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    • 15. 发明公开
    • 불순물 도핑 장치 및 이를 이용한 불순물 도핑 방법
    • 使用它的污染物和掺杂方法的装置
    • KR1020080037248A
    • 2008-04-30
    • KR1020060104066
    • 2006-10-25
    • 삼성전자주식회사
    • 김덕회이청
    • H01L21/3065
    • H01J37/3171H01L21/2654
    • An impurity doping apparatus and an impurity doping method using the same are provided to improve doping purity of impurities by preventing impurity elements of a previous impurity doping process from being remained. An impurity doping apparatus comprises a chamber, a measuring unit(80), and a control unit(90). Predetermined gases are supplied to the reaction chamber to produce plasma therein according to an applied power source. Ions of the plasma are accelerated to a substrate and are injected into the chamber. The measuring unit measures the ions of the plasma accelerated in the chamber. The control unit receives a value measured by the measuring unit and controls a supply amount of the gases supplied to the chamber. The chamber includes a plasma chamber(10), a process chamber(20), and an acceleration electrode(30). The plasma is produced in the plasma chamber. The process chamber communicates with the plasma chamber, and the substrate is positioned on the process chamber. The acceleration electrode is provided between the plasma chamber and the process chamber.
    • 提供一种杂质掺杂装置和使用其的杂质掺杂方法,以通过防止先前的杂质掺杂工艺的杂质元素残留来提高杂质的掺杂纯度。 杂质掺杂装置包括室,测量单元(80)和控制单元(90)。 根据施加的电源将预定气体供应到反应室以产生等离子体。 将等离子体的离子加速到衬底并注入腔室。 测量单元测量在室中加速的等离子体的离子。 控制单元接收由测量单元测量的值,并控制供应到室的气体的供应量。 该室包括等离子体室(10),处理室(20)和加速电极(30)。 等离子体在等离子体室中产生。 处理室与等离子体室连通,并且基板位于处理室上。 加速电极设置在等离子体室和处理室之间。
    • 16. 发明公开
    • 복합 기판 및 복합 기판의 제조 방법
    • 复合材料基板和复合材料基板制造方法
    • KR20180033153A
    • 2018-04-02
    • KR20180032733
    • 2018-03-21
    • H01L33/00H01L21/28H01L21/304H01L21/768H01L21/78
    • H01L21/02002H01L21/2654H01L21/76254H01L33/007H01L2924/0002H01S5/0206H01S5/32341H01L2924/00
    • 본발명은, 13족질화물을포함하는제1 기판과, 세라믹스를포함하는제2 기판을접합시킨복합기판에대해, 방열성을좋게하고제조시의프로세스를간단하게하는것을목적으로한다. 세라믹스를포함하는제2 기판(12)의표면(12a)에금속막(23)을형성하고(c), 이금속막(23)을통해 13족질화물을포함하는제1 기판(21)과제2 기판(12)을접합한다(d). 금속막(23)은일반적으로산화막에비하여열전도율이높기때문에, 이렇게함으로써산화막을통해제1 기판(21)과제2 기판(12)을접합한경우에비하여방열성이좋은복합기판(10)을얻을수 있다. 또한, 산화막을이용하지않기때문에외측확산의공정이필요없게되어프로세스가간단해진다.
    • 在由陶瓷构成的第二基板的至少一个表面上形成金属膜(步骤c),并且由氮化
      物组成的第一基板通过金属膜与第二基板接合(步骤d)。 由于金属膜通常具有比氧化物膜更高的导热率,因此与通过氧化物膜将第一基板结合到第二基板的情况相比,可以制造具有高散热性的复合基板。 另外,由于不使用氧化膜,所以不需要外扩散步骤,从而简化了工艺。
    • 18. 发明公开
    • 스트레인드 영역을 갖는 FinFET 디바이스
    • 具有应变区域的FINFET器件
    • KR1020130103279A
    • 2013-09-23
    • KR1020120104670
    • 2012-09-20
    • 타이완 세미콘덕터 매뉴팩쳐링 컴퍼니 리미티드
    • 리씅린옌펭치앙흥리예치치에
    • H01L21/336H01L29/78
    • H01L21/265H01L21/26506H01L21/2654H01L21/2658H01L21/26586H01L21/324H01L29/1054H01L29/66545H01L29/66795H01L29/7847
    • PURPOSE: A FinFET device with a strained region is provided to improve the performance of a transistor with carrier mobility by providing a tensile strain to a channel region. CONSTITUTION: A semiconductor substrate is provided (202). An injection process is performed (204). A buffer layer is formed on the semiconductor substrate (206). A stress film is formed on the semiconductor substrate (208). A stress induction or transmission process is performed (210). A stress film and/or a buffer layer are separated from the semiconductor substrate (212). A junction is formed by performing source and drain injection processes (214). [Reference numerals] (202) Semiconductor substrate is provided; (204) Injection process is performed; (206) Buffer layer is formed on the semiconductor substrate; (208) Stress film is formed on the semiconductor substrate; (210) Stress induction process is performed; (212) Stress film and a buffer layer are separated from the semiconductor substrate; (214) Junction is formed by performing source and drain injection processes
    • 目的:提供具有应变区域的FinFET器件,通过向沟道区域提供拉伸应变来改善具有载流子迁移率的晶体管的性能。 构成:提供半导体衬底(202)。 执行注射过程(204)。 在半导体衬底(206)上形成缓冲层。 在半导体衬底(208)上形成应力膜。 执行应力感应或传输过程(210)。 应力膜和/或缓冲层与半导体衬底(212)分离。 通过进行源极和漏极注入工艺(214)形成结。 (附图标记)(202)提供半导体基板; (204)进行注射处理; (206)在半导体衬底上形成缓冲层; (208)在半导体基板上形成应力膜; (210)进行应力感应处理; (212)应力膜和缓冲层与半导体衬底分离; (214)通过进行源极和漏极注入工艺形成结