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1. 发明申请

WO2020112554A1 SURFACE CONTAMINANT REDUCTION IN CONTROLLED ENVIRONMENTS 审中-公开
公开(公告)号：WO2020112554A1
公开(公告)日：2020-06-04
申请号：PCT/US2019/062821
申请日：2019-11-22
申请人： ZYVEX LABS, LLC , THE BOARD OF TRUSTEES OF THE UNIVERSITY OF ILLINOIS
发明人： OWEN, James , BALLARD, Joshua Brendan , LYDING, Joseph W. , RANDALL, John
IPC分类号： C23C22/00 , C23C26/00 , H01L21/475
摘要： A method for reducing the amount of mobile surface molecules present on a substrate surface includes providing a substrate having an area of interest, where the substrate is disposed within a controlled environment (e.g., a UHV environment). In some embodiments, a mask is positioned in a first position over the area of interest. Thereafter, a first deposition of a reactive material from a reactive material source is performed onto a first substrate region. The mask, while in the first position, blocks deposition of the reactive material within the area of interest. The mask may then positioned in a second position over the area of interest. In some embodiments, a second deposition of the reactive material from the reactive material source is performed to circumscribe the area of interest with the reactive material. In various embodiments, mobile surface molecules are captured using the deposited reactive material.

2. 发明申请

WO2018053483A1 METHODS, DEVICES, AND SYSTEMS FOR SCANNING TUNNELING MICROSCOPY CONTROL SYSTEM DESIGN 审中-公开
标题翻译：用于扫描隧道显微镜控制系统设计的方法，装置和系统
公开(公告)号：WO2018053483A1
公开(公告)日：2018-03-22
申请号：PCT/US2017/052213
申请日：2017-09-19
申请人： ZYVEX LABS, LLC
发明人： MOHEIMANI, Seyed Omid Reza , TAJADDODIANFAR, Farid , FUCHS, Ehud , RANDALL, John , BALLARD, Joshua , OWEN, James
IPC分类号： G01Q20/00 , G01Q10/00 , G01Q60/10 , G01Q80/00 , G21K5/08 , G21K5/10
摘要： Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.
摘要翻译：提供了用于控制扫描隧道显微镜系统的方法，设备和系统。在一些实施例中，本公开的方法，设备和系统利用包括在或添加到扫描隧道显微镜（STM）中的控制系统来接收表征隧道扫描显微镜系统的尖端与样本之间的隧穿电流的数据，以实时估计与扫描隧道显微镜系统相关联的功函数，并且由控制系统基于估计的功函数来调整尖端的位置。这里描述了相关的系统。

3. 发明申请

WO2014197083A3 METHODS, DEVICES, AND SYSTEMS FOR FORMING ATOMICALLY PRECISE STRUCTURES 审中-公开
公开(公告)号：WO2014197083A3
公开(公告)日：2014-12-11
申请号：PCT/US2014/027895
申请日：2014-03-14
申请人： ZYVEX LABS, LLC
发明人： RANDALL, John Neal , VON EHR, James R. , OWEN, James H.G. , BALLARD, Joshua B. , FUCHS, Ehud
IPC分类号： H01J37/30
摘要： Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) to remove portions of a monolayer of atoms or molecules from a crystalline surface to form atomically precise structures. The STM is utilized to both image the sample and remove the desired portions of the monolayer of atoms or molecules. In some instances, the lattice structure of the crystalline surface is utilized as a coordinate system by a control system of the STM to facilitate the automated removal of specific atoms or molecules from the crystalline surface.

4. 发明申请

WO2014150561A1 THREE-DIMENSIONAL MULTI-ELECTRODE ARRAY 审中-公开
标题翻译：三维多电极阵列
公开(公告)号：WO2014150561A1
公开(公告)日：2014-09-25
申请号：PCT/US2014/023616
申请日：2014-03-11
申请人： ZYVEX LABS, LLC
发明人： SAINI, Rahul , RANDALL, John Neal
IPC分类号： A61N1/04 , A61N1/05 , A61B5/04
CPC分类号： A61N1/0543 , A61B5/04001 , A61B5/0492 , A61B5/0496 , A61B5/6846 , A61B2562/0209 , A61B2562/046 , A61B2562/125 , A61B2562/166 , A61N1/05 , B81B3/0089 , B81B2203/04 , Y10T29/49117
摘要： A multi-electrode array with individually isolated electrodes each configurable for a target-containing carrier and a method for fabricating the array are disclosed. In an exemplary embodiment, the array includes a substrate; and a plurality of electrodes disposed on the substrate. Each electrode of the plurality of electrodes has a conductive tip-end and an insulated remainder. A first electrode of the plurality of electrodes has a first configuration selected to bring a conductive tip end of the first electrode in proximity to a first target structure, and a second electrode of the plurality of electrodes has a second configuration selected to bring a conductive tip end of the second electrode in proximity to a second target structure. The first configuration and the second configuration are different. A first contact of the plurality of contacts may be electrically coupled to the first electrode through the substrate.
摘要翻译：公开了具有各自独立电极的多电极阵列，每个独立的电极可配置用于含靶载体和制造该阵列的方法。在示例性实施例中，阵列包括衬底; 以及设置在基板上的多个电极。多个电极的每个电极具有导电尖端和绝缘的剩余部分。多个电极的第一电极具有被选择为使第一电极的导电尖端靠近第一目标结构的第一配置，并且多个电极中的第二电极具有选择为使导电尖端靠近第二目标结构的第二电极的端部。第一配置和第二配置是不同的。多个触点的第一触点可以通过衬底电耦合到第一电极。

