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    • 28. 发明申请
    • SPECTROGRAPHIC MONITORING USING INDEX TRACKING AFTER DETECTION OF LAYER CLEARING
    • 检测层清除后使用索引跟踪进行光谱监测
    • WO2012019040A2
    • 2012-02-09
    • PCT/US2011/046642
    • 2011-08-04
    • APPLIED MATERIALS, INC.ZHANG, JiminWANG, ZhihongLEE, Harry Q.TU, Wen-Chiang
    • ZHANG, JiminWANG, ZhihongLEE, Harry Q.TU, Wen-Chiang
    • H01L21/304H01L21/66
    • B24B37/042B24B37/013B24B49/12
    • A method of controlling polishing includes storing a library having a plurality of reference spectra, each reference spectrum of the plurality of reference spectra having a stored associated index value, polishing a substrate having a second layer overlying a first layer, measuring a sequence of spectra of light from the substrate during polishing, for each measured spectrum of the sequence of spectra, finding a best matching reference spectrum to generate a sequence of best matching reference spectra, determining the associated index value for each best matching spectrum from the sequence of best matching reference spectra to generate a sequence of index values, detecting exposure of the first layer, fitting a function to a portion of the sequence of index values corresponding to spectra measured after detection of exposure of the first layer, and determining a polishing endpoint or an adjustment for a polishing rate based on the function.
    • 控制抛光的方法包括存储具有多个参考光谱的库,多个参考光谱的每个参考光谱具有存储的相关索引值,抛光具有覆盖第一层的第二层的衬底,测量第 对于光谱序列的每个测量光谱,找到最佳匹配参考光谱以产生最佳匹配参考光谱序列,从最佳匹配参考序列确定每个最佳匹配光谱的相关索引值 光谱以产生索引值序列,检测第一层的曝光,将功能拟合到对应于在检测到第一层的曝光之后测量的光谱的索引值序列的一部分,以及确定抛光终点或调整 基于功能的抛光速率。