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1. 发明授权

US09925725B2 Method for printing three-dimensional parts with part strain orientation 有权
公开(公告)号：US09925725B2
公开(公告)日：2018-03-27
申请号：US15581663
申请日：2017-04-28
申请人： Stratasys, Inc.
发明人： J. Samuel Batchelder
IPC分类号： G05B99/00 , B29C67/00 , B33Y10/00 , B33Y50/02 , G05B19/4099 , G06F17/50 , G01N3/08 , B33Y40/00 , G01N33/00
CPC分类号： B29C64/386 , B33Y10/00 , B33Y40/00 , B33Y50/02 , G01N3/08 , G01N2033/0078 , G05B15/02 , G05B19/4099 , G05B2219/49023 , G06F17/50 , G06F2217/12 , Y02P80/40 , Y02P90/265
摘要： A method and program for printing a three-dimensional part with an additive manufacturing system, the method including generating or otherwise providing strain data from a digital model of the three-dimensional part, orienting the digital model to align the directions of high tensile strain in a build plane, and printing the three-dimensional part in a layer-by-layer manner based on the oriented digital model with the additive manufacturing system.

2. 发明申请

US20160290905A1 PREDICTING SEMICONDUCTOR PACKAGE WARPAGE 有权
标题翻译：预测半导体包装WARPAGE
公开(公告)号：US20160290905A1
公开(公告)日：2016-10-06
申请号：US14672331
申请日：2015-03-30
申请人： International Business Machines Corporation
发明人： Stephen P. Ayotte , Eric G. Liniger , Travis S. Longenbach
IPC分类号： G01N3/42
CPC分类号： G01N3/42 , G01M5/0075 , G01N3/20 , G01N2033/0078 , G01N2033/0081 , G01N2033/0095 , G01N2203/0222 , G01R31/2896
摘要： A method for predicting the electrical functionality of a semiconductor package, the method includes performing a first stiffness test for a first semiconductor package, receiving failure data for the first semiconductor package, the failure data includes results of an electrical test performed after the first semiconductor package is assembled on a printed circuit board, generating a database comprising results of the first stiffness test as a function of the failure data for the first semiconductor package, performing a second stiffness test for a second semiconductor package, identifying a unique result from the results of the first stiffness test in the database, the unique result aligns with a result of the second stiffness test, and predicting a failure data for the second semiconductor package based on the failure data for the first semiconductor package which corresponds to the unique result of the first stiffness test identified in the database.
摘要翻译：一种用于预测半导体封装的电功能的方法，所述方法包括对第一半导体封装执行第一刚度测试，接收第一半导体封装的故障数据，故障数据包括在第一半导体封装之后执行的电测试的结果组装在印刷电路板上，产生包括作为第一半导体封装的故障数据的函数的第一刚度测试的结果的数据库，对第二半导体封装进行第二刚度测试，从第二半导体封装的结果中识别唯一的结果数据库中的第一刚度测试，唯一结果与第二刚度测试的结果相一致，并且基于第一半导体封装的故障数据来预测第二半导体封装的故障数据，该故障数据对应于第一半导体封装的唯一结果在数据库中确定刚度测试。

3. 发明申请

US20160153922A1 SYSTEM AND METHOD FOR ADAPTIVE THERMAL ANALYSIS 审中-公开
标题翻译：用于自适应热分析的系统和方法
公开(公告)号：US20160153922A1
公开(公告)日：2016-06-02
申请号：US14951698
申请日：2015-11-25
申请人： MediaTek Inc.
发明人： Yu-Min LEE , Chi-Wen PAN , Hung-Wen CHIOU , Tai-Yu CHEN , Tao CHENG , Wen-Sung HSU , Sheng-Liang LI
IPC分类号： G01N25/18
CPC分类号： G01N25/18 , G01N2033/0078 , G01N2033/0095 , G06F17/5009 , G06F2217/16
摘要： A computer system and a method for adaptive thermal resistance-capacitance (RC) network analysis of a semiconductor device for use in a portable device are provided. The method includes the steps of: receiving a device input file and a plurality of specific effective heat transfer coefficients (HTCs) associated with the portable device; repeatedly performing a thermal analysis of the portable device based on the device input file and a current effective HTC to estimate a target die temperature of the semiconductor device; calculating a target effective HTC based on the device input file and the target die temperature; and updating the current effective HTC with the target effective HTC; and generating an output file recording the target die temperature of the semiconductor device.
摘要翻译：提供了一种用于便携式设备的半导体器件的计算机系统和用于自适应热电阻 - 电容（RC）网络分析的方法。该方法包括以下步骤：接收与便携式设备相关联的设备输入文件和多个特定有效传热系数（HTC）; 基于设备输入文件和当前有效HTC重复执行便携式设备的热分析以估计半导体器件的目标管芯温度; 基于设备输入文件和目标模具温度计算目标有效HTC; 并用目标有效HTC更新当前有效的HTC; 以及生成记录半导体器件的目标管芯温度的输出文件。

