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    • 1. 发明申请
    • DOUBLE-SIDED CHIP CARD MODULE WITH SINGLE-SIDE TESTING CAPABILITIES
    • 具有单面测试能力的双面芯片卡模块
    • WO2006008647A1
    • 2006-01-26
    • PCT/IB2005/002211
    • 2005-07-11
    • AXALTO SAREIGNOUX, YvesDELOCHE, ManuelTHEVENOT, BenoîtNEROT, DorothéeGROENINCK, DenisBREL, Marie-Cécile
    • REIGNOUX, YvesDELOCHE, ManuelTHEVENOT, BenoîtNEROT, DorothéeGROENINCK, DenisBREL, Marie-Cécile
    • G06K19/077
    • G06K19/077
    • The chip card module, when in an intermediate condition, comprises: a double-sided dielectric layer (10) with conductive patterns formed on both sides; a chip (12) supported on the backside (14) of said dielectric layer; first contact pads (20) arranged on the frontside (16) of said dielectric layer; and second contact pads (24) arranged on the backside (14) of said dielectric layer. The chip (12) and first (20) and second (24) contact pads are located within a peripheral cutout line (22) adapted to define the outer shape of the module in a further manufacturing condition after punching the dielectric layer along said line. A plurality of via holes (30) are formed through the dielectric layer at respective hole locations arranged beyond the cutout line, along with corresponding test pads (26) each formed on the frontside (16) so as to extend over a respective via hole and connected to a respective first contact pad (20). This enables simultaneous electrical access from the backside (14), in particular for test probes (32, 34), both i) directly to the second contact pads (24) and ii) indirectly to the first contact pads (20) by way of the test pads (26) being accessed at the bottom of the via holes (30).
    • 当处于中间状态时,芯片卡模块包括:在两侧形成有导电图案的双面电介质层(10); 支撑在所述电介质层的背面(14)上的芯片(12); 布置在所述电介质层的前侧(16)上的第一接触焊盘(20) 和布置在所述电介质层的背面(14)上的第二接触焊盘(24)。 芯片(12)和第一(20)和第二(24)接触焊盘位于外围切口线(22)内,适于在沿着所述线冲压电介质层之后的另一制造条件中限定模块的外形。 多个通孔(30)通过布置在切口线以外的相应孔位置处的介电层形成,以及各自形成在前侧(16)上的相应的测试垫(26),以便在相应的通孔上延伸, 连接到相应的第一接触焊盘(20)。 这使得能够从背面(14),特别是用于测试探针(32,34)的同时电气接入,i)直接连接到第二接触焊盘(24),以及ii)通过以下方式间接地连接到第一接触焊盘(20) 所述测试焊盘(26)在所述通孔(30)的底部被访问。