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1. 发明申请

US20120182653A1 SEMICONDUCTOR MODULE AND SYSTEM INCLUDING THE SAME 审中-公开
标题翻译：半导体模块和系统，包括它们
公开(公告)号：US20120182653A1
公开(公告)日：2012-07-19
申请号：US13316020
申请日：2011-12-09
申请人： Joo-Han LEE , Young-Soo AN , Yong-Hyun KIM , Seong-Chan HAN
发明人： Joo-Han LEE , Young-Soo AN , Yong-Hyun KIM , Seong-Chan HAN
IPC分类号： H02H9/04
CPC分类号： H02H9/046 , H05K1/0259
摘要： A semiconductor module includes a printed circuit board, at least one on-board device unit coupled between at least one voltage line and a power line. The at least on-board device unit is mounted on the printed circuit board. At least one electrostatic discharge protection circuit unit, configured to protect the at least one on-board device unit from an electrostatic discharge that occurs in the at least one voltage line, is coupled to the at least one voltage line.
摘要翻译：半导体模块包括印刷电路板，耦合在至少一个电压线和电力线之间的至少一个板上器件单元。至少车载设备单元安装在印刷电路板上。至少一个静电放电保护电路单元被配置为保护至少一个板上器件单元免于在至少一个电压线中发生的静电放电，耦合到至少一个电压线。

2. 发明授权

US08139949B2 Electrical signal transmission module, method of transmitting electric signals and electrical inspection apparatus having the same 有权
标题翻译：电信号传输模块，发送电信号的方法和具有该信号的电气检查装置
公开(公告)号：US08139949B2
公开(公告)日：2012-03-20
申请号：US12179015
申请日：2008-07-24
申请人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
发明人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
IPC分类号： H04B10/12
CPC分类号： H04B10/2504 , G01R31/2889 , H04B10/801
摘要： An electrical signal transmission module includes a plurality of optical signal lines and a plurality of electrical signal lines. The plurality of optical signal lines converting a first externally input electrical signal into an optical signal, transmitting the optical signal, converting the optical signal back into the first electrical signal, and outputting the first electrical signal. The plurality of electrical signal lines transmitting a second externally input electrical signal and outputting the second electrical signal.
摘要翻译：电信号传输模块包括多个光信号线和多个电信号线。多个光信号线将第一外部输入的电信号转换为光信号，发送光信号，将光信号转换回第一电信号，并输出第一电信号。多个电信号线发送第二外部输入电信号并输出第二电信号。

3. 发明授权

US07659735B2 Probe card capable of multi-probing 有权
标题翻译：探头卡能够进行多次探测
公开(公告)号：US07659735B2
公开(公告)日：2010-02-09
申请号：US11646014
申请日：2006-12-27
申请人： Min-gu Kim , Ho-jeong Choi , Young-soo An
发明人： Min-gu Kim , Ho-jeong Choi , Young-soo An
IPC分类号： G01R31/02
CPC分类号： G01R31/2886 , G01R31/2889
摘要： A probe card capable of multi-probing includes a print circuit board having a plurality of contact portions and a test module having a plurality of test boards. Each of the test boards includes at least one probing portion on which a plurality of needles are arrayed. The test module selects one of the test boards and probes semiconductor chips formed on a semiconductor wafer through the needles arrayed on the probing portion of the selected test board.
摘要翻译：能够进行多次探测的探针卡包括具有多个接触部分的印刷电路板和具有多个测试板的测试模块。每个测试板包括至少一个探针部分，多个针排列在该探测部分上。测试模块通过布置在所选择的测试板的探测部分上的针来选择形成在半导体晶片上的测试板和探测半导体芯片之一。

4. 发明授权

US07538566B2 Electrical test system including coaxial cables 有权
标题翻译：电测试系统包括同轴电缆
公开(公告)号：US07538566B2
公开(公告)日：2009-05-26
申请号：US11926172
申请日：2007-10-29
申请人： Young-Soo An , Se-Jang Oh , Jung-Hyun Nam
发明人： Young-Soo An , Se-Jang Oh , Jung-Hyun Nam
IPC分类号： G01R31/02 , G01R31/28
CPC分类号： G01R31/2889
摘要： An electrical test system includes a test head, a performance board, a probe card and coaxial cables. The performance board includes a first side and an opposite second side, where the first side of the performance board is electrically connected to the test head and the second side of the performance board includes first coaxial cable connection portions. The probe card includes a first side and an opposite second side, where the first side of the probe card includes second coaxial cable connection portions and the second side includes a wafer test probes. The coaxial cables respectively electrically connect the first coaxial cable connection portions of the performance board to the second coaxial cable connection portions of the probe card.
摘要翻译：电气测试系统包括测试头，演奏板，探针卡和同轴电缆。所述性能板包括第一侧和相对的第二侧，其中所述性能板的第一侧电连接到所述测试头，并且所述性能板的第二侧包括第一同轴电缆连接部分。探针卡包括第一侧和相对的第二侧，其中探针卡的第一侧包括第二同轴电缆连接部分，并且第二侧包括晶片测试探针。同轴电缆分别将性能板的第一同轴电缆连接部分电连接到探针卡的第二同轴电缆连接部分。

