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    • 4. 发明申请
    • LITHOGRAPHIC APPARATUS
    • LITHOGRAPHIC设备
    • US20150192864A1
    • 2015-07-09
    • US14661929
    • 2015-03-18
    • ASML NETHERLANDS B.V.
    • Theodorus Marinus MODDERMAN
    • G03F7/20
    • G03F7/70883G03F7/70341G03F7/7075
    • A lithographic apparatus includes a first table to support a substrate; a second table, not being configured to support a substrate, including a sensor unit to sense a property of a patterned beam of radiation from a projection system, the second table to move under the projection system when the first table is moved out from under the projection system during a substrate exchange, the first and second tables being independently movable from each other; and a liquid supply system to supply a liquid to a space between the projection system and the substrate, the first table, and/or the second table, wherein the second table is configured to provide a confining surface at a bottom of a liquid confinement structure when the first table is removed from under the projection system so as to prevent the liquid from leaking out into the remainder of the lithographic apparatus.
    • 光刻设备包括:支撑基板的第一工作台; 第二表,不被配置为支撑基板,包括用于感测来自投影系统的图案化的辐射束的特性的传感器单元,所述第二台在第一台从下方移出时在投影系统下方移动 投影系统,在第一和第二表彼此独立地移动; 以及液体供应系统,用于向投影系统和基板,第一台和/或第二台之间的空间供应液体,其中第二台被配置为在液体限制结构的底部提供限制表面 当第一台从投影系统下方移除时,以防止液体泄漏到光刻设备的其余部分中。
    • 9. 发明申请
    • CARRIER METHOD, EXPOSURE METHOD, CARRIER SYSTEM AND EXPOSURE APPARATUS, AND DEVICE MANUFACTURING METHOD
    • 载体方法,曝光方法,载体系统和曝光装置以及装置制造方法
    • US20130177857A1
    • 2013-07-11
    • US13727281
    • 2012-12-26
    • NIKON CORPORATION
    • Yuichi SHIBAZAKI
    • G03F7/20
    • G03F7/70725G03F7/70133G03F7/707G03F7/7075
    • A carrier system equipped with a fine movement stage holding a mounted wafer and can move along a predetermined plane, a chuck main section which holds the wafer above a predetermined position and can move vertically, and vertical movement pins supporting the wafer held by the chuck main section on the fine movement stage from below when the fine movement stage is positioned at the predetermined position and are vertically movable. A controller drives the chuck main section and the vertical movement pins downward until a lower surface of the wafer comes into contact with the fine movement stage while maintaining a hold state by the chuck main section to the wafer and a support state by the vertical movement pins to the wafer, and when the lower surface of the wafer comes into contact with the fine movement stage, the hold state and the support state are released.
    • 一种具有保持安装晶片并能够沿预定平面移动的精细运动台的托架系统,将晶片保持在预定位置上并可垂直移动的卡盘主体部分,以及支撑由卡盘主体保持的晶片的垂直运动销 当微动台位于预定位置并且是可垂直移动时,从下方的微动台上的截面。 控制器将卡盘主体部分和垂直移动销向下驱动,直到晶片的下表面与微动载台接触,同时保持夹头主体对晶片的保持状态,并且通过垂直移动销 并且当晶片的下表面与微动载台接触时,释放保持状态和支撑状态。
    • 10. 发明授权
    • Processing apparatus and device manufacturing method
    • 加工装置及装置的制造方法
    • US08416382B2
    • 2013-04-09
    • US12025940
    • 2008-02-05
    • Shinichi Hirano
    • Shinichi Hirano
    • G03B27/52G03B27/32G06F7/00
    • H01L21/67276G03F7/70525G03F7/7075
    • A processing apparatus including a processing unit configured to process an object includes a conveying unit configured to convey an object between a transfer portion provided between an external apparatus and the processing unit, and the processing unit, a controller configured to output a request signal requesting the external apparatus to convey the object to the transfer portion, and an output unit configured to output a signal indicating a start of maintenance of the processing apparatus. The controller is configured to output to the external apparatus a signal for stopping the conveyance of the object to the transfer portion, based on the signal indicating the start of maintenance output from the output unit, after outputting the request signal.
    • 一种处理装置,包括被配置为处理对象的处理单元,包括:传送单元,被配置为在设置在外部设备和处理单元之间的传送部分与处理单元之间传送对象;控制器,被配置为输出请求 外部设备将物体传送到传送部分,以及输出单元,被配置为输出指示处理设备的维护开始的信号。 控制器被配置为在输出请求信号之后,基于指示从输出单元输出的维护开始的信号,向外部设备输出用于停止将物体传送到传送部分的信号。