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    • 10. 发明公开
    • Atomic element doped semi-conductor injection laser fabricated by using ion implantation and epitaxial growth on the implanted surface
    • 通过离子注入装置和由植入的表面上进行外延生长产生的并且掺杂有原子注入式激光器。
    • EP0470372A2
    • 1992-02-12
    • EP91111236.5
    • 1991-07-05
    • Hewlett-Packard Company
    • Wang, Shih-YuanTan, Michael R.T.
    • H01L33/00H01S3/19
    • H01S5/305H01S5/3068Y10S148/095
    • A semiconductor laser diode includes a first buffer layer (14), a second buffer layer (18') and an active layer (16) sandwiched between the two buffer layers. The active layer contains dopant ions where the dopant ions are such that energy transfer between the unimplanted material in the active layer and the dopant ions implanted causes lasing action substantially at a single frequency characteristic of the dopant ions. The two buffer layers confine light emitted by the active layer. According to one aspect of the invention, the second buffer layer is grown epitaxially on the active layer. According to one aspect of the invention, the second buffer layer is grown epitaxially on the active layer. In the preferred embodiment, the structure is made by first growing a thin second buffer layer (18)_ epitaxially on the active layer. The dopant ions are then implanted into the active layer through the thin second buffer layer (18). The structure us heated to a high temperature to anneal the structure and to activate the dopants. The second buffer layer is then further grown to make it thicker so as to be more effective in confining the light emission in the active layer. According to another aspect of the invention, the dopant ions are titanium ions.
    • 一种半导体激光二极管包括第一缓冲层(14),第二缓冲层(18“),并在夹在两个缓冲层之间的活性层(16)。 活性层中含有的掺杂剂离子,其中该掺杂剂离子被检查所做的未注入的材料之间的有源层和注入导致在掺杂剂离子的单个频率特性基本上激光作用的掺杂剂离子的能量转移。 在两个缓冲层限制由有源层发射的光。 。根据本发明的一个方面,所述第二缓冲层上外延生长的有源层上。 。根据本发明的一个方面,所述第二缓冲层上外延生长的有源层上。 在优选实施例中,结构是由第一有源层上生长薄的第二缓冲层(18)_外延制成。 掺杂离子然后通过薄的第二缓冲层(18)注入到有源层。 结构我们加热至高温退火的结构和以激活掺杂剂。 然后,第二缓冲层生长。此外,使其较厚,以便在活性层围发光更有效。 。根据本发明的另一个方面,所述的掺杂离子为钛离子。