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    • 3. 发明申请
    • Radiation Tolerance by Clock Signal Interleaving
    • 通过时钟信号交错的辐射公差
    • US20090241073A1
    • 2009-09-24
    • US12051002
    • 2008-03-19
    • Matthew R. EllavskyAj KleinOsowskiScott M. Willenborg
    • Matthew R. EllavskyAj KleinOsowskiScott M. Willenborg
    • G06F17/50
    • G06F17/505G06F2217/62
    • A method for designing integrated circuits uses clock signal interleaving to reduce the likelihood of a soft error arising from an upset in a clock distribution network. At least two circuits in a circuit description are identified as being sensitive to radiation, and different clock distribution nodes are assigned to the two circuits. Several exemplary implementations are disclosed. The second circuit may be a redundant replica of the first circuit, such as a reset circuit. The first and second circuits may be components of a modular redundant circuit such as a triple modular redundancy flip-flop. The first circuit may include a set of data bits for an entry of a storage array such as a register or memory array, and the second circuit may include a set of check bits associated with the entry.
    • 一种设计集成电路的方法使用时钟信号交织来减少由时钟分配网络中的不适引起的软错误的可能性。 电路描述中的至少两个电路被识别为对辐射敏感,并且不同的时钟分配节点被分配给两个电路。 公开了几个示例性实现。 第二电路可以是第一电路的冗余复制品,例如复位电路。 第一和第二电路可以是模块化冗余电路的组件,例如三模块冗余触发器。 第一电路可以包括用于诸如寄存器或存储器阵列的存储阵列的入口的一组数据位,并且第二电路可以包括与该条目相关联的一组校验位。
    • 9. 发明授权
    • Method and apparatus to debug an integrated circuit chip via synchronous clock stop and scan
    • 通过同步时钟停止和扫描来调试集成电路芯片的方法和装置
    • US08140925B2
    • 2012-03-20
    • US11768791
    • 2007-06-26
    • Ralph E. BellofattoMatthew R. EllavskyAlan G. GaraMark E. GiampapaThomas M. GoodingRudolf A. HaringLance G. HehenbergerMartin Ohmacht
    • Ralph E. BellofattoMatthew R. EllavskyAlan G. GaraMark E. GiampapaThomas M. GoodingRudolf A. HaringLance G. HehenbergerMartin Ohmacht
    • G01R31/28G06F1/12
    • G06F11/2236
    • An apparatus and method for evaluating a state of an electronic or integrated circuit (IC), each IC including one or more processor elements for controlling operations of IC sub-units, and each the IC supporting multiple frequency clock domains. The method comprises: generating a synchronized set of enable signals in correspondence with one or more IC sub-units for starting operation of one or more IC sub-units according to a determined timing configuration; counting, in response to one signal of the synchronized set of enable signals, a number of main processor IC clock cycles; and, upon attaining a desired clock cycle number, generating a stop signal for each unique frequency clock domain to synchronously stop a functional clock for each respective frequency clock domain; and, upon synchronously stopping all on-chip functional clocks on all frequency clock domains in a deterministic fashion, scanning out data values at a desired IC chip state. The apparatus and methodology enables construction of a cycle-by-cycle view of any part of the state of a running IC chip, using a combination of on-chip circuitry and software.
    • 一种用于评估电子或集成电路(IC)的状态的装置和方法,每个IC包括用于控制IC子单元的操作的一个或多个处理器元件,以及每个支持多个时钟域的IC。 该方法包括:根据确定的定时配置,产生与一个或多个IC子单元相对应的用于开始一个或多个IC子单元的操作的同步的使能信号组; 计数,响应于同步的一组使能信号的一个信号,多个主处理器IC时钟周期; 并且在获得期望的时钟周期数时,产生用于每个唯一频率时钟域的停止信号以同步地停止每个相应频率时钟域的功能时钟; 并且在确定性地同时停止所有频率时钟域上的所有片上功能时钟时,以期望的IC芯片状态扫描数据值。 该装置和方法使得能够使用片上电路和软件的组合来构建运行中的IC芯片的状态的任何部分的逐周期视图。