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    • 1. 发明申请
    • PROGRESSIVE UNPLUGGING MULTI-CARDS BODY
    • 积极发展的多媒体体系
    • WO2006016257A1
    • 2006-02-16
    • PCT/IB2005/002377
    • 2005-08-08
    • AXALTO SAFROGER, AlexisGROENINCK, DenisLE LOC'H, AlainNEROT, DorothéeREIGNOUX, YvesROUSSEL, FrançoisPROVOST, Stéphane
    • FROGER, AlexisGROENINCK, DenisLE LOC'H, AlainNEROT, DorothéeREIGNOUX, YvesROUSSEL, FrançoisPROVOST, Stéphane
    • G06K19/077
    • G06K19/07739G06K19/077G06K19/07728G06K19/07745H01L2924/0002Y10T29/49117H01L2924/00
    • A card body comprises a first card body (ID-1 card 1), a second card body (plug-in card 2) and a third card body (mini card 3). The first card body has a first shape (ID-1 shape). The second card body comprises a second shape (plug-in shape). The first card body encompasses the second card body. The third card body comprises a third shape (mini shape). The second card body encompasses the third card body. The third card body has a cavity for receiving an electronic module. A first boundary separates the first shape (ID-1 shape) from the second shape (plug-in shape), and comprises a first number of apertures (5, 6, 7, 17, 18) and a first number of notches (19 and 20) defining a first mechanical inter-card body coupling strength (link between ID-1 card 1 and plug-in card 2). A second boundary separates the second shape (plug-in shape) from the third shape (mini shape), and comprises a second number of apertures (21) and a second number of notches (11, 12, 13, 14, 15, 16) defining a second mechanical inter-card body coupling strength (link between plug-in card 2 and mini card 3). A cumulated length of the first number of apertures (5, 6, 7, 17, 18) is greater than a cumulated length of the second number of apertures (21) and a cumulated length of the first number of notches (19 and 20) is lesser than a cumulated length of the second number of notches (11, 12, 13, 14, 15, 16) so that the second mechanical coupling strength is greater than the first mechanical coupling strength.
    • 卡体包括第一卡体(ID-1卡1),第二卡体(插卡2)和第三卡体(小卡3)。 第一卡体具有第一形状(ID-1形状)。 第二卡体包括第二形状(插件形状)。 第一个卡体包含第二个卡体。 第三卡体包括第三形状(迷你形状)。 第二个卡体包含第三个卡体。 第三卡体具有用于接收电子模块的空腔。 第一边界将第一形状(ID-1形状)与第二形状(插入形状)分开,并且包括第一数量的孔(5,6,7,17​​,18)和第一数量的凹口(19 和20)限定第一机械卡间体耦合强度(ID-1卡1和插入卡2之间的链接)。 第二边界将第二形状(插入形状)与第三形状(迷你形状)分开,并且包括第二数量的孔(21)和第二数量的凹口(11,12,13,14,15,16) )定义第二机械卡间体耦合强度(插入卡2和迷你卡3之间的链接)。 第一数量的孔(5,6,7,17​​,18)的累积长度大于第二数量的孔(21)的累积长度和第一数量的凹口(19和20)的累积长度, 小于第二数量的凹口(11,12,13,14,15,16)的累积长度,使得第二机械耦合强度大于第一机械耦合强度。
    • 3. 发明申请
    • DOUBLE-SIDED CHIP CARD MODULE WITH SINGLE-SIDE TESTING CAPABILITIES
    • 具有单面测试能力的双面芯片卡模块
    • WO2006008647A1
    • 2006-01-26
    • PCT/IB2005/002211
    • 2005-07-11
    • AXALTO SAREIGNOUX, YvesDELOCHE, ManuelTHEVENOT, BenoîtNEROT, DorothéeGROENINCK, DenisBREL, Marie-Cécile
    • REIGNOUX, YvesDELOCHE, ManuelTHEVENOT, BenoîtNEROT, DorothéeGROENINCK, DenisBREL, Marie-Cécile
    • G06K19/077
    • G06K19/077
    • The chip card module, when in an intermediate condition, comprises: a double-sided dielectric layer (10) with conductive patterns formed on both sides; a chip (12) supported on the backside (14) of said dielectric layer; first contact pads (20) arranged on the frontside (16) of said dielectric layer; and second contact pads (24) arranged on the backside (14) of said dielectric layer. The chip (12) and first (20) and second (24) contact pads are located within a peripheral cutout line (22) adapted to define the outer shape of the module in a further manufacturing condition after punching the dielectric layer along said line. A plurality of via holes (30) are formed through the dielectric layer at respective hole locations arranged beyond the cutout line, along with corresponding test pads (26) each formed on the frontside (16) so as to extend over a respective via hole and connected to a respective first contact pad (20). This enables simultaneous electrical access from the backside (14), in particular for test probes (32, 34), both i) directly to the second contact pads (24) and ii) indirectly to the first contact pads (20) by way of the test pads (26) being accessed at the bottom of the via holes (30).
    • 当处于中间状态时,芯片卡模块包括:在两侧形成有导电图案的双面电介质层(10); 支撑在所述电介质层的背面(14)上的芯片(12); 布置在所述电介质层的前侧(16)上的第一接触焊盘(20) 和布置在所述电介质层的背面(14)上的第二接触焊盘(24)。 芯片(12)和第一(20)和第二(24)接触焊盘位于外围切口线(22)内,适于在沿着所述线冲压电介质层之后的另一制造条件中限定模块的外形。 多个通孔(30)通过布置在切口线以外的相应孔位置处的介电层形成,以及各自形成在前侧(16)上的相应的测试垫(26),以便在相应的通孔上延伸, 连接到相应的第一接触焊盘(20)。 这使得能够从背面(14),特别是用于测试探针(32,34)的同时电气接入,i)直接连接到第二接触焊盘(24),以及ii)通过以下方式间接地连接到第一接触焊盘(20) 所述测试焊盘(26)在所述通孔(30)的底部被访问。