4. 发明授权

US09080932B2 Electronic device with printed circuit board stress monitoring 有权
标题翻译：带印刷电路板的电子元件应力监测
公开(公告)号：US09080932B2
公开(公告)日：2015-07-14
申请号：US13892748
申请日：2013-05-13
申请人： Apple Inc.
发明人： Dhaval N. Shah , Shayan Malek , Vivek Katiyar
IPC分类号： G01N3/30 , G01M99/00 , G01N3/303 , G01N33/00
CPC分类号： G01N3/30 , G01L1/2262 , G01L1/2287 , G01M5/0033 , G01M99/00 , G01N3/303 , G01N2033/0078 , G01P15/0891 , G06F1/1633 , H04M1/0277 , H04M1/185 , H04M2250/12
摘要： An electronic device may contain electrical components mounted on one or more substrates such as printed circuit boards. During a drop event, the printed circuit boards and components may be subjected to stresses. Strain gauges may be formed from metal traces embedded within dielectric layers in the printed circuit boards. The strain gauges may be used to make stress measurements at various locations on the boards. Stress data may be collected in response to data from an accelerometer indicating that the device has been dropped. Stress data collection may be halted in response to determining that the device has struck an external surface. Impact may be detected using accelerometer data, strain gauge output, or other sensor data. Stress data may be analyzed by the electronic device or external equipment.
摘要翻译：电子设备可以包含安装在诸如印刷电路板的一个或多个基板上的电气部件。在跌落事件期间，印刷电路板和部件可能受到应力。应变计可以由嵌入印刷电路板的电介质层中的金属迹线形成。应变计可用于在板上的各个位置进行应力测量。应答数据可以响应于来自加速度计的数据而被收集，表示该设备已被丢弃。响应于确定设备已经撞击到外部表面，可以停止压力数据收集。可以使用加速度计数据，应变计输出或其他传感器数据检测影响。应力数据可以由电子设备或外部设备分析。

5. 发明授权

US08746088B2 Cycle life testing machine for pivotable articles 失效
标题翻译：可转动物品循环寿命试验机
公开(公告)号：US08746088B2
公开(公告)日：2014-06-10
申请号：US13303401
申请日：2011-11-23
申请人： Teng-Tsung Huang , Yong-Bing Hu , Yuan-Zhao Li , Zhan Shang
发明人： Teng-Tsung Huang , Yong-Bing Hu , Yuan-Zhao Li , Zhan Shang
IPC分类号： G01M99/00
CPC分类号： G01N3/32 , G01M99/007 , G01N2033/0078 , G01N2203/0005 , G01N2203/0282
摘要： A cycle life testing machine includes a controller, a clamping device, a driver, and a cycle device. The cycle device includes a servo motor, an actuator, a shaft, and a swing rod. The controller sends a signal to control the driver to trigger working of the servo motor, and the servo motor drives the actuator and the shaft rotate to swing the swing rod in a cycle procedure specified by the controller.
摘要翻译：循环寿命试验机包括控制器，夹紧装置，驱动器和循环装置。循环装置包括伺服电动机，致动器，轴和摆动杆。控制器发出一个信号，控制驱动器触发伺服电机的工作，伺服电机驱动执行机构，转轴旋转摆动杆，按照控制器指定的循环过程。

