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    • 2. 发明申请
    • INTEGRATED SILICON AND III-N SEMICONDUCTOR DEVICE
    • 集成硅和III-N半导体器件
    • WO2014179797A1
    • 2014-11-06
    • PCT/US2014/036794
    • 2014-05-05
    • TEXAS INSTRUMENTS INCORPORATEDTEXAS INSTRUMENTS JAPAN LIMITED
    • TIPIRNENI, NaveenPENDHARKAR, SameerWISE, Rick, L.
    • H01L21/70H01L29/12
    • H01L21/187H01L21/76254H01L21/8258
    • An integrated silicon and III-N semiconductor device may be formed by growing III-N semiconductor material (102) on a first silicon substrate (100) having a first orientation. A second silicon substrate (106) with a second, different, orientation has a release layer (108) between a silicon device film (110) and a carrier wafer (112). The silicon device film (110) is attached to the III-N semiconductor material while the silicon device film (110) is connected to the carrier wafer (112) through the release layer (108). The carrier wafer (112) is subsequently removed from the silicon device film (110). A first plurality of components is formed in and/or on the silicon device film. A second plurality of components is formed in and/or on III-N semiconductor material in the exposed region. In an alternate process, a dielectric interlayer may be disposed between the silicon device film and the III-N semiconductor material in the integrated silicon and III-N semiconductor device.
    • 可以通过在具有第一取向的第一硅衬底(100)上生长III-N半导体材料(102)来形成集成硅和III-N半导体器件。 具有第二不同取向的第二硅衬底(106)在硅器件膜(110)和载体晶片(112)之间具有释放层(108)。 硅器件膜(110)通过隔离层(108)与硅载体晶片(112)连接,连接到III-N半导体材料。 随后从硅器件膜(110)去除载体晶片(112)。 在硅器件膜上和/或上形成第一多个部件。 在暴露区域中的III-N半导体材料中和/或上形成第二组分。 在替代方法中,可以在集成硅和III-N半导体器件中的硅器件膜和III-N半导体材料之间设置电介质中间层。
    • 4. 发明申请
    • PROCESSOR POWER MEASUREMENT
    • 处理器功率测量
    • WO2014160798A2
    • 2014-10-02
    • PCT/US2014/031904
    • 2014-03-26
    • TEXAS INSTRUMENTS INCORPORATEDTEXAS INSTRUMENTS JAPAN LIMITED
    • ALIBERTI, James, H.
    • G06F1/32
    • G06F11/24G01R31/275G01R31/28G01R31/3004G06F1/28G06F11/26
    • A system (2) can include a processing core (6) to execute machine readable instructions. The system (2) can also include a memory (8) accessible by the processor core (6). The memory (8) can include preprogrammed test data (10) that characterizes one of an impedance of a processor (3) and a current output to the processor (4) during execution of a test routine. The processor (4) can include the processing core (6) and the one of the impedance of the processor (4) and the current output to the processor (4) is based on a power measurement taken during execution of a test routine. The power measurement can be taken with a current sensor that is at least one of lossy or at least about 98% accurate.
