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    • 3. 发明申请
    • INTEGRATED CIRCUIT CHARACTERIZATION BASED ON MEASURED AND STATIC APPARENT RESISTANCES
    • 基于测量和稳定电阻的集成电路特性
    • US20140068532A1
    • 2014-03-06
    • US13603972
    • 2012-09-05
    • Suharli TedjaSwarupchandra KamerkarVineet SreekumarYadvinder Singh
    • Suharli TedjaSwarupchandra KamerkarVineet SreekumarYadvinder Singh
    • G06F17/50
    • G01R31/31924G01R31/3004G01R31/3008
    • First and second apparent resistance measures are determined for an integrated circuit and utilized to characterize the integrated circuit. The first apparent resistance measure is determined for the integrated circuit based on a first voltage drop and a first current that are measured using test equipment. The second apparent resistance measure is determined for the integrated circuit based on a second voltage drop and a second current that are obtained using static analysis of a corresponding integrated circuit design. The integrated circuit is characterized based on a comparison of the first and second apparent resistance measures. For example, characterizing the integrated circuit may comprise validating the static analysis of the integrated circuit design based on the comparison of the first and second apparent resistance measures, or determining a quality measure of the integrated circuit based on the comparison of the first and second apparent resistance measures.
    • 确定集成电路的第一和第二表观电阻措施,并用于表征集成电路。 基于使用测试设备测量的第一电压降和第一电流,确定集成电路的第一视在电阻测量。 基于使用对应的集成电路设计的静态分析获得的第二电压降和第二电流来确定集成电路的第二视在电阻测量。 基于第一和第二表观电阻测量的比较来表征集成电路。 例如,表征集成电路可以包括基于第一和第二视在电阻测量的比较来验证集成电路设计的静态分析,或者基于第一和第二表观的比较来确定集成电路的质量测量 抵抗措施。
    • 6. 发明申请
    • COMPOSITE SOURCE FOLLOWER
    • 复合源产品
    • US20050088205A1
    • 2005-04-28
    • US10694246
    • 2003-10-27
    • Sateh JalaleddineSuharli Tedja
    • Sateh JalaleddineSuharli Tedja
    • H03F3/50H03K3/00H03K5/02H03K5/153H03K5/24
    • H03F3/505H03F2203/5031H03K5/023H03K5/2481
    • A folded cascode device senses the drain current of a source follower, and a current mirror device multiplies the sensed drain current for application to an output load. The source follower and the current mirror device are preferably of the same type (e.g., both NMOS). The resulting composite source follower provides relatively wide bandwidth at relatively low power. The folded cascode allows (NMOS) source and sink control. Using current mirror feedback reduces the stability problems associated with other solutions that rely on a voltage feedback stage. Composite source followers of the present invention can be used in any traditional buffer applications, such as in operational amplifiers, regulators, or high-speed signal paths.
    • 折叠共源共栅器件感测源极跟随器的漏极电流,并且电流镜装置将感测到的漏极电流乘以输出负载。 源极跟随器和电流镜装置优选地具有相同类型(例如,两个NMOS)。 所得到的复合源跟随器在相对低的功率下提供相对宽的带宽。 折叠的共源共栅允许(NMOS)源极和漏极控制。 使用电流镜反馈减少了与依赖于电压反馈级的其他解决方案相关的稳定性问题。 本发明的复合源跟随器可以用于任何传统的缓冲器应用中,例如在运算放大器,调节器或高速信号路径中。
    • 7. 发明授权
    • Integrated circuit characterization based on measured and static apparent resistances
    • 基于测量和静态表观电阻的集成电路表征
    • US08832634B2
    • 2014-09-09
    • US13603972
    • 2012-09-05
    • Suharli TedjaSwarupchandra KamerkarVineet SreekumarYadvinder Singh
    • Suharli TedjaSwarupchandra KamerkarVineet SreekumarYadvinder Singh
    • G06F17/50
    • G01R31/31924G01R31/3004G01R31/3008
    • First and second apparent resistance measures are determined for an integrated circuit and utilized to characterize the integrated circuit. The first apparent resistance measure is determined for the integrated circuit based on a first voltage drop and a first current that are measured using test equipment. The second apparent resistance measure is determined for the integrated circuit based on a second voltage drop and a second current that are obtained using static analysis of a corresponding integrated circuit design. The integrated circuit is characterized based on a comparison of the first and second apparent resistance measures. For example, characterizing the integrated circuit may comprise validating the static analysis of the integrated circuit design based on the comparison of the first and second apparent resistance measures, or determining a quality measure of the integrated circuit based on the comparison of the first and second apparent resistance measures.
