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    • 3. 发明公开
    • 낮은 외부 전원 전압에 적합한 전압 발생부들
    • 电压发生器适应低外部电源电压
    • KR1020130098041A
    • 2013-09-04
    • KR1020120019832
    • 2012-02-27
    • 삼성전자주식회사
    • 이동수
    • G11C5/14G11C11/4074
    • G11C11/4076G05F1/56G11C5/145G11C5/147G11C11/4074G11C11/4099G11C2207/2272H02M3/07
    • PURPOSE: Voltage generating parts suitable for a low external power voltage generate an internal power voltage in a target voltage level by generating a second reference voltage using an inflection point voltage level, and the internal power voltage using the second reference voltage. CONSTITUTION: A reference voltage generating unit (100) includes an inflection point control unit (110) and a level amplification unit (120). The inflection point control unit is driven by a first power voltage supplied from the outside and generates an inflection point voltage by receiving a first voltage. The level amplification unit is driven by a second power voltage higher than the first power voltage and generates a reference voltage by receiving the inflection point voltage. [Reference numerals] (110) Inflection point control unit; (120) Level amplification unit
    • 目的:适用于低外部电源电压的电压产生部件通过使用拐点电压电平产生第二参考电压,并使用第二参考电压产生内部电源电压,从而产生目标电压电平的内部电源电压。 构成:参考电压产生单元(100)包括拐点控制单元(110)和电平放大单元(120)。 拐点控制单元由从外部提供的第一电源电压驱动,并通过接收第一电压来产生拐点电压。 电平放大单元由比第一电源电压高的第二电源电压驱动,并通过接收拐点电压产生参考电压。 (附图标记)(110)拐点控制单元; (120)电平放大单元
    • 4. 发明公开
    • 가변 저항 소자를 포함하는 반도체 장치 및 상기 반도체 장치의 동작 방법
    • 包含可变电阻元件的半导体器件和操作方法半导体器件
    • KR1020130026803A
    • 2013-03-14
    • KR1020110090200
    • 2011-09-06
    • 삼성전자주식회사
    • 장만김영배이동수이창범이승렬김창정이명재김경민
    • G11C13/00
    • G11C13/0069G11C11/5685G11C13/0007G11C13/0033G11C2013/0076G11C2013/009G11C2013/0092G11C2211/5625G11C2213/31G11C2213/32
    • PURPOSE: A semiconductor device including a variable resistor device and an operating method thereof are provided to improve the reliability of the semiconductor device by improving a current distribution of the variable resistor device. CONSTITUTION: A reset voltage is applied to a variable resistor device(S310). A reset current flowing in the variable resistor device is sensed(S320). A set voltage applied to the variable resistor device is controlled based on the distribution of the reset current(S330).The reset voltage is applied to the variable resistor device based on the distribution of the reset current(S330). [Reference numerals] (AA) Start; (BB) End; (S310) Applying a reset voltage(V_RESET) to a variable resistor device; (S320) Sensing a reset current(I_REST) flowing through the variable resistor device; (S330) Controlling a set voltage(V_SET) based on the distribution of the reset current(I_RESET); (S340) Re-applying the set voltage(V_SET) based on the distribution of the reset current(I_RESET)
    • 目的:提供一种包括可变电阻器件及其操作方法的半导体器件,以通过改进可变电阻器件的电流分布来提高半导体器件的可靠性。 构成:复位电压施加到可变电阻器件(S310)。 感测到在可变电阻器件中流动的复位电流(S320)。 基于复位电流的分布来控制施加到可变电阻器件的设定电压(S330)。基于复位电流的分布,复位电压被施加到可变电阻器件(S330)。 (附图标记)(AA)开始; (BB)结束; (S310)对可变电阻器件施加复位电压(V_RESET); (S320)检测流过可变电阻器件的复位电流(I_REST); (S330)基于复位电流(I_RESET)的分布来控制设定电压(V_SET); (S340)基于复位电流(I_RESET)的分布重新设定设定电压(V_SET)
    • 5. 发明公开
    • 비휘발성 메모리 소자 및 그 구동 방법
    • 非易失性电阻记忆体装置及其驱动方法
    • KR1020130021199A
    • 2013-03-05
    • KR1020110083580
    • 2011-08-22
    • 삼성전자주식회사
    • 장만김영배이동수이창범이승렬김창정이명재김경민
    • G11C16/20G11C16/04G11C16/06
    • G11C11/5685G11C13/0007G11C13/0064G11C13/0069
    • PURPOSE: A nonvolatile memory device and a driving method thereof are provided to secure a stable device operation by reducing the distribution of a plurality of reset currents at each level in a multilevel cell. CONSTITUTION: A first reset voltage is applied to a unit memory cell and a current reset current is read(S11). The current reset current is compared with a set current of a prior cycle(S16). If a difference between the current reset current and the prior set current is smaller than a preset value, a second reset voltage is applied to the unit memory cell(S21). If the difference between the current reset current and the prior set current is larger than a preset value, the set voltage is applied to the unit memory cell and the unit memory cell unit is switched into the set state and then the first reset voltage is applied again. [Reference numerals] (AA) Start; (BB,EE,GG,JJ) No; (CC) I_RESET first upper limit; (HH) I I_RESET - I_SET I > second upper limit; (KK) I I_RESET - I_SET I
    • 目的:提供一种非易失性存储器件及其驱动方法,以通过减少多电平单元中的每个电平上的多个复位电流的分布来确保稳定的器件操作。 构成:将第一复位电压施加到单元存储单元,并读取当前复位电流(S11)。 将当前复位电流与先前循环的设定电流进行比较(S16)。 如果当前复位电流和先前设定电流之间的差小于预设值,则向单元存储单元施加第二复位电压(S21)。 如果当前复位电流和先前设定电流之间的差异大于预设值,则将设定电压施加到单元存储单元,并将单元存储单元单元切换到设定状态,然后施加第一复位电压 再次。 (附图标记)(AA)开始; (BB,EE,GG,JJ)否; (CC)I_RESET <第一下限; (DD,II)是; (FF)I_RESET>第一上限; (HH)I I_RESET - I_SET I>第二上限; (KK)I I_RESET - I_SET I <第二下限; (LL)结束; (S10)向单元施加V_RESET的步骤; (S11)向单元读取I_RESET的步骤; (S12)确定单元电平的步骤; (S13)更改V_RESET条件; (S14)将更改的V_RESET应用于单元; (S15)应用V_SET; (S16)比较当前I_RESET和之前的I_SET的步骤; (S17)添加V_RESET; (S18,S20)检查I_RESET; (S19)添加V_SET + V_RESET; (S21)将V_SET应用于单位单元的步骤; (S22)读取单元的I_SET的步骤