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    • 9. 发明申请
    • LATCHING CIRCUIT
    • 锁定电路
    • WO2012015754A2
    • 2012-02-02
    • PCT/US2011045222
    • 2011-07-25
    • QUALCOMM INCJUNG SEONG-OOKRYU KYUNGHOKIM JISUKIM JUNG PILLKANG SEUNG H
    • JUNG SEONG-OOKRYU KYUNGHOKIM JISUKIM JUNG PILLKANG SEUNG H
    • G11C11/16
    • G11C11/1675G11C11/1659G11C11/1673G11C13/0002G11C14/009
    • A non-volatile latch circuit includes a pair of cross-coupled inverters, a pair of resistance-based memory elements, and write circuitry configured to write data to the pair of resistance-based memory elements. The pair of resistance-based memory elements is isolated from the pair of cross-coupled inverters during a latching operation. A sensing circuit includes a first current path that includes a first resistance-based memory element and an output of the sensing circuit. The sensing circuit includes a second current path to reduce current flow through the first resistance-based memory element at a first operating point of the sensing circuit. The sensing circuit may also include an n-type metal-oxide-semiconductor (NMOS) transistor to provide a step down supply voltage to the first current path.
    • 非易失性锁存电路包括一对交叉耦合的反相器,一对基于电阻的存储器元件和被配置为将数据写入到该对基于电阻的存储器元件的写入电路。 在锁定操作期间,一对基于电阻的存储器元件与一对交叉耦合的反相器隔离。 感测电路包括第一电流路径,其包括第一基于电阻的存储元件和感测电路的输出。 感测电路包括第二电流路径,以减小在感测电路的第一工作点处通过第一基于电阻的存储元件的电流。 感测电路还可以包括n型金属氧化物半导体(NMOS)晶体管,以向第一电流路径提供降压电源电压。