5. 发明申请

US20090028571A1 ELECTRICAL SIGNAL TRANSMISSION MODULE, METHOD OF TRANSMITTING ELECTRIC SIGNALS AND ELECTRICAL INSPECTION APPARATUS HAVING THE SAME 有权
标题翻译：电子信号传输模块，发送电信号的方法和具有该信号的电子检测装置
公开(公告)号：US20090028571A1
公开(公告)日：2009-01-29
申请号：US12179015
申请日：2008-07-24
申请人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
发明人： Sang-Hoon Lee , Ho-Jeong Choi , Se-Jang Oh , Young-Soo An , Gyu-Yeol Kim
IPC分类号： H04B10/00
CPC分类号： H04B10/2504 , G01R31/2889 , H04B10/801
摘要： An electrical signal transmission module includes a plurality of optical signal lines and a plurality of electrical signal lines. The plurality of optical signal lines converting a first externally input electrical signal into an optical signal, transmitting the optical signal, converting the optical signal back into the first electrical signal, and outputting the first electrical signal. The plurality of electrical signal lines transmitting a second externally input electrical signal and outputting the second electrical signal.
摘要翻译：电信号传输模块包括多个光信号线和多个电信号线。多个光信号线将第一外部输入的电信号转换为光信号，发送光信号，将光信号转换回第一电信号，并输出第一电信号。多个电信号线发送第二外部输入电信号并输出第二电信号。

6. 发明申请

US20080164898A1 Probe card for test of semiconductor chips and method for test of semiconductor chips using the same 审中-公开
标题翻译：用于半导体芯片测试的探针卡和使用其的半导体芯片的测试方法
公开(公告)号：US20080164898A1
公开(公告)日：2008-07-10
申请号：US12005888
申请日：2007-12-28
申请人： Sung-Hoon Bae , Jung-Hyeon Kim , Young-Soo An , Ho-Jeong Choi , Myoung-Sub Kim
发明人： Sung-Hoon Bae , Jung-Hyeon Kim , Young-Soo An , Ho-Jeong Choi , Myoung-Sub Kim
IPC分类号： G01R31/02
CPC分类号： G01R1/07385 , G01R1/07342
摘要： There are provided a probe card for test of semiconductor chips and a method for testing semiconductor chips using the probe card. In implementing the probe card for electrically testing semiconductor chips, the probe blocks corresponding to multiple selected ones of the semiconductor chips on the wafer can be selected so that the selected semiconductor chips are EDS tested in a one-step process. As the selected semiconductor chips are EDS tested in a one-step process, equipment efficiency is improved, and statistical objectivity of data indicating characteristics of the wafer can be achieved.
摘要翻译：提供了用于半导体芯片测试的探针卡和使用探针卡测试半导体芯片的方法。在实现用于电测试半导体芯片的探针卡时，可以选择对应于晶片上的多个选定的半导体芯片的探针块，使得所选择的半导体芯片在一步法中进行EDS测试。由于所选择的半导体芯片在一步法中进行了EDS测试，所以提高了设备效率，并且可以实现表示晶片特性的数据的统计客观性。

7. 发明授权

US08866810B2 Mobile terminal and display controlling method thereof 有权
标题翻译：移动终端及其显示控制方法
公开(公告)号：US08866810B2
公开(公告)日：2014-10-21
申请号：US12769604
申请日：2010-04-28
申请人： Eun Woo Cho , Hyun Bin Shin , Joon Hun Shin , Young Soo An
发明人： Eun Woo Cho , Hyun Bin Shin , Joon Hun Shin , Young Soo An
IPC分类号： G06T15/00 , G06F1/16 , G06F3/0481 , G06F3/0488
CPC分类号： G06F3/0488 , G06F1/1616 , G06F1/1637 , G06F1/1643 , G06F1/1647 , G06F1/1677 , G06F1/1684 , G06F1/169 , G06F3/0481 , G06F3/04815 , G06F2203/04802
摘要： A mobile terminal and display controlling method thereof are provided. The present invention includes determining a polyhedral shape to correspond to a number of display target objects, designating the number of display target objects to facets of a polyhedron having the determined polyhedral shape, displaying the polyhedron having the determined polyhedral shape in a three-dimensional rotational position, and displaying the number of display target objects on the designated facets of the polyhedron.
摘要翻译：提供了一种移动终端及其显示控制方法。本发明包括确定对应于多个显示目标对象的多面体形状，将具有确定的多面体形状的多面体的显示目标对象的数目指定为多面体的面，将具有确定的多面体形状的多面体显示为三维旋转位置，并在多面体的指定面上显示显示目标对象的数量。

