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    • 2. 发明授权
    • Semiconductor memory and method for testing the same
    • 半导体存储器及其测试方法
    • US08433960B2
    • 2013-04-30
    • US13279111
    • 2011-10-21
    • Kaoru Mori
    • Kaoru Mori
    • G11C29/00
    • G11C29/16G11C2029/1804
    • A semiconductor memory in which arbitrary operation mode information is set in a plurality of CRs at test time. When a CR (configuration register) control circuit detects write commands to write to an address or read commands to read from the address in a predetermined order, the CR control circuit updates the operation mode information for each of the plurality of CRs on a time division basis. A command generation section generates the write commands, the read commands, or a test start command in response to a control signal from the outside. A data pad compression circuit changes the operation mode information to be written to the plurality of CRs by using test data inputted to part of data pads, after inverting the test data or in its original condition according to a code, as data for a rest of the data pads.
    • 一种在测试时间内在多个CR中设定任意操作模式信息的半导体存储器。 当CR(配置寄存器)控制电路检测到写入命令以写入地址或读取命令以按预定顺序从地址读取时,CR控制电路在时分上更新多个CR中的每一个的操作模式信息 基础。 命令生成部分响应于来自外部的控制信号生成写命令,读命令或测试开始命令。 数据块压缩电路通过使用输入到数据块的一部分的测试数据,在将测试数据或其原始状态根据代码反转之后,将待写入的操作模式信息改变为用于其余部分的数据 数据垫。
    • 5. 发明授权
    • Semiconductor memory
    • 半导体存储器
    • US07362630B2
    • 2008-04-22
    • US11714766
    • 2007-03-07
    • Kaoru MoriYoshiaki Okuyama
    • Kaoru MoriYoshiaki Okuyama
    • G11C29/00
    • G11C29/808G11C29/838
    • In order to give all memory blocks the same structure, a redundancy word line and a redundancy bit line are formed in each memory block. A redundancy column selection line is wired in common to the memory blocks. Column redundancy circuits are formed to correspond to respective memory groups each of which consists of a prescribed number of memory blocks, and become effective according to enable signals. A column redundancy selection circuit activates an enable signal according to a block address signal when all row hit signals are deactivated. When one of the row hit signals is activated, the column redundancy selection circuit activates the enable signal corresponding to the activated row hit signal. Since the column redundancy circuit for an arbitrary memory group can be made effective according to the row hit signals, failure relief efficiency can be increased without deteriorating the electric characteristic during an access operation.
    • 为了给予所有存储块相同的结构,在每个存储块中形成冗余字线和冗余位线。 冗余列选择线公共地连接到存储器块。 列冗余电路形成为对应于各自的存储器组,每个存储器组由规定数量的存储块组成,并且根据使能信号变为有效。 当所有行命中信号被去激活时,列冗余选择电路根据块地址信号激活使能信号。 当行命中信号之一被激活时,列冗余选择电路激活对应于激活的行命中信号的使能信号。 由于可以根据行命中信号使任意存储器组的列冗余电路有效,可以在不使访问操作期间的电特性恶化的情况下增加故障排除效率。
    • 8. 发明授权
    • Magnetic memory adopting synthetic antiferromagnet as free magnetic layer
    • 磁记忆采用合成反铁磁体作为自由磁性层
    • US07242047B2
    • 2007-07-10
    • US11208370
    • 2005-08-19
    • Kaoru MoriTetsuhiro SuzukiYoshiyuki FukumotoSadahiko Miura
    • Kaoru MoriTetsuhiro SuzukiYoshiyuki FukumotoSadahiko Miura
    • H01L29/76
    • G11C11/16B82Y25/00H01F10/3254H01F10/3272H01L43/08
    • A magnetic memory is composed of: a magnetoresistance element including a free magnetic layer; a first interconnection extending in a first direction obliquely to an easy axis of the free magnetic layer; a second interconnection extending in a second direction substantially orthogonal to the first direction; and a write circuit writing data into the free magnetic layer through developing a first write current on the first interconnection, and then developing a second write current on the second interconnection with the first write current turned on. The free magnetic layer includes: first to N-th ferromagnetic layers and first to (N−1)-th non-magnetic layers with N being equal to or more than 4, the i-th non-magnetic layer being disposed between the i-th and (i+1)-th ferromagnetic layers with i being any of natural numbers equal to or less than N−1. The free magnetic layer is designed so that antiferromagnetic coupling(s) between the j-th and (j+1)-th ferromagnetic layers is stronger than that between the first and second ferromagnetic layers, j being any of integers ranging from 2 to N−2.
    • 磁存储器包括:包括自由磁性层的磁阻元件; 第一互连件,其在第一方向上倾斜于所述自由磁性层的容易轴线延伸; 沿与第一方向大致正交的第二方向延伸的第二互连; 以及写入电路,通过在所述第一互连上形成第一写入电流将数据写入所述自由磁性层,然后在所述第二互连上开启第二写入电流,所述第一写入电流导通。 自由磁性层包括:第一至第N铁磁层和N等于或大于4的第一至第(N-1)个非磁性层,第i个非磁性层设置在i 和第(i + 1)个铁磁层,其中i为等于或小于N-1的任意自然数。 自由磁性层被设计成使得第j和第(j + 1)个铁磁层之间的反铁磁耦合比第一和第二铁磁层之间的反铁磁耦合更强,j是从2到N的整数中的任何一个 -2。
    • 9. 发明授权
    • Semiconductor memory device with shift register-based refresh address generation circuit
    • 具有基于移位寄存器的刷新地址产生电路的半导体存储器件
    • US07145825B2
    • 2006-12-05
    • US10800831
    • 2004-03-16
    • Kaoru MoriKatuhiro MoriShinichi YamadaKuninori KawabataShigemasa Ito
    • Kaoru MoriKatuhiro MoriShinichi YamadaKuninori KawabataShigemasa Ito
    • G11C7/00
    • G11C11/406
    • A semiconductor memory device with low power consumption in driving control signals of shift registers. The device contains a plurality of memory cell arrays each composed of a predetermined number of rows of memory cells. One set of shift registers are coupled to each cell array, and the nth set of shift registers successively activate word line selection signals according to a given control signal, so that the corresponding word lines of the nth cell array will be refreshed. Also coupled to each cell array is a shift register controller. The nth shift register controller provides a control signal to the nth set of shift registers when the nth cell array is being refreshed. When the refresh of that cell array is finished, the nth shift register controller forwards the control signal to the (n+1)th set of shift registers, thus initiating refresh operation for the (n+1)th cell array.
    • 一种在移位寄存器的驱动控制信号中具有低功耗的半导体存储器件。 该装置包含多个存储单元阵列,每个存储单元阵列由预定数量的存储单元行组成。 一组移位寄存器耦合到每个单元阵列,并且第n组移位寄存器根据给定的控制信号依次激活字线选择信号,使得第n个单元阵列的相应字线将被刷新。 还耦合到每个单元阵列是移位寄存器控制器。 当第n个单元阵列被刷新时,第n个移位寄存器控制器向第n组移位寄存器提供控制信号。 当完成该单元阵列的刷新时,第n移位寄存器控制器将控制信号转发到第(n + 1)个移位寄存器组,从而启动第(n + 1)个单元阵列的刷新操作。