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    • 3. 发明申请
    • READ OPERATION OF CACHE MRAM USING A REFERENCE WORD LINE
    • 使用参考线读取高速缓存MRAM的操作
    • WO2016048662A1
    • 2016-03-31
    • PCT/US2015/049229
    • 2015-09-09
    • QUALCOMM INCORPORATED
    • KIM, TaehyunKIM, SungryulKIM, Jung PillDONG, Xiangyu
    • G11C11/16G06F12/08
    • G11C11/1673G11C11/161G11C11/1693
    • Systems and methods relate to a read operation on a magnetoresistive random access memory (MRAM) coupled with a tag array, the method comprising: receiving an index and a tag; based on the index, accessing n memory locations in the tag array and for each of the accessed n memory locations comparing data stored therein with the received tag; based on the index, activating a dummy word line in the MRAM; after the activation of the dummy word line, generating a hit signal associated with one of the n memory locations if the comparing indicates a match for said one of the n memory locations; in response to the activation of the dummy word line obtaining a settled reference voltage for reading MRAM bit cells of the MRAM designated by the index; among the MRAM cells designated by the index, reading the MRAM cells having a memory location corresponding to the one of the n-memory location in the tag array providing said hit signal, the reading using the settled reference voltage.
    • 系统和方法涉及与标签阵列耦合的磁阻随机存取存储器(MRAM)上的读取操作,该方法包括:接收索引和标签; 基于所述索引,访问所述标签阵列中的n个存储器位置以及对于存储在其中的数据与所接收的标签的所访问的n个存储器单元中的每一个; 基于索引,激活MRAM中的虚拟字线; 在所述虚拟字线的激活之后,如果所述比较指示所述n个存储器位置中的所述一个存储器位置的匹配,则产生与所述n个存储器位置之一相关联的命中信号; 响应于所述伪字线的激活获得用于读取由所述索引指定的MRAM的MRAM位单元的稳定参考电压; 在由索引指定的MRAM单元中,读取具有对应于提供所述命中信号的标签阵列中的n个存储器位置之一的存储器位置的MRAM单元,该读取使用稳定的参考电压。
    • 4. 发明申请
    • METHOD AND APPARATUS FOR GENERATING A REFERENCE FOR USE WITH A MAGNETIC TUNNEL JUNCTION
    • 用于产生用于具有磁性隧道结的参考的方法和装置
    • WO2015163979A1
    • 2015-10-29
    • PCT/US2015/018288
    • 2015-03-02
    • QUALCOMM INCORPORATED
    • KIM, SungryulKIM, TaehyunKIM, Jung Pill
    • G11C7/14G11C11/16
    • G11C11/1673G11C7/14G11C11/1659
    • Methods and apparatus for generating a reference for use with a magnetic tunnel junction are provided. In an example, provided is a magnetoresistive read only memory including a magnetic tunnel junction (MTJ) storage element, a sense amplifier having a first input coupled to the MTJ storage element, and a reference resistance device coupled to a second input of the sense amplifier. The reference resistance device includes a plurality of groups of at least two reference MTJ devices. Each reference MTJ device in a respective group is coupled in parallel with each other reference MTJ device in the respective group. Each group is coupled in series with the other groups. This arrangement advantageously mitigates read disturbances and reference level variations, while saving power, reducing reference resistance device area, and increasing read speed.
    • 提供了用于产生用于磁性隧道结的参考的方法和装置。 在一个例子中,提供了一种包括磁性隧道结(MTJ)存储元件的磁阻只读存储器,具有耦合到MTJ存储元件的第一输入的读出放大器和耦合到读出放大器的第二输入的参考电阻器件 。 参考电阻装置包括多组至少两个参考MTJ装置。 相应组中的每个参考MTJ设备与相应组中的每个其他参考MTJ设备并联耦合。 每个组与其他组串联。 这种布置有利于减轻读取干扰和参考电平变化,同时节省功率,减少参考电阻器件面积并增加读取速度。
    • 5. 发明申请
    • BIT RECOVERY SYSTEM
    • 位恢复系统
    • WO2015077055A1
    • 2015-05-28
    • PCT/US2014/064574
    • 2014-11-07
    • QUALCOMM INCORPORATED
    • KIM, TaehyunKIM, Jung PillKIM, Sungryul
    • G06F11/10G06F12/00
    • G06F11/102G06F11/1064G06F12/00
    • A particular device includes a resistance-based memory device, a tag random-access memory (RAM), and a bit recovery (BR) memory. The resistance-based memory device is configured to store a data value and error-correcting code (ECC) data associated with the data value. The tag RAM is configured to store information that maps memory addresses of a main memory to wordlines of a cache memory, where the cache memory includes the resistance-based memory device. The BR memory is configured to store additional error correction data associated with the data value, where the BR memory corresponds to a volatile memory device.
    • 特定设备包括基于电阻的存储器件,标签随机存取存储器(RAM)和位恢复(BR)存储器。 基于电阻的存储器件被配置为存储与数据值相关联的数据值和纠错码(ECC)数据。 标签RAM被配置为存储将主存储器的存储器地址映射到高速缓冲存储器的字线的信息,其中高速缓冲存储器包括基于电阻的存储器件。 BR存储器被配置为存储与数据值相关联的附加纠错数据,其中BR存储器对应于易失性存储器设备。