8. 发明授权

US07884628B2 Interposer and probe card having the same 有权
标题翻译：内插器和探针卡具有相同的功能
公开(公告)号：US07884628B2
公开(公告)日：2011-02-08
申请号：US12285962
申请日：2008-10-17
申请人： Young-Soo An , Sang-Hoon Lee , Se-Jang Oh
发明人： Young-Soo An , Sang-Hoon Lee , Se-Jang Oh
IPC分类号： G01R31/02
CPC分类号： G01R31/2889 , H01R12/714
摘要： An interposer may include a first base, at least one first signal line in the first base, and at least one first ground line in the first base, wherein the ground line surrounds the at least one first signal line. The at least one first signal line and the at least one first ground line may be exposed through an upper surface of the first base. The at least one first signal line may be configured to conduct a test current through the first base. An interposer may also include a second base below the first base and may include a printed circuit board between the first base and the second base. A probe card may include a multilayer substrate having at least one contact needle, a coaxial board having at least one coaxial signal cable and the above described interposer between the multilayer substrate and the coaxial board.
摘要翻译：插入器可以包括第一基极，第一基极中的至少一个第一信号线和第一基极中的至少一个第一接地线，其中接地线包围至少一个第一信号线。所述至少一个第一信号线和所述至少一个第一接地线可以通过所述第一基座的上表面暴露。所述至少一个第一信号线可以被配置为进行穿过所述第一基座的测试电流。插入器还可以包括位于第一基座下方的第二基座，并且可以包括在第一基座和第二基座之间的印刷电路板。探针卡可以包括具有至少一个接触针的多层衬底，具有至少一个同轴信号电缆的同轴板以及多层衬底和同轴板之间的上述插入器。

9. 发明授权

US07880490B2 Wireless interface probe card for high speed one-shot wafer test and semiconductor testing apparatus having the same 有权
标题翻译：无线接口探针卡，用于高速单片晶圆测试和半导体测试装置
公开(公告)号：US07880490B2
公开(公告)日：2011-02-01
申请号：US12200716
申请日：2008-08-28
申请人： Sang-Hoon Lee , Kwang-Yong Lee , Se-Jang Oh , Young-Soo An
发明人： Sang-Hoon Lee , Kwang-Yong Lee , Se-Jang Oh , Young-Soo An
IPC分类号： G01R31/28
CPC分类号： G01R31/2889 , G01R31/3025
摘要： A wireless interface probe card includes a substrate member and a transmission member. The substrate member has a plurality of probe terminals arranged at a constant pitch. The probe terminals may directly contact a plurality of pads arranged at a constant pitch on each of a plurality of semiconductor chips arranged on a wafer to perform a test of the semiconductor chips arranged on the wafer. The transmission member is arranged on the substrate member, wirelessly receives a test signal and provides the received test signal to the pads of the wafer through the probe terminals, and wirelessly and externally transmits an electrical characteristic signal provided from the pads of the wafer through the probe terminals.
摘要翻译：无线接口探针卡包括基板部件和传输部件。基板构件具有以恒定间距排列的多个探针端子。探针端子可以直接接触布置在晶片上的多个半导体芯片中的每一个上以恒定间距布置的多个焊盘，以对布置在晶片上的半导体芯片进行测试。传输构件布置在基板构件上，无线地接收测试信号，并通过探针端子将接收到的测试信号提供给晶片的焊盘，并且通过以下方式无线地和外部地传输从晶片的焊盘提供的电特性信号探头端子。

10. 发明申请

US20100315417A1 MOBILE TERMINAL AND DISPLAY CONTROLLING METHOD THEREOF 有权
标题翻译：移动终端和显示控制方法
公开(公告)号：US20100315417A1
公开(公告)日：2010-12-16
申请号：US12769604
申请日：2010-04-28
申请人： Eun Woo CHO , Hyun Bin Shin , Joon Hun Shin , young Soo An
发明人： Eun Woo CHO , Hyun Bin Shin , Joon Hun Shin , young Soo An
IPC分类号： G06T15/00
CPC分类号： G06F3/0488 , G06F1/1616 , G06F1/1637 , G06F1/1643 , G06F1/1647 , G06F1/1677 , G06F1/1684 , G06F1/169 , G06F3/0481 , G06F3/04815 , G06F2203/04802
摘要： A mobile terminal and display controlling method thereof are provided. The present invention includes determining a polyhedral shape to correspond to a number of display target objects, designating the number of display target objects to facets of a polyhedron having the determined polyhedral shape, displaying the polyhedron having the determined polyhedral shape in a three-dimensional rotational position, and displaying the number of display target objects on the designated facets of the polyhedron.
摘要翻译：提供了一种移动终端及其显示控制方法。本发明包括确定对应于多个显示目标对象的多面体形状，将具有确定的多面体形状的多面体的显示目标对象的数目指定为多面体的面，将具有确定的多面体形状的多面体显示为三维旋转位置，并在多面体的指定面上显示显示目标对象的数量。

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