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    • 2. 发明申请
    • CONTROLLED FLUID FLOW FOR CLEANING AN OPTICAL ELEMENT
    • 用于清洁光学元件的控制流体流
    • WO2017023950A2
    • 2017-02-09
    • PCT/US2016/045200
    • 2016-08-02
    • ASML NETHERLANDS B.V.
    • DE DEA, SilviaXIA, ChunguangWILSON, Gregory, JamesVERHOFF, Brandon, Wilson
    • G03F7/20
    • B08B5/02G01F1/00G03F7/70925G03F7/70933
    • A fluid is directed toward a surface of an optical element based on a first flow pattern, the surface of the optica! element including debris and the fluid directed based on the first flow pattern moving at least some of the debris to a first stagnation region at the surface of ths opficai eiement; and the fluid is directed toward the optical element based on a second flow pattern, the fluid directed based on the second flow pattern moving at least some of the debris to a second stagnation region on the surface of the optical element, the second stagnation region and the first stagnation region being different locations at the surface of the optical element. Directing the fluid toward the surface of the optical element based on the second flow pattern removes at least some of the debris from the first stagnation region.
    • 基于第一流动模式将流体指向光学元件的表面,光学元件的表面 包括碎屑和基于第一流动图案引导的流体将至少一些碎片移动到第一流动区域的第一停滞区域; 并且基于第二流动图案将流体引向光学元件,基于第二流动图案指向的流体将至少一些碎片移动到光学元件的表面上的第二停滞区域,第二停滞区域和 第一停滞区域是在光学元件的表面处不同的位置。 基于第二流动模式将流体引导到光学元件的表面去除了来自第一停滞区域的至少一些碎屑。
    • 5. 发明申请
    • RADIATION SOURCE-COLLECTOR AND METHOD FOR MANUFACTURE
    • 辐射源收集器及其制造方法
    • WO2016058822A1
    • 2016-04-21
    • PCT/EP2015/072376
    • 2015-09-29
    • ASML NETHERLANDS B.V.
    • VAN ZWOL, Pieter-JanKUZNETSOV, Alexey, SergeevichOSORIO OLIVEROS, EdgarSTEVENS, Lucas
    • G21K1/06G03F7/20
    • G21K1/062G03F7/70316G03F7/70916G03F7/70933G03F7/70958
    • A multilayer optics is configured for reflection of radiation having a wavelength λ, the multilayer optics comprising a multilayer stack (300) of alternating layer pairs, wherein each pair thereof comprises a first/second layer of thickness d1/d2, wherein a periodic length p=d1+d2 of each pair of alternating layers satisfies: m λ = 2 p sinΘ, wherein m = 1, 2, 3, etc. is an integer representing the order of the Bragg diffraction peak and Θ is the angle between an incident radiation and a scattering plane of the multilayer optics; a protective region (310) comprising pairs of alternating protective layers, each pair thereof comprising a first/second protective layer of thickness ds1/ds2, wherein a periodic length ps=ds1+ds2 of each pair of alternating protective layers satisfies: m λ = 2 ps sinΘ and ps = p N, wherein N is an integer equal or larger than 2. The multilayer mirror may optionally be provided with a capping layer (320). There is further disclosed an apparatus for extreme ultraviolet lithography comprising: a vacuum container comprising an optical element having an optically active surface, a gas supply system comprising a source of an anti-blistering gaseous mixture, an exhauster configured to exhaust gas in said vacuum container; wherein the gas supply system is arranged to provide the anti-blistering gaseous mixture at the optically active surface of the optical element, and wherein the anti-blistering gaseous mixture comprises an oxygen containing gas compound at a partial pressure ranging from 5e-8 to 1e-4 mbar.
