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    • 1. 发明申请
    • FLEXIBLE FIXING SYSTEM FOR PRODUCT TESTING
    • 柔性固定系统,用于产品测试
    • US20080169595A1
    • 2008-07-17
    • US11752908
    • 2007-05-23
    • LEI LIPING CHENZHI CHENGXUE-LIANG ZHAICHANG-FA SUNLIN-SEN DONG
    • LEI LIPING CHENZHI CHENGXUE-LIANG ZHAICHANG-FA SUNLIN-SEN DONG
    • B25B11/00
    • B25B5/00B25B5/003B25B5/06B25B5/16
    • A flexible/adjustable fixing system (100) for fixing a workpiece (40) includes an information management module (10), a plurality of driving devices (20), and a positioning device (30). The information management module receives and processes the position information of the workpiece. The driving devices electronically couple with the information management module. The positioning device includes a platform (31) and a plurality of positioning pins (32). One end of the workpiece is positioned in a certain area of the platform. Each respective pin is attached to a corresponding driving device. When the driving device receives an order/signal from the information management module, the positioning pin is selectably driven relative to (e.g., toward, away from) the workpiece by the driving device.
    • 一种用于固定工件(40)的柔性/可调节固定系统(100)包括信息管理模块(10),多个驱动装置(20)和定位装置(30)。 信息管理模块接收并处理工件的位置信息。 驱动装置与信息管理模块电子耦合。 定位装置包括平台(31)和多个定位销(32)。 工件的一端位于平台的某一区域。 每个相应的销连接到相应的驱动装置。 当驱动装置从信息管理模块接收到订单/信号时,通过驱动装置相对于(例如,朝向,远离)工件可选择地驱动定位销。
    • 3. 发明申请
    • KEY TESTING APPARATUS
    • 主要测试设备
    • US20080184825A1
    • 2008-08-07
    • US11945520
    • 2007-11-27
    • LEI LIPING CHENZHI CHENGJIAN-GUI WUHONG-YAN LIXUE-LIANG ZHAICHANG-FA SUNYONG-ZHI TAO
    • LEI LIPING CHENZHI CHENGJIAN-GUI WUHONG-YAN LIXUE-LIANG ZHAICHANG-FA SUNYONG-ZHI TAO
    • G01M19/00
    • G01M99/008
    • A key testing apparatus (100) is provided. The key testing apparatus includes a base (11) and an actuator (12). The actuator includes a testing member (17) and a mounting member (18). The mounting member includes at least one base board (181) fixed to the base, a lower board (182), a mounting board (183), and a mounting sheet (185). The lower board is adjustably attached to the base board. The mounting board is adjustably attached to the lower board. The mounting sheet is adjustably attached to the mounting board. The clamping device includes a base desk (131), a clamping platform (132), at least one first clamping board (133) and second clamping board (134). The base desk is adjustably attached to the base. The clamping platform, at least one first clamping board, and at least one second clamping board are adjustably attached to the base desk.
    • 提供了一种密钥测试装置(100)。 钥匙测试装置包括基座(11)和致动器(12)。 致动器包括测试构件(17)和安装构件(18)。 安装构件包括固定到基座的至少一个基板(181),下板(182),安装板(183)和安装板(185)。 下板可调节地连接到基板。 安装板可调节地连接到下板。 安装板可调节地附接到安装板。 夹持装置包括底座(131),夹紧平台(132),至少一个第一夹紧板(133)和第二夹紧板(134)。 底座可调节地连接到底座。 夹紧平台,至少一个第一夹紧板和至少一个第二夹紧板可调节地附接到底座。
    • 5. 发明申请
    • TESTING SYSTEM FOR FLATNESS AND PARALLELISM
    • 平面和平行测试系统
    • US20070240322A1
    • 2007-10-18
    • US11615896
    • 2006-12-22
    • LEI LIZhi ChengPing ChenAi-Ge SunXue-Liang ZhaiChang-Fa Sun
    • LEI LIZhi ChengPing ChenAi-Ge SunXue-Liang ZhaiChang-Fa Sun
    • G01B5/25
    • G01B5/207G01B5/25G01B5/285
    • A testing system for testing flatness of a surface of a workpiece includes a testing apparatus (10) and a processor (20). The testing apparatus includes a testing box (12) and a measuring apparatus (14). The testing box includes a plurality of holders (122); the holders define a datum plane. The measuring apparatus comprises a plurality of movable testing poles (142) extending out of the testing box and a plurality of gauges (141) configured for measuring distance of the testing poles retracting into the testing box. Ends (1421) of the testing poles away from the testing box are located at the datum plane and configured for supporting the surface of the workpiece thereon to allow the gauges measuring retracting distance of the testing poles under the pressure of the workpiece. The retracting distance of the testing poles is equal to distances between testing points on the surface of the workpieces and the datum plane. The processor is connected to the testing apparatus for receiving and processing testing data that are converted from the retracting distance of the testing poles measured by the gauges.
    • 用于测试工件表面的平整度的测试系统包括测试装置(10)和处理器(20)。 测试装置包括测试箱(12)和测量装置(14)。 测试箱包括多个保持器(122); 支架定义基准平面。 测量装置包括从测试箱延伸出来的多个可动测试极(142)和多个量测器(141),其被配置用于测量测试极回缩到测试箱中的距离。 远离测试箱的测试极的端部(1421)位于基准平面上并且被配置为支撑其上的工件的表面,以允许测量仪在工件的压力下测量测试极的回缩距离。 测试极的回缩距离等于工件表面和基准平面上的测试点之间的距离。 处理器连接到测试装置,用于接收和处理从由量规测量的测试极的回缩距离转换的测试数据。
    • 8. 发明申请
    • MICROMETER-BASED MEASURING SYSTEM AND METHOD OF USING SAME
    • 基于微机的测量系统及其使用方法
    • US20080155846A1
    • 2008-07-03
    • US11945512
    • 2007-11-27
    • LEI LIZHI CHENGPING CHENJI-WEN YANGLIN-SEN DONGCHANG-FA SUN
    • LEI LIZHI CHENGPING CHENJI-WEN YANGLIN-SEN DONGCHANG-FA SUN
    • G01B5/20
    • G01B5/285G01B3/22
    • A measuring system (100) for flatness degree measurement includes a measuring instrument (10) and a processing device (20). The measuring instrument has a base (12), a guide column (14), a sliding member (16), a digital micrometer (18) and a holding member (19). The guide column is vertically attached to the base. The sliding member is moveably attached to the guide column. The digital micrometer is firmly fastened to the sliding member. The holding member is configured for fixing a workpiece (40) and has a reference-standard surface formed thereon. The processing device electronically connects with the digital micrometer. The processing device receives a plurality of measured values from the digital micrometer and displays a testing result after processing the measured values.
    • 用于平坦度测量的测量系统(100)包括测量仪器(10)和处理设备(20)。 测量仪器具有底座(12),导柱(14),滑动构件(16),数字测微器(18)和保持构件(19)。 引导柱垂直连接到基座。 滑动构件可移动地附接到导向柱。 数字测微计牢固地固定在滑动构件上。 保持构件用于固定工件(40)并具有形成在其上的基准标准表面。 处理装置与数字千分尺电子连接。 处理装置从数字千分尺接收多个测量值,并在处理测量值之后显示测试结果。