    • 确定集成电路的第一和第二表观电阻措施,并用于表征集成电路。 基于使用测试设备测量的第一电压降和第一电流,确定集成电路的第一视在电阻测量。 基于使用对应的集成电路设计的静态分析获得的第二电压降和第二电流来确定集成电路的第二视在电阻测量。 基于第一和第二表观电阻测量的比较来表征集成电路。 例如,表征集成电路可以包括基于第一和第二视在电阻测量的比较来验证集成电路设计的静态分析,或者基于第一和第二表观的比较来确定集成电路的质量测量 抵抗措施。
    • 9. 发明授权
    • Composite source follower
    • 复合源跟随器
    • US06924674B2
    • 2005-08-02
    • US10694246
    • 2003-10-27
    • Sateh M. JalaleddineSuharli Tedja
    • Sateh M. JalaleddineSuharli Tedja
    • H03F3/50H03K3/00H03K5/02H03K5/153H03K5/24
    • H03F3/505H03F2203/5031H03K5/023H03K5/2481
    • A folded cascode device senses the drain current of a source follower, and a current mirror device multiplies the sensed drain current for application to an output load. The source follower and the current mirror device are preferably of the same type (e.g., both NMOS). The resulting composite source follower provides relatively wide bandwidth at relatively low power. The folded cascode allows (NMOS) source and sink control. Using current mirror feedback reduces the stability problems associated with other solutions that rely on a voltage feedback stage. Composite source followers of the present invention can be used in any traditional buffer applications, such as in operational amplifiers, regulators, or high-speed signal paths.
    • 折叠共源共栅器件感测源极跟随器的漏极电流,并且电流镜装置将感测到的漏极电流乘以输出负载。 源极跟随器和电流镜装置优选地具有相同类型(例如,两个NMOS)。 所得到的复合源跟随器在相对低的功率下提供相对宽的带宽。 折叠的共源共栅允许(NMOS)源极和漏极控制。 使用电流镜反馈减少了与依赖于电压反馈级的其他解决方案相关的稳定性问题。 本发明的复合源跟随器可以用于任何传统的缓冲器应用中,例如在运算放大器,调节器或高速信号路径中。
    • 10. 发明授权
    • Adaptive resistor trimming circuit
    • 自适应电阻微调电路
    • US06275090B1
    • 2001-08-14
    • US09176279
    • 1997-04-09
    • Harley Franklin Burger, Jr.Jeffrey Lee SonntagSuharli Tedja
    • Harley Franklin Burger, Jr.Jeffrey Lee SonntagSuharli Tedja
    • G06F500
    • H01L27/0802
    • An integrated circuit includes a self-calibrating resistor circuit comprising a resistor string, a comparator, a state machine, a reference voltage source, and a reference current source. The current source typically comprises a voltage reference, typically a bandgap reference, and a temperature-independent resistor having a value REXT. In operation, a reference current IREF flows through the resistor string. During a calibration period, the voltage across the string is compared to the bandgap reference voltage, VBG, by the comparator, which controls the state of the state machine. The outputs of the state machine turn on or off the resistors in the string until the voltage across the string, VR, is approximately equal to the reference voltage. The resistance of the resistor string is then equal to RBG=VBG/IREF, which is proportional to REXT, and thus is typically independent of process and temperature. The final state of the state machine that produces RBG may be used to control any resistor strings on the integrated circuit that need to be temperature and process independent. The calibration period may be repeated from time to time to track temperature variations.
    • 集成电路包括自校准电阻器电路,其包括电阻串,比较器,状态机,参考电压源和参考电流源。 电流源通常包括电压参考,通常为带隙基准,以及具有值REXT的温度独立电阻。 在操作中,参考电流IREF流经电阻串。 在校准周期期间,通过控制状态机的状态的比较器将串上的电压与带隙参考电压VBG进行比较。 状态机的输出打开或关闭串中的电阻,直到串上的电压VR近似等于参考电压。 电阻串的电阻等于RBG = VBG / IREF,其与REXT成比例,因此通常与工艺和温度无关。 产生RBG的状态机的最终状态可以用于控制集成电路中需要温度和处理独立性的任何电阻串。 不时地重复校准周期以跟踪温度变化。