会员体验
专利管家(专利管理)
工作空间(专利管理)
风险监控(情报监控)
数据分析(专利分析)
侵权分析(诉讼无效)
联系我们
交流群
官方交流:
QQ群: 891211   
微信请扫码    >>>
现在联系顾问~
热词
    • 3. 发明授权
    • MLC OTP operation in A-Si RRAM
    • MLC OTP操作在A-Si RRAM中
    • US09373410B1
    • 2016-06-21
    • US14479111
    • 2014-09-05
    • Crossbar, Inc.
    • Tanmay Kumar
    • G11C17/00G11C17/14H01L45/00G11C17/08G11C13/00
    • G11C17/146G11C11/5692G11C13/0004G11C13/0011G11C13/0069G11C17/00G11C17/18G11C2013/0073G11C2213/15G11C2213/33H01L45/085H01L45/1233H01L45/1253H01L45/148
    • Providing for a memory cell capable of operating a one time programmable, multi-level cell memory is described herein. In some embodiments, a program signal having a first polarity and a first current compliance is applied to a memory cell. In an aspect, the memory cell is switched to a first program state from a non-program state in response to the first program signal. Furthermore, in an embodiment, an additional program signal having a second polarity is applied to the memory cell. In another aspect, the memory cell is switched to an additional program state different from the first program state in response to the additional program signal, wherein: the memory cell inherently resists switching back from the additional program state to the first program state, and the second polarity is opposite to the first polarity.
    • 本文描述了提供能够操作一次可编程的多级单元存储器的存储单元。 在一些实施例中,具有第一极性和第一电流顺应性的程序信号被施加到存储器单元。 在一方面,响应于第一程序信号,存储器单元从非程序状态切换到第一编程状态。 此外,在一个实施例中,具有第二极性的附加节目信号被施加到存储单元。 在另一方面,响应于附加的程序信号,存储器单元被切换到与第一编程状态不同的附加程序状态,其中:存储单元固有地抵抗从附加程序状态切换到第一程序状态,并且 第二极性与第一极性相反。
    • 8. 发明授权
    • Low-pin-count non-volatile memory interface with soft programming capability
    • 具有软编程能力的低引脚数非易失性存储器接口
    • US09076513B2
    • 2015-07-07
    • US14231404
    • 2014-03-31
    • Shine C. Chung
    • Shine C. Chung
    • G11C11/00G11C17/16G11C8/18G11C16/10G11C16/16G11C16/26G11C16/32
    • G11C17/18G11C7/10G11C8/18G11C13/004G11C13/0069G11C13/0097G11C16/0408G11C16/10G11C16/16G11C16/26G11C16/32G11C17/00G11C17/146G11C17/16G11C29/022G11C29/027G11C29/1201G11C29/46G11C2216/30
    • A low-pin-count non-volatile (NVM) memory with no more than two control signals that can at least program NVM cells, load data to be programmed into output registers, or read the NVM cells. At least one of the NVM cells has at least one NVM element coupled to at least one selector and to a first supply voltage line. The selector is coupled to a second supply voltage line and having a select signal. At least one of the selected NVM cells can be coupled to at least one output register. No more than two control signals can be used to select the at least one NVM cells in the NVM sequentially for programming the data into the at least one NVM cells or loading data into the at least one output registers controlled by the pulse of the first signal and voltage level and/or timing of the second signal. Programming into the NVM cells, or loading data into output registers, can be determined by the voltage levels of the first to the second supply voltage lines. Reading at least one of the NVM cells can be activated by a third signal or by detecting ramping of the first or the second supply voltage line.
    • 具有不超过两个控制信号的低引脚数非易失性(NVM)存储器,可以至少编程NVM单元,将要编程的数据加载到输出寄存器中,或读取NVM单元。 至少一个NVM单元具有耦合到至少一个选择器和第一电源电压线的至少一个NVM元件。 选择器耦合到第二电源电压线并且具有选择信号。 所选择的NVM单元中的至少一个可以耦合到至少一个输出寄存器。 可以使用不超过两个控制信号来选择NVM中的至少一个NVM单元以将数据编程到至少一个NVM单元中,或者将数据加载到由第一信号的脉冲控制的至少一个输出寄存器中 和第二信号的电压电平和/或定时。 可以通过第一至第二电源电压线的电压电平来确定对NVM单元的编程或将数据加载到输出寄存器中。 读取至少一个NVM单元可以被第三信号激活或通过检测第一或第二电源电压线的斜坡。
    • 10. 发明申请
    • ONE-TIME PROGRAMMABLE MEMORY AND TEST METHOD THEREOF
    • 一次可编程存储器及其测试方法
    • US20140177364A1
    • 2014-06-26
    • US13844937
    • 2013-03-16
    • SK HYNIX INC.
    • Hyun-Su YOON
    • G11C29/00
    • G11C29/24G11C17/00
    • A one-time programmable memory device may include a normal cell array including a plurality of one-time programmable memory cells, which are programmable and accessible in the normal operation, a test cell array including one-time programmable memory cells, which are programmed at a given pattern in a test operation for determining a failed row and/or a failed column and are not accessible in the normal operation, a row circuit configured to control an operation of a row that is selected by a row address in the normal cell array, and a column circuit configured to access a column that is selected by a column address in the normal cell array.
    • 一次性可编程存储器件可以包括正常单元阵列,其包括在正常操作中可编程和可访问的多个一次可编程存储器单元,包括一次可编程存储器单元的测试单元阵列,其被编程在 在用于确定故障行和/或故障列的测试操作中的给定模式,并且在正常操作中不可访问,行电路被配置为控制由正常单元阵列中的行地址选择的行的操作 以及被配置为访问由正常单元阵列中的列地址选择的列的列电路。