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    • 1. 发明授权
    • Exposure apparatus including interferometer system
    • 曝光装置包括干涉仪系统
    • US06819433B2
    • 2004-11-16
    • US10073593
    • 2002-02-12
    • Ryo TakaiKazunori Iwamoto
    • Ryo TakaiKazunori Iwamoto
    • G01B902
    • G03F7/70691G01B11/028G01B11/245
    • To accurately measure the position and posture of a stage apparatus used in an exposure apparatus or the like, the Z position and displacement of a top stage (27) are measured using as a reference a lens barrel support (35) independently of the top stage in terms of vibrations by an interferometer system which includes a projection optical system (34) for projecting a pattern formed on a master onto a substrate, stages (27, 31, 40) capable of moving with respect to the projection optical system (34) while holding the substrate or master, and a lens barrel support (35) that supports the projection optical system (34), and which uses a Z measuring mirror (30) that is arranged on a Y stage (31) and has a reflecting surface almost parallel to the XY plane, and a Z interferometer (25) arranged on the Y stage (31).
    • 为了精确地测量在曝光设备等中使用的舞台装置的位置和姿势,以独立于顶级的镜头筒支撑件(35)为基准来测量顶级(27)的Z位置和位移, 在通过干涉仪系统的振动方面,包括用于将形成在母板上的图案投影到基板上的投影光学系统(34),能够相对于投影光学系统(34)移动的台(27,31,40) 同时保持基板或主机,以及支撑投影光学系统(34)的镜筒支撑件(35),并且使用布置在Y台(31)上的Z测量镜(30)并具有反射表面 几乎平行于XY平面,以及布置在Y平台(31)上的Z干涉仪(25)。
    • 3. 发明授权
    • Scanning exposure method and apparatus, and device manufacturing method using the same
    • 扫描曝光方法和装置以及使用其的装置制造方法
    • US06856404B2
    • 2005-02-15
    • US09323034
    • 1999-06-01
    • Kazunori IwamotoNobuyoshi Deguchi
    • Kazunori IwamotoNobuyoshi Deguchi
    • G03F7/20H01L21/027G01B9/02
    • G03F7/70358G03F7/70725G03F7/70775
    • A scan type exposure for transferring a pattern onto a substrate by scan exposure. The apparatus includes a stage for moving the substrate in a Y direction corresponding to a scan direction, and in an X direction intersecting the scan direction, an alignment scope for performing measurement for alignment of the substrate, at a position spaced, in the Y direction, from a position where the exposure of the substrate is to be carried out, an X measuring device for performing yaw measurement of said stage by use of an X reflection surface provided on said stage along the Y direction, a Y measuring device for performing yaw measurement of the stage by use of a Y reflection surface provided on the stage along the X direction, and a controller being operable to select yaw measurement information of the X measuring device for an alignment operation including the alignment measurement using the alignment scope, and being operable to select yaw measurement information of the Y measuring device for the scan exposure.
    • 用于通过扫描曝光将图案转印到基板上的扫描型曝光。 该装置包括:用于在与扫描方向对应的Y方向上移动基板的台,并且在与扫描方向相交的X方向上,用于在Y方向上间隔开的位置处进行用于对准基板的测量的对准范围 从要进行基板的曝光的位置,用于通过使用沿着Y方向设置在所述台上的X反射面来进行所述平台的偏航测量的X测量装置,用于执行偏航的Y测量装置 通过使用沿X方向设置在舞台上的Y反射面来测量舞台,以及控制器,用于选择X测量装置的偏航测量信息,以进行包括使用对准范围的对准测量的对准操作,并且 可操作地选择用于扫描曝光的Y测量装置的偏航测量信息。
    • 4. 发明授权
    • Scanning exposure method and apparatus
    • 扫描曝光方法和装置
    • US6069683A
    • 2000-05-30
    • US927280
    • 1997-09-11
    • Kazunori Iwamoto
    • Kazunori Iwamoto
    • G03F7/20G03F9/00H01L21/027G03B27/42G03B27/54
    • G03F7/70358G03F7/70833G03F9/70
    • An exposure apparatus includes a projection optical system for projecting a pattern of an original onto a substrate, an original stage for moving the original relative to the projection optical system, a substrate stage for moving the substrate relative to the projection optical system, an alignment detecting system for detecting alignment information related to alignment of at least one of the original and the substrate, a correcting device for correcting the alignment information detected by the alignment detecting system, on the basis of the position of the original stage, and a controller for controlling alignment of at least one of the original and the substrate on the basis of the alignment information as corrected by the correcting device.
    • 曝光装置包括用于将原稿的图案投影到基板上的投影光学系统,用于相对于投影光学系统移动原稿的原稿台,用于相对于投影光学系统移动基板的基板台,对准检测 用于检测与原稿和基板中的至少一个对准相关的对准信息的系统,用于基于原始台的位置校正由对准检测系统检测的对准信息的校正装置,以及用于控制 基于校正装置校正的对准信息,对原稿和基板中的至少一个进行对准。