    • 多层光学器件被配置用于反射具有波长λ的辐射,所述多层光学器件包括交替层对的多层堆叠(300),其中每对包括厚度为d1 / d2的第一/第二层,其中周期长度p 每对交替层的= d1 + d2满足:mλ= 2 psinθ,其中m = 1,2,3等是表示布拉格衍射峰的顺序的整数,Θ是入射辐射 和多层光学器件的散射面; 包括交替保护层对的保护区域(310),每对保护层包括厚度为ds1 / ds2的第一/第二保护层,其中每对交替保护层的周期长度ps = ds1 + ds2满足:mλ= 2pssinΘ和ps = p N,其中N是等于或大于2的整数。多层反射镜可以可选地设置有覆盖层(320)。 还公开了一种用于极紫外光刻的装置,包括:真空容器,其包括具有光学活性表面的光学元件,气体供应系统,其包括防起泡气体混合物源,排气器,其构造成在所述真空容器 ; 其中所述气体供应系统被布置成在所述光学元件的光学活性表面处提供所述防起泡气体混合物,并且其中所述防起泡气体混合物包含分压为5e-8至1e的含氧气体化合物 -4毫巴
    • 9. 发明申请
    • APPARATUS FOR MEASUREMENT OF SUBSTRATES
    • 测量基板的装置
    • WO2008122335A2
    • 2008-10-16
    • PCT/EP2008001817
    • 2008-03-07
    • ZEISS CARL SMS GMBHSTROESSNER ULRICHKLOSE GERDHOF ALBRECHTFREY MONIKA
    • STROESSNER ULRICHKLOSE GERDHOF ALBRECHTFREY MONIKA
    • G03F7/20G03F1/00
    • G03F7/70933G03F1/84G03F7/70775G03F7/70875
    • The invention relates to an apparatus for measurement of substrates, comprising a carrier (2) for receiving the substrate to be measured; a measurement objective which images onto a detector a portion of the substrate held by the carrier (2); a measurement device by which the position of the carrier (2) is imaged onto a detector (12); a measurement device by which the position of the carrier (2) holding the substrate is determined relative to the measurement objective, with the measurement device comprising at least one laser interferometer (5) for position determination; a first flushing device which passes a first flushing medium in a laminar flow through the apparatus for generating a constant measurement atmosphere, as well as an adjustment device by which the carrier (2) can be moved relative to the measurement objective. In such an apparatus, a second flushing device is provided which passes a second flushing medium through the region of the measurement device in which the at least one laser interferometer (5) is located.
    • 本发明涉及一种用于测量衬底的设备,包括用于接收待测衬底的载体(2) 测量目标,其将由载体(2)保持的基板的一部分成像到检测器上; 测量装置,通过该测量装置将载体(2)的位置成像到检测器(12)上; 测量装置,通过该测量装置,相对于测量目标确定保持基板的载体(2)的位置,测量装置包括用于位置确定的至少一个激光干涉仪(5); 第一冲洗装置,其使层流中的第一冲洗介质通过用于产生恒定测量气氛的装置,以及调节装置,通过该调节装置,载体(2)能够相对于测量目标移动。 在这种装置中,提供第二冲洗装置,其通过第二冲洗介质穿过至少一个激光干涉仪(5)所在的测量装置的区域。
    • 10. 发明申请
    • PROJECTION EXPOSURE METHOD AND PROJECTION EXPOSURE SYSTEM
    • 投影曝光方法和投影曝光系统
    • WO2008037384A3
    • 2008-06-26
    • PCT/EP2007008145
    • 2007-09-19
    • ZEISS CARL SMT AGKALLER JULIANGRUNER TORALF
    • KALLER JULIANGRUNER TORALF
    • G03F7/20
    • G03F7/70933G03F7/70191G03F7/70575G03F7/70941
    • In a projection exposure method primary radiation having a center wavelength ? is generated and guided through an illumination system along an illumination path and through a projection system along a projection path. The center wavelength is varied within a wavelength variation range ?? having a lower limit ? MIN = ? and an upper limit ? MAX > ?. A specific absorption coefficient k(?) of at least one gaseous absorbent species selected from the group consisting of oxygen (O 2 ), ozone (O 3 ) and water vapor (H 2 O) present in at least one gas-filled space along at least one of the illumination path and the projection path varies between a minimum absorption coefficient k MIN and a maximum absorption coefficient k MAX within the wavelength variation range such that an absorption ratio (k MAX / k MIN ) exceeds 10. A concentration of the absorbent species within the gas-filled space is controlled such that an overall absorption variation effected by the absorbent species for all rays running along different ray paths towards the image field is maintained below a predetermined absorption variation threshold value.
    • 在投影曝光方法中,具有中心波长λ 沿着照明路径被产生并引导通过照明系统,并沿着投影路径通过投影系统。 中心波长在波长变化范围内变化 具有下限? =? 和上限?最大值? 至少一种选自氧(O 2 O 3),臭氧(O 3 3)和水蒸汽(O 3))的气态吸收物质的比吸收系数k(ω) 沿着照明路径和投影路径中的至少一个存在于至少一个气体填充空间中的H 2 O 2 O在最小吸收系数k MIN和最大值之间变化 吸收系数k max max在波长变化范围内,使得吸收比(k max / k MIN MIN)超过10。吸收剂的浓度 控制气体填充空间内的物质,使得沿着沿着不同射线路径朝向图像场行进的所有射线的吸收物质的整体吸收变化保持在预定的吸收变化阈值以下。