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    • 9. 发明授权
    • Instrument for high throughput measurement of material physical properties of a plurality of samples
    • 用于高通量测量多个样品的材料物理性质的仪器
    • US06679130B2
    • 2004-01-20
    • US09779148
    • 2001-02-08
    • Damian HajdukEric CarlsonJ. Christopher FreitagOleg Kosolov
    • Damian HajdukEric CarlsonJ. Christopher FreitagOleg Kosolov
    • G01N300
    • B01L3/5085B01J2219/00707B01J2219/00718G01N5/00G01N11/00G01N19/00G01N29/02G01N29/222G01N2203/0286G01N2291/02466G01N2291/0255G01N2291/02818G01N2291/106Y10T436/12
    • An apparatus and method for screening combinatorial libraries of materials by measuring the response of individual library members to mechanical perturbations is described. The apparatus generally includes a sample holder for containing the library members, an array of probes for mechanically perturbing individual library members, and an array of sensors for measuring the response of each of the library members to the mechanical perturbations. Library members undergoing screening make up a sample array, and individual library members constitute elements of the sample array that are confined to specific locations on the sample holder. During screening, the apparatus mechanically perturbs individual library members by displacing the sample array (sample holder) and the array of probes. Typically, all of the elements of the sample array are perturbed simultaneously, but the apparatus also can also perturb individual or groups of sample array elements sequentially. The flexible apparatus and method can screen libraries of materials based on many different bulk physical properties, including Young's modulus (flexure, uniaxial extension, biaxial compression, and shear); hardness (indentation), failure (stress and strain at failure, toughness), adhesion (tack, loop tack), and flow (viscosity, melt flow indexing, and rheology), among others.
    • 描述了通过测量单个文库成员对机械扰动的响应来筛选材料组合文库的装置和方法。 该装置通常包括用于容纳库构件的样本保持器,用于机械扰乱各个库构件的探针阵列,以及用于测量每个库构件对机械扰动的响应的传感器阵列。 正在进行筛选的图书馆成员组成一个样本数组,单独的图书馆成员构成了样本数组的元素,它们限于样本持有者的特定位置。 在筛选期间,设备通过移位样品阵列(样品架)和探针阵列来机械地干扰各个库成员。 通常,样本阵列的所有元素都被同时扰动,但是该装置也可以顺序扰乱单个或组的样本阵列元素。 灵活的装置和方法可以基于许多不同的体积物理性质(包括杨氏模量(挠曲,单轴延伸,双轴压缩和剪切))筛选材料库; 硬度(压痕),破坏(破坏时的应力和应变,韧性),粘附性(粘性,环粘性)和流动性(粘度,熔体流动指数和流变学)等。