01L21/6831
    • The invention is embodied in a plasma reactor including a plasma reactor chamber and a workpiece support for holding a workpiece near a support plane inside the chamber during processing, the chamber having a reactor enclosure portion facing the support, a cold body overlying the reactor enclosure portion, a plasma source power applicator between the reactor enclosure portion and the cold body and a thermally conductor between and in contact with the cold body and the reactor enclosure. The thermal conductor and the cold sink define a cold sink interface therebetween, the reactor preferably further including a thermally conductive substance within the cold sink interface for reducing the thermal resistance across the cold sink interface. The thermally conductive substance can be a thermally conductive gas filling the cold body interface. Alternatively, the thermally conductive substance can be a thermally conductive solid material. The reactor can include a gas manifold in the cold body communicable with a source of the thermally conductive gas an inlet through the cold body from the gas manifold and opening out to the cold body interface. The reactor can further include an O-ring apparatus sandwiched between the cold body and the thermal conductor and defining a gas-containing volume in the cold body interface of nearly infinitesimal thickness in communication with the inlet from the cold body. More generally, the reactor can include the facilitation of thermal transfer across an interface between a hot and/or cold sink and any part exposed to the reactor chamber interior atmosphere, such as the ceiling, wall or polymer-hardening precursor ring, for example, by the insertion into that interface of a thermally conductive gas or substance.
    • 本发明体现在等离子体反应器中,该等离子体反应器包括等离子体反应器室和工件支撑件,用于在加工期间将工件保持在室内的支撑平面附近,该室具有面向支撑件的反应器外壳部分,覆盖反应器外壳部分的冷体 ,反应器外壳部分和冷体之间的等离子体源功率施加器和在冷体和反应器外壳之间并与其接触的导热体。 热导体和冷却槽在它们之间限定冷沉接口,反应器优选地还包括在冷沉接口内的导热物质,以降低冷接口接口上的热阻。 导热物质可以是填充冷体界面的导热气体。 或者,导热物质可以是导热固体材料。 反应器可以包括在冷体中的气体歧管,其与导热气体源连通,通过来自气体歧管的冷体和通向冷体界面的入口。 反应器还可以包括夹在冷体和热导体之间的O形环装置,并且在与冷体的入口连通的几乎无穷小的厚度的冷体界面中限定含气体体积。 更一般地,反应器可以包括促进热和/或冷沉之间的界面和暴露于反应室内部大气的任何部分(例如天花板,壁或聚合物硬化前体环)之间的热传递,例如, 通过插入该导热气体或物质的界面。
    • 10. 发明授权
    • High pressure high non-reactive diluent gas content high plasma ion density plasma oxide etch process
    • 高压高反应性稀释气体含量高等离子体离子密度等离子体氧化物蚀刻工艺
    • US06238588B1
    • 2001-05-29
    • US08733554
    • 1996-10-21
    • Kenneth CollinsDavid GroechelRaymond HungMichael RiceGerald YinJian DingChunshi Cui
    • Kenneth CollinsDavid GroechelRaymond HungMichael RiceGerald YinJian DingChunshi Cui
    • B44C122
    • H01L21/02063C23C16/517H01F2029/143H01J37/32082H01J37/321H01J37/32146H01J37/32165H01J37/32458H01J37/32467H01J37/32522H01J37/32688H01J37/32706H01J37/32871H01J2237/3343H01J2237/3345H01J2237/3346H01L21/31116H01L21/6831
    • The invention is embodied in a method of processing a semiconductor workpiece in a plasma reactor chamber, including supplying a polymer and etchant precursor gas containing at least carbon and fluorine into the chamber at a first flow rate sufficient of itself to maintain a gas pressure in the chamber in a low pressure range below about 20 mT, supplying a relatively non-reactive gas into the chamber at second flow rate sufficient about one half or more of the total gas flow rate into the chamber, in combination with the first flow rate of the precursor gas, to maintain the gas pressure in the chamber in a high pressure range above 20 mT, and applying plasma source power into the chamber to form a high ion density plasma having an ion density in excess of 1010 ions per cubic centimeter. In one application of the invention, the workpiece includes an oxygen-containing overlayer to be etched by the process and a non-oxygen-containing underlayer to be protected from etching, the precursor gas dissociating in the plasma into fluorine-containing etchant species which etch the oxygen-containing layer and carbon-containing polymer species which accumulate on the non-oxygen-containing underlayer. Alternatively, the high pressure range may be defined as a pressure at which the skin depth of the inductive field exceeds {fraction (1/10)} of the gap between the inductive antenna and the workpiece.
    • 本发明体现在一种在等离子体反应器室中处理半导体工件的方法,包括以足以自动维持气体压力的第一流量将至少含有碳和氟的聚合物和蚀刻剂前体气体供应到室中 在低于大约20mT的低压范围内,将第二流量的第二流量的相对非反应性气体供应到室内的总气体流速的约一半以上,并与第一流量 将气体压力保持在高于20mT的高压范围内,并将等离子体源功率施加到腔室中以形成离子密度超过每立方厘米1010离子的高离子密度等离子体。 在本发明的一个应用中,工件包括通过该方法蚀刻的含氧覆层和不受蚀刻保护的非含氧底层,前体气体在等离子体中解离成含氟蚀刻剂,其蚀刻 含氧层和积聚在非含氧底层上的含碳聚合物种类。 或者,高压范围可以被定义为感应场的趋肤深度超过感应天线和工件之间的间隙的{分数(1/10)}的压力。