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    • 5. 发明授权
    • Ion trapping
    • 离子捕获
    • US07847243B2
    • 2010-12-07
    • US11909850
    • 2006-03-29
    • Alexander Alekseevich MakarovEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • Alexander Alekseevich MakarovEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • H01J49/00
    • H01J49/423H01J49/004H01J49/425H01J49/4295
    • This invention relates to a method of trapping ions and to an ion trapping assembly. In particular, the present invention has application in gas-assisted trapping of ions in an ion trap prior to a mass analysis of the ions in a mass spectrometer. The invention provides a method of trapping ions in a target ion trap of an ion trapping assembly that comprises a series of volumes arranged such that ions can traverse from one volume to the next, the volumes including the target ion trap, whereby ions are allowed to pass repeatedly through the volumes such that they also pass into and out from the target ion trap without being trapped. Potentials may be used to reflect the ions from respective ends of the ion trapping assembly. Optionally, a potential well and/or gas-assisted cooling may be used to cause the ions to settle in the target ion trap.
    • 本发明涉及一种捕获离子和离子捕获组件的方法。 特别地,本发明在质谱仪中对离子的质量分析之前,已经将其应用于离子阱中的气体辅助捕获。 本发明提供了一种捕集离子捕获组件的靶离子阱中的离子的方法,该离子捕获组件包括一系列体积,这些体积被布置成使得离子可以从一个体积向下一个体积穿过,包括靶离子阱,其中离子被允许 反复通过体积,使得它们也被进入和离开目标离子阱而不被捕获。 电位可用于从离子捕获组件的相应末端反射离子。 任选地,潜在的井和/或气体辅助冷却可用于使离子沉淀在目标离子阱中。
    • 6. 发明申请
    • ION TRAPPING
    • 离子捕捉
    • US20110057099A1
    • 2011-03-10
    • US12944357
    • 2010-11-11
    • Alexander Alekseevich MAKAROVEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • Alexander Alekseevich MAKAROVEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • H01J49/04
    • H01J49/423H01J49/004H01J49/425H01J49/4295
    • This invention relates to a method of trapping ions and to an ion trapping assembly. In particular, the present invention has application in gas-assisted trapping of ions in an ion trap prior to a mass analysis of the ions in a mass spectrometer. The invention provides a method of trapping ions in a target ion trap of an ion trapping assembly that comprises a series of volumes arranged such that ions can traverse from one volume to the next, the volumes including the target ion trap, whereby ions are allowed to pass repeatedly through the volumes such that they also pass into and out from the target ion trap without being trapped. Potentials may be used to reflect the ions from respective ends of the ion trapping assembly. Optionally, a potential well and/or gas-assisted cooling may be used to cause the ions to settle in the target ion trap.
    • 本发明涉及一种捕获离子和离子捕获组件的方法。 特别地,本发明在质谱仪中对离子的质量分析之前,已经将其应用于离子阱中的气体辅助捕获。 本发明提供了一种捕集离子捕获组件的靶离子阱中的离子的方法,该离子捕获组件包括一系列体积,这些体积被布置成使得离子可以从一个体积向下一个体积穿过,包括靶离子阱,其中离子被允许 反复通过体积,使得它们也被进入和离开目标离子阱而不被捕获。 电位可用于从离子捕获组件的相应末端反射离子。 任选地,潜在的井和/或气体辅助冷却可用于使离子沉淀在目标离子阱中。
    • 7. 发明申请
    • Ion Trapping
    • 离子捕获
    • US20080156984A1
    • 2008-07-03
    • US11909850
    • 2006-03-29
    • Alexander Alekseevich MakarovEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • Alexander Alekseevich MakarovEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • H01J49/00
    • H01J49/423H01J49/004H01J49/425H01J49/4295
    • This invention relates to a method of trapping ions and to an ion trapping assembly. In particular, the present invention has application in gas-assisted trapping of ions in an ion trap prior to a mass analysis of the ions in a mass spectrometer. The invention provides a method of trapping ions in a target ion trap of an ion trapping assembly that comprises a series of volumes arranged such that ions can traverse from one volume to the next, the volumes including the target ion trap, whereby ions are allowed to pass repeatedly through the volumes such that they also pass into and out from the target ion trap without being trapped. Potentials may be used to reflect the ions from respective ends of the ion trapping assembly. Optionally, a potential well and/or gas-assisted cooling may be used to cause the ions to settle in the target ion trap.
