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    • 1. 发明授权
    • Scan testing architectures for power-shutoff aware systems
    • 扫描测试架构,用于断电感知系统
    • US08001433B1
    • 2011-08-16
    • US12345950
    • 2008-12-30
    • Sandeep BhatiaPatrick GallagherBrian FoutzVivek Chickermane
    • Sandeep BhatiaPatrick GallagherBrian FoutzVivek Chickermane
    • G01R31/28G06F17/50
    • G01R31/318575G01R31/318563
    • In a circuit adapted for scan testing, a first set of connections configures the circuit elements into power domains with separate power-level controls, and a second set of connections configures the circuit elements to form scan segments for loading values into circuit elements from input ends of the scan segments and unloading values from circuit elements at output ends of the scan segments. A decompressor circuit receives a decompressor input and is operatively connected to the scan-segment input ends, and a compressor circuit is operatively connected to the scan segment output ends and generates a compressor output. Isolation circuits at scan-segment exits set values for scan segments at scan-segment exits when a corresponding independent power domain is in a power-off state.
    • 在适于扫描测试的电路中,第一组连接将电路元件配置成具有单独的功率电平控制的电源域,并且第二组连接将电路元件配置为形成用于从输入端将值加载到电路元件中的扫描段 的扫描段和从扫描段输出端的电路元件卸载值。 解压缩器电路接收解压缩器输入并且可操作地连接到扫描段输入端,并且压缩机电路可操作地连接到扫描段输出端并产生压缩器输出。 扫描段出口处的隔离电路在相应的独立电源域处于关机状态时,为扫描段出口处的扫描段设置值。
    • 6. 发明授权
    • Low power scan test for integrated circuits
    • 集成电路的低功耗扫描测试
    • US07693676B1
    • 2010-04-06
    • US11704443
    • 2007-02-09
    • Brion L. KellerVivek ChickermaneSandeep Bhatia
    • Brion L. KellerVivek ChickermaneSandeep Bhatia
    • G01R27/28
    • G01R31/318575
    • Low power design is a critical concern and metric for integrated circuits. During scan based manufacturing test, electric power dissipation becomes even more critical as the chip may not have been designed to tolerate excessive switching during scan test. Excessive electric power dissipation during scan test can result in excessive voltage variations, reduced noise margins and other signal integrity issues which could invalidate the test or may lead to premature chip failure. Power dissipation during test is minimized by selecting particular values for the unused care-bits in values of the test vectors on a probabilistic basis to minimize switching, while preserving test vector quality.
    • 低功耗设计是集成电路的关键和指标。 在基于扫描的制造测试中,由于芯片可能未被设计为在扫描测试期间容忍过度的切换,因此电功耗变得更加重要。 扫描测试期间过大的电力消耗可能会导致过大的电压变化,降低的噪声容限和其他信号完整性问题,这可能使测试无效或可能导致芯片过早失效。 通过在概率基础上选择测试向量值中未使用的关心位的特定值来最小化测试期间的功耗,同时保持测试矢量质量。