    • 系统(2)可以包括执行机器可读指令的处理核心(6)。 系统(2)还可以包括可由处理器内核(6)访问的存储器(8)。 存储器(8)可以包括在执行测试例程期间表征处理器(3)的阻抗和到处理器(4)的电流输出中的一个的预编程测试数据(10)。 处理器(4)可以包括处理核心(6),并且处理器(4)的阻抗和输出到处理器(4)的电流中的一个是基于在执行测试例程期间获取的功率测量。 功率测量可以使用电流传感器进行测量,该电流传感器至少有一个损耗或至少约98%的准确度。
    • 5. 发明申请
    • ELECTRONIC DEVICE AND METHOD FOR TRACKING ENERGY CONSUMPTION
    • 用于跟踪能量消耗的电子设备和方法
    • WO2014138624A1
    • 2014-09-12
    • PCT/US2014/021906
    • 2014-03-07
    • TEXAS INSTRUMENTS INCORPORATEDTEXAS INSTRUMENTS DEUTSCHLAND GMBHTEXAS INSTRUMENTS JAPAN LIMITED
    • DIEWALD, HorstZIPPERER, JohannWEBER, PeterBRAUCHLE, Anton
    • H02M3/156G05F1/66
    • G01R21/00G01R21/007G01R22/10G06F1/26G06F1/28
    • An energy tracking system comprises at least one switching element, at least one inductor and a control circuit to keep the output voltage at a pre-selected level. An example energy tracking system (200) has energy transfer blocks (202, 204), a control circuit (201) and reference impedance (205). Each energy transfer block (202, 204) has a diode Di, switched transistors SWia, SWib, and an inductor INDi coupled between a switched transistor and an output of the block. The control circuit (201) compares the output voltage of the system to a reference value and controls the switching of transistors (SWS1a, SWS1b, SWSia, SWSib) in order to transfer energy for the primary voltage into a secondary voltage at the system output. The control circuit receives a signal from an ON-time and OFF-time generator and generates switching signals for the switching elements in the form of ON-time pulses with a constant ON-time.
    • 能量跟踪系统包括至少一个开关元件,至少一个电感器和控制电路,以将输出电压保持在预选的电平。 示例性能量跟踪系统(200)具有能量传递块(202,204),控制电路(201)和参考阻抗(205)。 每个能量传递块(202,204)具有二极管Di,开关晶体管SWia,SWib以及耦合在开关晶体管和块的输出之间的电感器INDi。 控制电路(201)将系统的输出电压与参考值进行比较,并控制晶体管(SWS1a,SWS1b,SWSia,SWSib)的切换,以便将用于初级电压的能量转换为系统输出端的次级电压。 控制电路接收来自导通时间和断开时间发生器的信号,并且以导通时间为常数的导通时间脉冲的形式生成开关元件的开关信号。
    • 6. 发明申请
    • TOUCH PANEL APPARATUS AND METHODS
    • 触控面板设备和方法
    • WO2014124415A1
    • 2014-08-14
    • PCT/US2014/015690
    • 2014-02-11
    • TEXAS INSTRUMENTS INCORPORATEDTEXAS INSTRUMENTS JAPAN LIMITED
    • SNEDEKER, Michael, Douglas
    • G06F3/041
    • G06F3/0418G06F3/03545G06F3/041G06F3/0414G06F3/0488
    • Apparatus and methods for improving touch panel accuracy are provided. A calibration sampling controller (830) commands an X-Y coordinate positioning apparatus to position a touch-emulating stylus at a known X-Y coordinate position relative to a touch panel (815) and to depress the stylus. A touch sampling module (835) receives, samples and stores calibration sample values corresponding to signal amplitudes associated with touch panel nodes. Each node corresponds to an X-Y coordinate position associated with a touch panel row/column cross point. The signal amplitude corresponds to a physical proximity of a node to the X-Y coordinate position of the depressed stylus. A touch panel characteristic modeler (210) receives the node calibration sample values and generates a characteristic model of the node calibration sample values as a function of a path of the touch-emulating stylus across the touch panel.
    • 提供了提高触摸屏精度的装置和方法。 校准采样控制器(830)命令X-Y坐标定位设备将触摸仿真触针定位在相对于触摸面板(815)的已知X-Y坐标位置并压下触笔。 触摸采样模块(835)接收,采样和存储与触摸面板节点相关联的信号幅度对应的校准采样值。 每个节点对应于与触摸板行/列交叉点相关联的X-Y坐标位置。 信号幅度对应于节点与被抑制的触控笔的X-Y坐标位置的物理接近度。 触摸面板特征建模器(210)接收节点校准采样值,并且生成作为触摸仿真测针在触摸面板上的路径的函数的节点校准采样值的特征模型。