    • 本发明涉及一种捕获离子和离子捕获组件的方法。 特别地,本发明在质谱仪中对离子的质量分析之前,已经将其应用于离子阱中的气体辅助捕获。 本发明提供了一种捕集离子捕获组件的靶离子阱中的离子的方法,该离子捕获组件包括一系列体积排列使得离子可以从一个体积向下一个体积移动,所述体积包括目标离子阱,由此离子被允许 反复通过体积,使得它们也被进入和离开目标离子阱而不被捕获。 电位可用于从离子捕获组件的相应末端反射离子。 任选地,潜在的井和/或气体辅助冷却可用于使离子沉淀在目标离子阱中。
    • 8. 发明授权
    • Method and apparatus for ion fragmentation by electron capture
    • 通过电子捕获离子碎裂的方法和装置
    • US07612335B2
    • 2009-11-03
    • US10592744
    • 2005-03-29
    • Alexander Alekseevich MakarovEduard V. DenisovGerhard Jung
    • Alexander Alekseevich MakarovEduard V. DenisovGerhard Jung
    • H01J49/26
    • H01J49/0054
    • The present invention relates to a method and apparatus for ion fragmentation by electron capture. The present invention provides a method of generating fragment ions by electron capture, comprising; directing ions to be fragmented into a fragmentation chamber of a mass spectrometer into a fragmentation chamber of a mass spectrometer arrangement; trapping at least some of the ions to be fragmented in at least one direction of the fragmentation chamber by using a magnetic field, the ions being trapped within a volume V; generating an electron beam using an electron source located away from the volume V; irradiating the trapped ions in the volume V with the electrons generated by the electron source in the presence of the said magnetic field, so as to cause dissociation; and ejecting the resultant fragment ions from the fragmentation chamber for subsequent analysis at a different location away from the fragmentation chamber.
    • 本发明涉及一种通过电子捕获离子破碎的方法和装置。 本发明提供了一种通过电子捕获产生碎片离子的方法,包括: 将离子分散成质谱仪的碎裂室进入质谱仪布置的碎裂室; 通过使用磁场捕获在碎裂室的至少一个方向上被分段的至少一些离子,离子被捕获在体积V内; 使用远离体积V的电子源产生电子束; 在存在所述磁场的情况下用电子源产生的电子照射体积V中的被俘获的离子,从而导致解离; 并将所得的碎片离子从碎裂室排出,以便在远离碎裂室的不同位置进行后续分析。
    • 9. 发明授权
    • Ion trapping
    • 离子捕获
    • US08288714B2
    • 2012-10-16
    • US12944357
    • 2010-11-11
    • Alexander A. MakarovEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • Alexander A. MakarovEduard V. DenisovGerhard JungRobert MalekOliver Lange
    • H01J49/00
    • H01J49/423H01J49/004H01J49/425H01J49/4295
    • This invention relates to a method of trapping ions and to an ion trapping assembly. In particular, the present invention has application in gas-assisted trapping of ions in an ion trap prior to a mass analysis of the ions in a mass spectrometer. The invention provides a method of trapping ions in a target ion trap of an ion trapping assembly that comprises a series of volumes arranged such that ions can traverse from one volume to the next, the volumes including the target ion trap, whereby ions are allowed to pass repeatedly through the volumes such that they also pass into and out from the target ion trap without being trapped. Potentials may be used to reflect the ions from respective ends of the ion trapping assembly. Optionally, a potential well and/or gas-assisted cooling may be used to cause the ions to settle in the target ion trap.
    • 本发明涉及一种捕获离子和离子捕获组件的方法。 特别地,本发明在质谱仪中对离子的质量分析之前,已经将其应用于离子阱中的气体辅助捕获。 本发明提供了一种捕获离子捕获组件的靶离子阱中的离子的方法,该方法包括一系列体积排列使得离子可以从一个体积向下一个体积横越,该体积包括目标离子阱,从而使离子被允许 反复通过体积,使得它们也被进入和离开目标离子阱而不被捕获。 电位可用于从离子捕获组件的相应末端反射离子。 任选地,潜在的井和/或气体辅助冷却可用于使离子沉淀在目标离子阱中。