6. 发明申请

US20140039808A1 METHOD FOR ASSESSING WEAR IN MOLDING MACHINE 有权
标题翻译：评估成型机磨损的方法
公开(公告)号：US20140039808A1
公开(公告)日：2014-02-06
申请号：US14055111
申请日：2013-10-16
申请人： TOYO MACHINERY & METAL CO., LTD.
发明人： Kazuyuki Shibata , Akira Inoue , Yasutake Sawada , Kensuke Moritani
IPC分类号： G01N23/00
CPC分类号： G01N23/00 , B29C45/60 , B29C45/76 , B29C2945/76173 , B29C2945/76187 , G01N3/565 , G01N2033/0078 , G01N2033/0096 , G01N2035/00346
摘要： A first chromium mass concentration and a first reference mass concentration are extracted from a first test substance made by adding a predetermined amount of calcium to a predetermined amount of pellets; a reference value is calculated on the basis thereof. A second chromium mass concentration and a second reference mass concentration are extracted from a second test substance made by adding, to a predetermined amount of the substance contained in the molded part, an amount of calcium identical to the amount added to the pellets; a comparative value is calculated on the basis thereof. A screw can be determined to have wear whenever the comparative value is not less than a numerical value 60 times that of the reference value, whereas the screw can be determined not to have wear whenever the comparative value is less than a numerical value 60 times that of the reference value.
摘要翻译：从通过将预定量的钙添加到预定量的颗粒而制备的第一测试物质中提取第一铬质量浓度和第一参考质量浓度; 基于此计算基准值。从第二测试物质中提取第二铬质量浓度和第二参考质量浓度，所述第二测试物质通过向预定量的所述模制部件中包含的物质加入与添加到颗粒中的量相同的钙量; 基于此计算比较值。当比较值不小于参考值的数值的数值时，可以确定螺钉是否具有磨损，而只要比较值小于数值60倍的数值，就可以确定螺钉不磨损的参考值。

7. 发明授权

US08291772B2 Method and apparatus for testing shear fasteners used in downhole tools 有权
标题翻译：用于井下工具中使用的剪切紧固件的方法和装置
公开(公告)号：US08291772B2
公开(公告)日：2012-10-23
申请号：US12821597
申请日：2010-06-23
申请人： Abel Lopez, III
发明人： Abel Lopez, III
IPC分类号： G01N3/02 , G01N3/24
CPC分类号： G01N3/24 , G01M99/007 , G01N2033/0078
摘要： A tester for testing a shear fastener includes: a frame; a stationary chuck connected to the frame; a linear guide comprising a slider; a movable chuck connected to the slider; a movable insert fastened to the movable chuck and having a hole for receiving a first portion of the shear fastener; a stationary insert fastened to the stationary chuck and having a hole for receiving a second portion of the shear fastener; a linear actuator for engaging the movable chuck and fracturing the shear fastener; and a load cell for determining force exerted on the shear fastener by the linear actuator.
摘要翻译：用于测试剪切紧固件的测试器包括：框架; 连接到框架的固定卡盘; 包括滑块的线性引导件; 连接到滑块的可动卡盘; 可移动的插入件，其紧固到所述可移动卡盘并具有用于接收所述剪切紧固件的第一部分的孔; 固定的插入件，固定在固定卡盘上，并具有用于接收剪切紧固件的第二部分的孔; 线性致动器，用于接合可移动卡盘并压裂剪切紧固件; 以及用于确定由线性致动器施加在剪切紧固件上的力的测力传感器。

8. 发明申请

US20110166822A1 REED TESTING DEVICE FOR SINGLE-REED INSTRUMENT 有权
标题翻译：用于单片仪的REED测试装置
公开(公告)号：US20110166822A1
公开(公告)日：2011-07-07
申请号：US13000574
申请日：2010-07-05
申请人： Khoi Hanai
发明人： Khoi Hanai
IPC分类号： G06F19/00
CPC分类号： G01N3/20 , G01N2033/0078 , G10D9/023
摘要： Objective index is indicated with respect to the characteristic comparison between the front and the back sides of the reed, the right and left balance, and the hardness characteristic compared to the reference reed. A holder guiding member 11 is disposed on a rotating table 2, and a holder 10 is detachably mounted on the holder guiding member 11. The holder 10 holds the test object reed R. Testing of the front and the back surfaces of the reed R is performed by turning the holder 10 upside down. A probe 20 is made contact with the surface of the reed R with the constant pressure force, and the deformation degree of the probe 20 is detected by a displacement sensor 30 with rotating the rotating table 2. The rigidity distribution of reed R in the width direction is obtained by the displacement sensor 30. The rigidity distribution characteristics of the front and the back sides are tested by displaying the front-side characteristic graph and the reversed back-side characteristic graph on one screen. The balance index is calculated from the areas resultantly generated by superimposing the front-and-back-side characteristic graphs with the reversed graphs thereof. The hardness index is obtained based on the integrating value of the front-and-back-side characteristics and the integrating value of the front-and-back-side characteristics of the reference reed.
摘要翻译：相对于参考簧片，相对于簧片的正面和背面之间的特征比较，右侧和左侧平衡以及硬度特性来指示目标指数。保持器引导构件11设置在旋转台2上，并且保持器10可拆卸地安装在保持器引导构件11上。保持器10保持测试对象芦苇R。簧片R的正面和背面的测试是通过将支架10反转而进行。探头20以恒定的压力与簧片R的表面接触，并且通过使旋转台2转动的位移传感器30检测探头20的变形程度。舌簧R的刚度分布在宽度通过位移传感器30获得方向。通过在一个屏幕上显示前侧特性图和反转背面特性图来测试前侧和后侧的刚度分布特性。平衡指数是通过将前后特性曲线图与其相反图叠加而产生的区域计算的。基于前后特性的积分值和参考簧片的前后特性的积分值获得硬度指数。

