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    • 5. 发明授权
    • Apparatus and method to manage external voltage for semiconductor memory testing with serial interface
    • 使用串行接口管理半导体存储器测试的外部电压的装置和方法
    • US07525856B2
    • 2009-04-28
    • US11696521
    • 2007-04-04
    • Stefano SuricoMarco PasseriniMassimiliano FrulioAlex Pojer
    • Stefano SuricoMarco PasseriniMassimiliano FrulioAlex Pojer
    • G11C29/00
    • G11C29/32G11C29/003G11C29/1201
    • A serial-interface flash memory device includes a data/address I/O pin and a clock input pin. A bidirectional buffer is coupled to the data/address I/O pin. A serial interface logic block including data direction control is coupled to the clock pin, the bidirectional buffer, to internal control logic, and to read-voltage and modify-voltage generators. A first switch is coupled to the read-voltage generator and the clock buffer and a second switch is coupled to the modify-voltage generator and the clock buffer, the first and second switches each having a control input. Memory drivers are coupled to the read-voltage generator and the modify-voltage generator through the first and second switches. First and second registers coupled between the serial interface logic and the first and second switches. A memory array is coupled to the memory drivers and read amplifiers and program buffers are coupled between the serial interface logic and the memory drivers.
    • 串行接口闪存设备包括数据/地址I / O引脚和时钟输入引脚。 双向缓冲器耦合到数据/地址I / O引脚。 包括数据方向控制的串行接口逻辑块耦合到时钟引脚,双向缓冲器,内部控制逻辑以及读取电压和修改电压发生器。 第一开关耦合到读电压发生器和时钟缓冲器,第二开关耦合到修改电压发生器和时钟缓冲器,第一和第二开关各自具有控制输入。 存储器驱动器通过第一和第二开关耦合到读取电压发生器和修改电压发生器。 第一和第二寄存器耦合在串行接口逻辑与第一和第二开关之间。 存储器阵列耦合到存储器驱动器和读取放大器,并且程序缓冲器耦合在串行接口逻辑和存储器驱动器之间。
    • 6. 发明申请
    • APPARATUS AND METHOD TO MANAGE EXTERNAL VOLTAGE FOR SEMICONDUCTOR MEMORY TESTING WITH SERIAL INTERFACE
    • 用于串行接口的半导体存储器测试管理外部电压的装置和方法
    • US20080246504A1
    • 2008-10-09
    • US11696521
    • 2007-04-04
    • Stefano SuricoMarco PasseriniMassimiliano FrulioAlex Pojer
    • Stefano SuricoMarco PasseriniMassimiliano FrulioAlex Pojer
    • G01R31/00
    • G11C29/32G11C29/003G11C29/1201
    • A serial-interface flash memory device includes a data/address I/O pin and a clock input pin. A bidirectional buffer is coupled to the data/address I/O pin. A serial interface logic block including data direction control is coupled to the clock pin, the bidirectional buffer, to internal control logic, and to read-voltage and modify-voltage generators. A first switch is coupled to the read-voltage generator and the clock buffer and a second switch is coupled to the modify-voltage generator and the clock buffer, the first and second switches each having a control input. Memory drivers are coupled to the read-voltage generator and the modify-voltage generator through the first and second switches. First and second registers coupled between the serial interface logic and the first and second switches. A memory array is coupled to the memory drivers and read amplifiers and program buffers are coupled between the serial interface logic and the memory drivers.
    • 串行接口闪存设备包括数据/地址I / O引脚和时钟输入引脚。 双向缓冲器耦合到数据/地址I / O引脚。 包括数据方向控制的串行接口逻辑块耦合到时钟引脚,双向缓冲器,内部控制逻辑以及读取电压和修改电压发生器。 第一开关耦合到读电压发生器和时钟缓冲器,第二开关耦合到修改电压发生器和时钟缓冲器,第一和第二开关各自具有控制输入。 存储器驱动器通过第一和第二开关耦合到读取电压发生器和修改电压发生器。 第一和第二寄存器耦合在串行接口逻辑与第一和第二开关之间。 存储器阵列耦合到存储器驱动器和读取放大器,并且程序缓冲器耦合在串行接口逻辑和存储器驱动器之间。