5. 发明申请

WO2018145034A1 IMPLANTABLE NERVE TRANSDUCER 审中-公开
公开(公告)号：WO2018145034A1
公开(公告)日：2018-08-09
申请号：PCT/US2018/016917
申请日：2018-02-05
申请人： ZYVEX LABS, LLC
发明人： SAINI, Rahul
IPC分类号： A61N1/05 , A61N1/372 , H01B5/14 , H01B1/04
摘要： Implantable nerve transducers are provided herein, along with methods of fabricated such implantable nerve transducers. An exemplary implantable nerve transducer includes a plurality of semiconductor structures protruding from an exterior surface provided by a substrate and a plurality of conductors extending from the exterior surface of the substrate to an interior surface of the substrate and within a plurality of openings in the substrate. Each conductor is electrically coupled to one of the semiconductor structures. The exemplary implantable nerve transducer further includes one or more electronic components electrically coupled to the semiconductor structures by the conductors and a cap bonded to the substrate to provide a sealed chamber. The sealed chamber contains the one or more electronic components.

6. 发明申请

WO2014197083A2 METHODS, DEVICES, AND SYSTEMS FOR FORMING ATOMICALLY PRECISE STRUCTURES 审中-公开
标题翻译：用于形成原始精密结构的方法，装置和系统
公开(公告)号：WO2014197083A2
公开(公告)日：2014-12-11
申请号：PCT/US2014027895
申请日：2014-03-14
申请人： ZYVEX LABS LLC
发明人： RANDALL JOHN NEAL , VON EHR JAMES R , OWEN JAMES H G , BALLARD JOSHUA B , FUCHS EHUD
IPC分类号： H01J37/30
CPC分类号： G01Q20/00 , B82B3/0038 , G01Q10/00 , G01Q60/10 , G01Q80/00 , H01J2237/31759
摘要： Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) to remove portions of a monolayer of atoms or molecules from a crystalline surface to form atomically precise structures. The STM is utilized to both image the sample and remove the desired portions of the monolayer of atoms or molecules. In some instances, the lattice structure of the crystalline surface is utilized as a coordinate system by a control system of the STM to facilitate the automated removal of specific atoms or molecules from the crystalline surface.
摘要翻译：提供了用于形成原子精确结构的方法，装置和系统。在一些实施例中，本公开的方法，装置和系统利用扫描隧道显微镜（STM）从晶体表面去除单层原子或分子的部分以形成原子精确的结构。 STM用于对样品进行成像和去除单层原子或分子的所需部分。在一些情况下，通过STM的控制系统将结晶表面的晶格结构用作坐标系，以促进特定原子或分子从结晶表面的自动去除。

7. 发明申请

WO2020086700A1 DEPASSIVATION LITHOGRAPHY BY SCANNING TUNNELING MICROSCOPY 审中-公开
公开(公告)号：WO2020086700A1
公开(公告)日：2020-04-30
申请号：PCT/US2019/057632
申请日：2019-10-23
申请人： ZYVEX LABS, LLC
发明人： RANDALL, John , FUCHS, Ehud , OWEN, James H.G. , LAKE, Joseph
IPC分类号： G03F7/20 , G03F9/00 , H01L21/027
摘要： Methods, devices, and systems for forming atomically precise structures are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a scanning tunneling microscope (STM) system to receive a sample having a surface to be patterned. The system positions a conductive tip over a pixel region of the surface. While the conductive tip remains laterally fixed relative to the surface, the system applies a bias voltage between the conductive tip and the surface such that a current between the conductive tip and the surface removes at least one atom from the pixel region. The system stops applying the voltage and current when it senses the removal of the at least one atom. The system then verifies that the at least one atom has been removed from the pixel region.

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