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    • 5. 发明授权
    • Method and apparatus to debug an integrated circuit chip via synchronous clock stop and scan
    • 通过同步时钟停止和扫描来调试集成电路芯片的方法和装置
    • US08140925B2
    • 2012-03-20
    • US11768791
    • 2007-06-26
    • Ralph E. BellofattoMatthew R. EllavskyAlan G. GaraMark E. GiampapaThomas M. GoodingRudolf A. HaringLance G. HehenbergerMartin Ohmacht
    • Ralph E. BellofattoMatthew R. EllavskyAlan G. GaraMark E. GiampapaThomas M. GoodingRudolf A. HaringLance G. HehenbergerMartin Ohmacht
    • G01R31/28G06F1/12
    • G06F11/2236
    • An apparatus and method for evaluating a state of an electronic or integrated circuit (IC), each IC including one or more processor elements for controlling operations of IC sub-units, and each the IC supporting multiple frequency clock domains. The method comprises: generating a synchronized set of enable signals in correspondence with one or more IC sub-units for starting operation of one or more IC sub-units according to a determined timing configuration; counting, in response to one signal of the synchronized set of enable signals, a number of main processor IC clock cycles; and, upon attaining a desired clock cycle number, generating a stop signal for each unique frequency clock domain to synchronously stop a functional clock for each respective frequency clock domain; and, upon synchronously stopping all on-chip functional clocks on all frequency clock domains in a deterministic fashion, scanning out data values at a desired IC chip state. The apparatus and methodology enables construction of a cycle-by-cycle view of any part of the state of a running IC chip, using a combination of on-chip circuitry and software.
    • 一种用于评估电子或集成电路(IC)的状态的装置和方法,每个IC包括用于控制IC子单元的操作的一个或多个处理器元件,以及每个支持多个时钟域的IC。 该方法包括:根据确定的定时配置,产生与一个或多个IC子单元相对应的用于开始一个或多个IC子单元的操作的同步的使能信号组; 计数,响应于同步的一组使能信号的一个信号,多个主处理器IC时钟周期; 并且在获得期望的时钟周期数时,产生用于每个唯一频率时钟域的停止信号以同步地停止每个相应频率时钟域的功能时钟; 并且在确定性地同时停止所有频率时钟域上的所有片上功能时钟时,以期望的IC芯片状态扫描数据值。 该装置和方法使得能够使用片上电路和软件的组合来构建运行中的IC芯片的状态的任何部分的逐周期视图。
    • 7. 发明申请
    • Call Stack Protection
    • 呼叫堆栈保护
    • US20100088705A1
    • 2010-04-08
    • US12247497
    • 2008-10-08
    • John E. AttinellaMark E. GiampapaThomas M. Gooding
    • John E. AttinellaMark E. GiampapaThomas M. Gooding
    • G06F12/02G06F9/46
    • G06F12/1441
    • Call stack protection, including executing at least one application program on the one or more computer processors, including initializing threads of execution, each thread having a call stack, each call stack characterized by a separate guard area defining a maximum extent of the call stack, dispatching one of the threads of the process, including loading a guard area specification for the dispatched thread's call stack guard area from thread context storage into address comparison registers of a processor; determining by use of address comparison logic in dependence upon a guard area specification for the dispatched thread whether each access of memory by the dispatched thread is a precluded access of memory in the dispatched thread's call stack's guard area; and effecting by the address comparison logic an address comparison interrupt for each access of memory that is a precluded access of memory in the dispatched thread's guard area.
    • 调用堆栈保护,包括在一个或多个计算机处理器上执行至少一个应用程序,包括初始化执行线程,每个线程具有调用堆栈,每个调用堆栈的特征在于定义呼叫堆栈的最大范围的单独保护区域, 调度进程的一个线程,包括将调度线程的调用堆栈保护区域的保护区域规范从线程上下文存储加载到处理器的地址比较寄存器中; 通过使用地址比较逻辑,根据被调度的线程的保护区域规范来确定被调度线程的每个存储器的访问是否是被调度的线程的调用堆栈的保护区域中的存储器的被阻止的访问; 并且通过地址比较逻辑执行地址比较中断,用于存储器的每次存取,这是存储在调度线程的保护区域中的被阻止的访问。
    • 9. 发明申请
    • METHOD AND APPARATUS TO DEBUG AN INTEGRATED CIRCUIT CHIP VIA SYNCHRONOUS CLOCK STOP AND SCAN
    • 通过同步时钟停止和扫描来调试集成电路芯片的方法和设备
    • US20090006894A1
    • 2009-01-01
    • US11768791
    • 2007-06-26
    • Ralph E. BellofattoMatthew R. EllavskyAlan G. GaraMark E. GiampapaThomas M. GoodingRudolf A. HaringLance G. HehenbergerMartin Ohmacht
    • Ralph E. BellofattoMatthew R. EllavskyAlan G. GaraMark E. GiampapaThomas M. GoodingRudolf A. HaringLance G. HehenbergerMartin Ohmacht
    • G06F11/00
    • G06F11/2236
    • An apparatus and method for evaluating a state of an electronic or integrated circuit (IC), each IC including one or more processor elements for controlling operations of IC sub-units, and each the IC supporting multiple frequency clock domains. The method comprises: generating a synchronized set of enable signals in correspondence with one or more IC sub-units for starting operation of one or more IC sub-units according to a determined timing configuration; counting, in response to one signal of the synchronized set of enable signals, a number of main processor IC clock cycles; and, upon attaining a desired clock cycle number, generating a stop signal for each unique frequency clock domain to synchronously stop a functional clock for each respective frequency clock domain; and, upon synchronously stopping all on-chip functional clocks on all frequency clock domains in a deterministic fashion, scanning out data values at a desired IC chip state. The apparatus and methodology enables construction of a cycle-by-cycle view of any part of the state of a running IC chip, using a combination of on-chip circuitry and software.
    • 一种用于评估电子或集成电路(IC)的状态的装置和方法,每个IC包括用于控制IC子单元的操作的一个或多个处理器元件,以及每个支持多个时钟域的IC。 该方法包括:根据确定的定时配置,产生与一个或多个IC子单元相对应的用于开始一个或多个IC子单元的操作的同步的使能信号组; 计数,响应于同步的一组使能信号的一个信号,多个主处理器IC时钟周期; 并且在获得期望的时钟周期数时,产生用于每个唯一频率时钟域的停止信号以同步地停止每个相应频率时钟域的功能时钟; 并且在确定性地同时停止所有频率时钟域上的所有片上功能时钟时,以期望的IC芯片状态扫描数据值。 该装置和方法使得能够使用片上电路和软件的组合来构建运行中的IC芯片的状态的任何部分的逐周期视图。