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    • 8. 发明授权
    • Implementation of column redundancy for a flash memory with a high write parallelism
    • 实现具有高写入并行性的闪存的列冗余
    • US07551498B2
    • 2009-06-23
    • US11611452
    • 2006-12-15
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • Simone BartoliStefano SuricoAndrea SaccoMaria Mostola
    • G11C7/00
    • G11C29/82G11C29/806G11C29/846
    • A redundant memory array has r columns of redundant memory cells, r redundant senses, and a redundant column decoder. Redundant address registers store addresses of defective regular memory cells. Redundant latches are provided in n groups of r latches. Redundancy comparison logic compares addresses of defective regular memory cells with an external input address. If the comparison is true, what is provided is: a DISABLE_LOAD signal to disable the regular senses for one of the n groups of m columns, an ENABLE_LATCH signal to one of the n groups of m columns to disables corresponding regular senses, and one or r REDO signals to a respective one of the r redundant latches in one of the n groups that is disabled. The selected one of the redundant latches activates one of the r redundant senses to access a redundant column.
    • 冗余存储器阵列具有r列的冗余存储器单元,r冗余感测器和冗余列解码器。 冗余地址寄存器存储有缺陷的常规存储单元的地址。 在n组r个锁存器中提供冗余锁存器。 冗余比较逻辑将缺陷常规存储单元的地址与外部输入地址进行比较。 如果比较是真的,提供的是:DISABLE_LOAD信号,用于禁用n列m列中的一个的常规感测,将一个ENABLE_LATCH信号分配给m列的n组中的一组,以禁用相应的常规感官,以及其中之一 r REDO信号到禁用的n个组之一的r个冗余锁存器中的相应一个。 所选的一个冗余锁存器激活r个冗余感测之一以访问冗余列。
    • 9. 发明授权
    • Apparatus and method to manage external voltage for semiconductor memory testing with serial interface
    • 使用串行接口管理半导体存储器测试的外部电压的装置和方法
    • US07525856B2
    • 2009-04-28
    • US11696521
    • 2007-04-04
    • Stefano SuricoMarco PasseriniMassimiliano FrulioAlex Pojer
    • Stefano SuricoMarco PasseriniMassimiliano FrulioAlex Pojer
    • G11C29/00
    • G11C29/32G11C29/003G11C29/1201
    • A serial-interface flash memory device includes a data/address I/O pin and a clock input pin. A bidirectional buffer is coupled to the data/address I/O pin. A serial interface logic block including data direction control is coupled to the clock pin, the bidirectional buffer, to internal control logic, and to read-voltage and modify-voltage generators. A first switch is coupled to the read-voltage generator and the clock buffer and a second switch is coupled to the modify-voltage generator and the clock buffer, the first and second switches each having a control input. Memory drivers are coupled to the read-voltage generator and the modify-voltage generator through the first and second switches. First and second registers coupled between the serial interface logic and the first and second switches. A memory array is coupled to the memory drivers and read amplifiers and program buffers are coupled between the serial interface logic and the memory drivers.
    • 串行接口闪存设备包括数据/地址I / O引脚和时钟输入引脚。 双向缓冲器耦合到数据/地址I / O引脚。 包括数据方向控制的串行接口逻辑块耦合到时钟引脚,双向缓冲器,内部控制逻辑以及读取电压和修改电压发生器。 第一开关耦合到读电压发生器和时钟缓冲器,第二开关耦合到修改电压发生器和时钟缓冲器,第一和第二开关各自具有控制输入。 存储器驱动器通过第一和第二开关耦合到读取电压发生器和修改电压发生器。 第一和第二寄存器耦合在串行接口逻辑与第一和第二开关之间。 存储器阵列耦合到存储器驱动器和读取放大器,并且程序缓冲器耦合在串行接口逻辑和存储器驱动器之间。