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    • 3. 发明申请
    • Interposer and probe card having the same
    • 内插器和探针卡具有相同的功能
    • US20090102500A1
    • 2009-04-23
    • US12285962
    • 2008-10-17
    • Young-Soo AnSang-Hoon LeeSe-Jang Oh
    • Young-Soo AnSang-Hoon LeeSe-Jang Oh
    • G01R31/26H01R12/00
    • G01R31/2889H01R12/714
    • An interposer may include a first base, at least one first signal line in the first base, and at least one first ground line in the first base, wherein the ground line surrounds the at least one first signal line. The at least one first signal line and the at least one first ground line may be exposed through an upper surface of the first base. The at least one first signal line may be configured to conduct a test current through the first base. An interposer may also include a second base below the first base and may include a printed circuit board between the first base and the second base. A probe card may include a multilayer substrate having at least one contact needle, a coaxial board having at least one coaxial signal cable and the above described interposer between the multilayer substrate and the coaxial board.
    • 插入器可以包括第一基极,第一基极中的至少一个第一信号线和第一基极中的至少一个第一接地线,其中接地线包围至少一个第一信号线。 所述至少一个第一信号线和所述至少一个第一接地线可以通过所述第一基座的上表面暴露。 所述至少一个第一信号线可以被配置为进行穿过所述第一基座的测试电流。 插入器还可以包括位于第一基座下方的第二基座,并且可以包括在第一基座和第二基座之间的印刷电路板。 探针卡可以包括具有至少一个接触针的多层衬底,具有至少一个同轴信号电缆的同轴板以及多层衬底和同轴板之间的上述插入器。
    • 6. 发明授权
    • Interposer and probe card having the same
    • 内插器和探针卡具有相同的功能
    • US07884628B2
    • 2011-02-08
    • US12285962
    • 2008-10-17
    • Young-Soo AnSang-Hoon LeeSe-Jang Oh
    • Young-Soo AnSang-Hoon LeeSe-Jang Oh
    • G01R31/02
    • G01R31/2889H01R12/714
    • An interposer may include a first base, at least one first signal line in the first base, and at least one first ground line in the first base, wherein the ground line surrounds the at least one first signal line. The at least one first signal line and the at least one first ground line may be exposed through an upper surface of the first base. The at least one first signal line may be configured to conduct a test current through the first base. An interposer may also include a second base below the first base and may include a printed circuit board between the first base and the second base. A probe card may include a multilayer substrate having at least one contact needle, a coaxial board having at least one coaxial signal cable and the above described interposer between the multilayer substrate and the coaxial board.
    • 插入器可以包括第一基极,第一基极中的至少一个第一信号线和第一基极中的至少一个第一接地线,其中接地线包围至少一个第一信号线。 所述至少一个第一信号线和所述至少一个第一接地线可以通过所述第一基座的上表面暴露。 所述至少一个第一信号线可以被配置为进行穿过所述第一基座的测试电流。 插入器还可以包括位于第一基座下方的第二基座,并且可以包括在第一基座和第二基座之间的印刷电路板。 探针卡可以包括具有至少一个接触针的多层衬底,具有至少一个同轴信号电缆的同轴板以及多层衬底和同轴板之间的上述插入器。
    • 8. 发明授权
    • Electrical test system including coaxial cables
    • 电测试系统包括同轴电缆
    • US07538566B2
    • 2009-05-26
    • US11926172
    • 2007-10-29
    • Young-Soo AnSe-Jang OhJung-Hyun Nam
    • Young-Soo AnSe-Jang OhJung-Hyun Nam
    • G01R31/02G01R31/28
    • G01R31/2889
    • An electrical test system includes a test head, a performance board, a probe card and coaxial cables. The performance board includes a first side and an opposite second side, where the first side of the performance board is electrically connected to the test head and the second side of the performance board includes first coaxial cable connection portions. The probe card includes a first side and an opposite second side, where the first side of the probe card includes second coaxial cable connection portions and the second side includes a wafer test probes. The coaxial cables respectively electrically connect the first coaxial cable connection portions of the performance board to the second coaxial cable connection portions of the probe card.
    • 电气测试系统包括测试头,演奏板,探针卡和同轴电缆。 所述性能板包括第一侧和相对的第二侧,其中所述性能板的第一侧电连接到所述测试头,并且所述性能板的第二侧包括第一同轴电缆连接部分。 探针卡包括第一侧和相对的第二侧,其中探针卡的第一侧包括第二同轴电缆连接部分,并且第二侧包括晶片测试探针。 同轴电缆分别将性能板的第一同轴电缆连接部分电连接到探针卡的第二同轴电缆连接部分。