9. 发明申请

US20100300193A1 ADHESION MEASURING APPARATUS 失效
标题翻译：粘合测量装置
公开(公告)号：US20100300193A1
公开(公告)日：2010-12-02
申请号：US12604342
申请日：2009-10-22
申请人： BING-JUN ZHANG
发明人： BING-JUN ZHANG
IPC分类号： G01N19/04
CPC分类号： G01N19/04 , G01N2033/0078
摘要： A measuring apparatus is provided for measuring the coating adhesion of an edge or a corner of an object. The measuring apparatus includes a platform, a fixing assembly to fix the object, a supporting plate fastened to the platform, a loading mechanism pivotably attached to the supporting plate, a travelling limiting member fastened to the supporting plate to limit the pivoting angle of the loading mechanism, and a friction block installed to the loading mechanism and slidably abutting against and reciprocatingly rubbing the edge or corner of the object within a predetermined traveling distance. The predetermined traveling distance is limited by the traveling limiting member.
摘要翻译：提供了一种用于测量物体的边缘或角落的涂层粘附性的测量装置。测量装置包括平台，用于固定物体的固定组件，固定到平台的支撑板，可枢转地连接到支撑板上的装载机构，固定到支撑板的行进限制构件，以限制装载物的枢转角度机构，以及安装在所述装载机构上的摩擦块，并且在预定行驶距离内可滑动地抵靠并往复地摩擦所述物体的边缘或拐角。预定行驶距离受行驶限制件的限制。

10. 发明授权

US06912916B1 Polyvalent test stand 失效
标题翻译：多价试验台
公开(公告)号：US06912916B1
公开(公告)日：2005-07-05
申请号：US10923696
申请日：2004-08-24
申请人： Pierre Joubert
发明人： Pierre Joubert
IPC分类号： B66C15/00 , G01M99/00 , G01N3/02 , G01N33/00
CPC分类号： G01N3/02 , B66C15/00 , G01N2033/0078 , G01N2203/0246 , G01N2203/0623
摘要： A test stand for allowing the testing of both a pull-type lifting apparatus and a push-type lifting apparatus. The test stand includes a base and a carriage component, the carriage component including a load transmitting section and a sensor receiving section. The load transmitting section and the sensor receiving section are spaced apart by spacing members. The spacing members are slidably mounted to the base for allowing a sliding movement of the carriage component relative to the base between a retracted configuration and an extended configuration. A load sensor provides a measurement of a force biasing the carriage component towards the extended configuration. The carriage component is configured and sized for allowing the push-type lifting apparatus to be inserted between the base and the load transmitting section so as to bias the carriage component towards the extended configuration and for allowing the attachment of the pull-type lifting apparatus to the load transmitting section so as to bias the carriage component towards the extended configuration.
摘要翻译：用于允许对拉式提升装置和推式提升装置进行测试的试验台。测试台包括基座和托架部件，滑架部件包括负载传递部分和传感器接收部分。负载传递部分和传感器接收部分间隔开间隔构件。间隔构件可滑动地安装到基座，以允许托架部件相对于基座在缩回构型和延伸构型之间滑动。载荷传感器提供将托架部件朝向延伸构型偏置的力的测量。托架部件的构造和尺寸被设计成允许推式提升装置插入在基座和负载传递部分之间，以便将托架部件朝向延伸构造偏置，并且允许拉式提升装置的附接载荷传递部分，以便将滑架部件偏向延伸构型。

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