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    • 6. 发明申请
    • Electrochemical mechanical polishing apparatus conditioning method, and conditioning solution
    • 电化学机械抛光装置调理方法,调理溶液
    • US20080188162A1
    • 2008-08-07
    • US12068300
    • 2008-02-05
    • Itsuki KobataYasushi TomaAkira KoderaTsukuru SuzukiYuji MakitaTakayuki Saito
    • Itsuki KobataYasushi TomaAkira KoderaTsukuru SuzukiYuji MakitaTakayuki Saito
    • B24B49/00
    • B24B53/017B23H5/08B24B37/042B24B37/046B24B49/10H01L21/32125H01L21/7684
    • An electrochemical mechanical polishing apparatus is for use in polishing of a conductive material (e.g., metal) on a surface of a substrate by combination of electrochemical action and mechanical action. This apparatus includes a polishing table having divided electrodes and adapted to hold a polishing pad having a polishing surface, a polishing head adapted to hold a workpiece having a conductive film and to press the workpiece against the polishing surface, a second electrode for supplying an electric current to the conductive film, an electrolytic-solution supply section for supplying an electrolytic solution to the polishing surface, a detecting section adapted to detect a signal corresponding to a thickness of the conductive film, a variable resistance unit having the same number of variable resistors as the number of divided electrodes, a moving mechanism for providing relative movement between the workpiece and the polishing surface, and a control section adapted to control each of the variable resistors based on the signal from the detecting section.
    • 电化学机械抛光装置用于通过电化学作用和机械作用的组合在基底表面上抛光导电材料(例如金属)。 该装置包括具有分割电极并且适于保持具有抛光表面的抛光垫的抛光台,用于保持具有导电膜的工件并将工件压靠抛光表面的抛光头,用于提供电 电流至导电膜的电解液供应部分,用于向研磨表面供应电解液的电解溶液供应部分,用于检测对应于导电膜厚度的信号的检测部分,具有相同数目的可变电阻器的可变电阻单元 作为分割电极的数量,用于在工件和抛光表面之间提供相对移动的移动机构,以及适于基于来自检测部分的信号来控制每个可变电阻器的控制部分。
    • 9. 发明申请
    • Electrochemical polishing method and polishing method
    • 电化学抛光方法和抛光方法
    • US20090095637A1
    • 2009-04-16
    • US12285549
    • 2008-10-08
    • Yasushi TomaAkira KoderaHirokuni Hiyama
    • Yasushi TomaAkira KoderaHirokuni Hiyama
    • C25F3/00
    • B23H5/08H01L21/32125
    • The present invention provides an electrochemical polishing method capable of increasing a polishing speed while preventing excessive polishing, such as dishing or erosion. In the electrochemical polishing method, when a voltage applied to a conductive film formed on the surface of a substrate is increased at a contact surface pressure of 0 between the surface of the substrate and a polishing pad, a voltage at a first change point C that allows a current density to start to decrease after an increase is referred to as a minimum voltage. In addition, when the voltage is increased at a contact surface pressure having a finite value, a voltage at a second change point B that allows the current density to be maintained constant after the decrease is referred to as a maximum voltage. In this case, the surface of the conductive film is polished while maintaining the voltage to be not lower than the minimum voltage and not higher than the maximum voltage. Further, the present invention provides an electrochemical polishing method capable of rapidly removing a conductive film in regions other than a contact plug or wiring line forming region while preventing excessive polishing, such as dishing or erosion. In the electrochemical polishing method, in a step of increasing a voltage, when the voltage is increased at a contact surface pressure of 0, a voltage at a first change point C that allows a current density to start to decrease after an increase is referred to as a threshold voltage, and the voltage is increased such that a voltage in a region in which a barrier film is exposed is higher than the threshold voltage.
    • 本发明提供一种能够提高抛光速度同时防止过度抛光(如凹陷或侵蚀)的电化学抛光方法。 在电化学抛光方法中,当在基板表面上形成的导电膜上施加的电压在基板的表面与抛光垫之间的接触面压力为0时增加时,在第一变化点C处的电压为 允许电流密度在增加被称为最小电压之后开始降低。 此外,当电压在具有有限值的接触表面压力下增加时,允许电流密度在减小之后保持恒定的第二变化点B处的电压被称为最大电压。 在这种情况下,导电膜的表面被抛光,同时保持电压不低于最小电压并且不高于最大电压。 此外,本发明提供一种电化学抛光方法,其能够在防止诸如凹陷或侵蚀之类的过度抛光的同时,在接触插塞或布线形成区域以外的区域中快速除去导电膜。 在电化学抛光方法中,在增加电压的步骤中,当接触面压力为0时电压升高时,参照电流密度在增加后开始下降的第一变化点C处的电压 作为阈值电压,并且增加电压,使得暴露阻挡膜的区域中的电压高于阈值电压。